Chiba Scan Delay Fault Testing with Short Test Application Time.
- Published in:
- Journal of Electronic Testing, 2010, v. 26, n. 6, p. 667, doi. 10.1007/s10836-010-5177-4
- By:
- Publication type:
- Article
Works matching IS 09238174 AND DT 2010 AND VI 26 AND IP 6
Results: 9
1
2
Modified Selective Huffman Coding for Optimization of Test Data Compression, Test Application Time and Area Overhead.
- Published in:
- Journal of Electronic Testing, 2010, v. 26, n. 6, p. 679, doi. 10.1007/s10836-010-5183-6
- By:
- Publication type:
- Article
3
Study of Read Recovery Dynamic Faults in 6T SRAMS and Method to Improve Test Time.
- Published in:
- Journal of Electronic Testing, 2010, v. 26, n. 6, p. 659, doi. 10.1007/s10836-010-5176-5
- By:
- Publication type:
- Article
4
Test Technology Newsletter.
- Published in:
- Journal of Electronic Testing, 2010, v. 26, n. 6, p. 597, doi. 10.1007/s10836-010-5182-7
- Publication type:
- Article
5
An Effective and Accurate Methodology for the Cell Internal Defect Diagnosis.
- Published in:
- Journal of Electronic Testing, 2010, v. 26, n. 6, p. 621, doi. 10.1007/s10836-010-5181-8
- By:
- Publication type:
- Article
6
A Framework for Automated Detection of Power-related Software Errors in Industrial Verification Processes.
- Published in:
- Journal of Electronic Testing, 2010, v. 26, n. 6, p. 689, doi. 10.1007/s10836-010-5184-5
- By:
- Publication type:
- Article
7
Editorial.
- Published in:
- 2010
- By:
- Publication type:
- Editorial
8
Enabling Remote Testing: Embedded Test Controller and Mixed-signal Test Architecture.
- Published in:
- Journal of Electronic Testing, 2010, v. 26, n. 6, p. 641, doi. 10.1007/s10836-010-5175-6
- By:
- Publication type:
- Article
9
On-Chip Delay Measurement Based Response Analysis for Timing Characterization.
- Published in:
- Journal of Electronic Testing, 2010, v. 26, n. 6, p. 599, doi. 10.1007/s10836-010-5188-1
- By:
- Publication type:
- Article