Found: 11
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Application of the Kalman Filter in Linearity Testing of Analog-to-Digital Converters.
- Published in:
- Journal of Electronic Testing, 2011, v. 27, n. 2, p. 163, doi. 10.1007/s10836-011-5196-9
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- Article
An Asynchronous Design for Testability and Implementation in Thin-film Transistor Technology.
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- Journal of Electronic Testing, 2011, v. 27, n. 2, p. 193, doi. 10.1007/s10836-011-5195-x
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- Article
Balanced Secure Scan: Partial Scan Approach for Secret Information Protection.
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- Journal of Electronic Testing, 2011, v. 27, n. 2, p. 99, doi. 10.1007/s10836-011-5204-0
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- Article
Analysis of Resistive Open Defects in Drowsy SRAM Cells.
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- Journal of Electronic Testing, 2011, v. 27, n. 2, p. 203, doi. 10.1007/s10836-011-5206-y
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- Article
Test Vector Generation for Post-Silicon Delay Testing Using SAT-Based Decision Problems.
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- Journal of Electronic Testing, 2011, v. 27, n. 2, p. 123, doi. 10.1007/s10836-011-5205-z
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- Article
Construction and Analysis of Augmented Time Compactors.
- Published in:
- Journal of Electronic Testing, 2011, v. 27, n. 2, p. 109, doi. 10.1007/s10836-011-5211-1
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- Article
Efficient Generation of Stimuli for Functional Verification by Backjumping Across Extended FSMs.
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- Journal of Electronic Testing, 2011, v. 27, n. 2, p. 137, doi. 10.1007/s10836-011-5209-8
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- Article
Fault Tolerant Single Error Correction Encoders.
- Published in:
- Journal of Electronic Testing, 2011, v. 27, n. 2, p. 215, doi. 10.1007/s10836-011-5208-9
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- Article
Structural Test Approach for Embedded Analog Circuits Based on a Built-in Current Sensor.
- Published in:
- Journal of Electronic Testing, 2011, v. 27, n. 2, p. 177, doi. 10.1007/s10836-011-5214-y
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- Article
Test Technology Newsletter.
- Published in:
- Journal of Electronic Testing, 2011, v. 27, n. 2, p. 97, doi. 10.1007/s10836-011-5223-x
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- Article
Editorial.
- Published in:
- Journal of Electronic Testing, 2011, v. 27, n. 2, p. 95, doi. 10.1007/s10836-011-5224-9
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- Article