Works matching DE "LOGIC circuits testing"
1
- Information Sciences & Technologies: Bulletin of the ACM Slovakia, 2012, v. 4, n. 3, p. 54
- Article
2
- Journal of Electronic Testing, 2017, v. 33, n. 1, p. 107, doi. 10.1007/s10836-016-5632-y
- Hoque, Tamzidul;
- Narasimhan, Seetharam;
- Wang, Xinmu;
- Mal-Sarkar, Sanchita;
- Bhunia, Swarup
- Article
3
- Journal of Electronic Testing, 2013, v. 29, n. 6, p. 763, doi. 10.1007/s10836-013-5399-3
- Nayeem, N. M.;
- Rice, J. E.
- Article
5
- Systems, 2017, v. 5, n. 1, p. 7, doi. 10.3390/systems5010007
- Zeigler, Bernard P.;
- Muzy, Alexandre
- Article