Works matching IS 09238174 AND DT 2011 AND VI 27 AND IP 2

Results: 11

Construction and Analysis of Augmented Time Compactors.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 2, p. 109, doi. 10.1007/s10836-011-5211-1

By:

Gizdarski, Emil

Publication type:

Article

Efficient Generation of Stimuli for Functional Verification by Backjumping Across Extended FSMs.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 2, p. 137, doi. 10.1007/s10836-011-5209-8

By:

Guglielmo, Giuseppe;
Guglielmo, Luigi;
Fummi, Franco;
Pravadelli, Graziano

Publication type:

Article

Balanced Secure Scan: Partial Scan Approach for Secret Information Protection.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 2, p. 99, doi. 10.1007/s10836-011-5204-0

By:

Inoue, Michiko;
Yoneda, Tomokazu;
Hasegawa, Muneo;
Fujiwara, Hideo

Publication type:

Article

Analysis of Resistive Open Defects in Drowsy SRAM Cells.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 2, p. 203, doi. 10.1007/s10836-011-5206-y

By:

Nourivand, Afshin;
Al-Khalili, Asim;
Savaria, Yvon

Publication type:

Article

Test Vector Generation for Post-Silicon Delay Testing Using SAT-Based Decision Problems.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 2, p. 123, doi. 10.1007/s10836-011-5205-z

By:

Tadesse, Desta;
Bahar, R.;
Grodstein, Joel

Publication type:

Article

Application of the Kalman Filter in Linearity Testing of Analog-to-Digital Converters.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 2, p. 163, doi. 10.1007/s10836-011-5196-9

By:

Jin, Le

Publication type:

Article

An Asynchronous Design for Testability and Implementation in Thin-film Transistor Technology.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 2, p. 193, doi. 10.1007/s10836-011-5195-x

By:

Cheng, Chi-Hsuan;
Li, James

Publication type:

Article

Fault Tolerant Single Error Correction Encoders.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 2, p. 215, doi. 10.1007/s10836-011-5208-9

By:

Maestro, Juan;
Reviriego, Pedro;
Argyrides, Costas;
Pradhan, Dhiraj

Publication type:

Article

Structural Test Approach for Embedded Analog Circuits Based on a Built-in Current Sensor.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 2, p. 177, doi. 10.1007/s10836-011-5214-y

By:

Mozuelos, Román;
Lechuga, Yolanda;
Martínez, Mar;
Bracho, Salvador

Publication type:

Article

Test Technology Newsletter.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 2, p. 97, doi. 10.1007/s10836-011-5223-x

By:

Pande, Partha

Publication type:

Article

Editorial.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 2, p. 95, doi. 10.1007/s10836-011-5224-9

By:

Agrawal, Vishwani

Publication type:

Article