Classification of Activated Faults in the FlexRay-Based Networks.
- Published in:
- Journal of Electronic Testing, 2010, v. 26, n. 5, p. 535, doi. 10.1007/s10836-010-5164-9
- By:
- Publication type:
- Article
Works matching IS 09238174 AND DT 2010 AND VI 26 AND IP 5
Results: 9
1
2
Design of Memories with Concurrent Error Detection and Correction by Nonlinear SEC-DED Codes.
- Published in:
- Journal of Electronic Testing, 2010, v. 26, n. 5, p. 559, doi. 10.1007/s10836-010-5168-5
- By:
- Publication type:
- Article
3
Efficient Concurrent Self-Test with Partially Specified Patterns.
- Published in:
- Journal of Electronic Testing, 2010, v. 26, n. 5, p. 581, doi. 10.1007/s10836-010-5167-6
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- Publication type:
- Article
4
JTAG Security System Based on Credentials.
- Published in:
- Journal of Electronic Testing, 2010, v. 26, n. 5, p. 549, doi. 10.1007/s10836-010-5170-y
- By:
- Publication type:
- Article
5
A Novel Test Point Selection Method for Analog Fault Dictionary Techniques.
- Published in:
- Journal of Electronic Testing, 2010, v. 26, n. 5, p. 523, doi. 10.1007/s10836-010-5169-4
- By:
- Publication type:
- Article
6
Test Technology Newsletter[InlineMediaObject not available: see fulltext.].
- Published in:
- Journal of Electronic Testing, 2010, v. 26, n. 5, p. 497, doi. 10.1007/s10836-010-5173-8
- Publication type:
- Article
7
Test Set Compression Through Alternation Between Deterministic and Pseudorandom Test Patterns.
- Published in:
- Journal of Electronic Testing, 2010, v. 26, n. 5, p. 513, doi. 10.1007/s10836-010-5172-9
- By:
- Publication type:
- Article
8
Editorial.
- Published in:
- 2010
- By:
- Publication type:
- Editorial
9
Fault Models for Quantum Mechanical Switching Networks.
- Published in:
- Journal of Electronic Testing, 2010, v. 26, n. 5, p. 499, doi. 10.1007/s10836-010-5171-x
- By:
- Publication type:
- Article