Found: 14
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Efficient Worst-Case Temperature Evaluation for Thermal-Aware Assignment of Real-Time Applications on MPSoCs.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 4, p. 521, doi. 10.1007/s10836-013-5397-5
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- Publication type:
- Article
Neural Network Guided Spatial Fault Resilience in Array Processors.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 4, p. 473, doi. 10.1007/s10836-013-5394-8
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- Publication type:
- Article
A Cost-efficient Input Vector Monitoring Concurrent On-line BIST Scheme Based on Multilevel Decoding Logic.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 4, p. 585, doi. 10.1007/s10836-013-5380-1
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- Publication type:
- Article
Timing-Error-Detecting Dual-Edge-Triggered Flip-Flop.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 4, p. 545, doi. 10.1007/s10836-013-5392-x
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- Publication type:
- Article
Test Technology Newsletter.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 4, p. 455, doi. 10.1007/s10836-013-5395-7
- Publication type:
- Article
Correlation of Heavy-Ion and Laser Testing on a DC/DC PWM Controller.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 4, p. 609, doi. 10.1007/s10836-013-5379-7
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- Publication type:
- Article
A Fault Tolerant Hierarchical Network on Chip Router Architecture.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 4, p. 485, doi. 10.1007/s10836-013-5398-4
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- Publication type:
- Article
An Approximate Calculation of Ratio of Normal Variables and Its Application in Analog Circuit Fault Diagnosis.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 4, p. 555, doi. 10.1007/s10836-013-5382-z
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- Publication type:
- Article
Process-Variation and Temperature Aware SoC Test Scheduling Technique.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 4, p. 499, doi. 10.1007/s10836-013-5374-z
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- Publication type:
- Article
High Efficiency Time Redundant Hardened Latch for Reliable Circuit Design.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 4, p. 537, doi. 10.1007/s10836-013-5384-x
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- Publication type:
- Article
Editorial.
- Published in:
- 2013
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- Publication type:
- Editorial
A Library-Based Early Soft Error Sensitivity Analysis Technique for SRAM-Based FPGA Design.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 4, p. 457, doi. 10.1007/s10836-013-5393-9
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- Publication type:
- Article
Memory Reliability Improvement Based on Maximized Error-Correcting Codes.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 4, p. 601, doi. 10.1007/s10836-013-5396-6
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- Publication type:
- Article
Prognostics of Analog Filters Based on Particle Filters Using Frequency Features.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 4, p. 567, doi. 10.1007/s10836-013-5383-y
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- Publication type:
- Article