Works matching IS 09238174 AND DT 2010 AND VI 26 AND IP 2
1
- Journal of Electronic Testing, 2010, v. 26, n. 2, p. 261, doi. 10.1007/s10836-010-5144-0
- Cabodi, Gianpiero;
- Dipietro, Leandro;
- Murciano, Marco;
- Nocco, Sergio
- Article
2
- Journal of Electronic Testing, 2010, v. 26, n. 2, p. 151, doi. 10.1007/s10836-009-5135-1
- Hongxia Fang;
- Chakrabarty, Krishnendu;
- Fujiwara, Hideo
- Article
3
- Journal of Electronic Testing, 2010, v. 26, n. 2, p. 177, doi. 10.1007/s10836-009-5131-5
- Fan, Yongquan;
- Zilic, Zeljko
- Article
4
- Journal of Electronic Testing, 2010, v. 26, n. 2, p. 165, doi. 10.1007/s10836-010-5142-2
- Chandrasekar, Maheshwar;
- Rahagude, Nikhil P.;
- Hsiao, Michael S.
- Article
5
- Journal of Electronic Testing, 2010, v. 26, n. 2, p. 147, doi. 10.1007/s10836-010-5151-1
- Article
7
- Journal of Electronic Testing, 2010, v. 26, n. 2, p. 243, doi. 10.1007/s10836-010-5143-1
- Article
8
- Journal of Electronic Testing, 2010, v. 26, n. 2, p. 211, doi. 10.1007/s10836-010-5148-9
- Tong, Jason G.;
- Boulé, Marc;
- Zilic, Zeljko
- Article
9
- Journal of Electronic Testing, 2010, v. 26, n. 2, p. 149, doi. 10.1007/s10836-010-5149-8
- Article
10
- Journal of Electronic Testing, 2010, v. 26, n. 2, p. 279, doi. 10.1007/s10836-009-5140-4
- Verdoolaege, Sven;
- Palkovič, Martin;
- Bruynooghe, Maurice;
- Janssens, Gerda;
- Catthoor, Francky
- Article
11
- Journal of Electronic Testing, 2010, v. 26, n. 2, p. 195, doi. 10.1007/s10836-010-5147-x
- Gulati, Kanupriya;
- Khatri, Sunil P.
- Article
12
- Journal of Electronic Testing, 2010, v. 26, n. 2, p. 227, doi. 10.1007/s10836-010-5145-z
- Xue, Bin;
- Shukla, Sandeep K.
- Article