ADC Non-Linearity Low-Cost Test Through a Simplified Double-Histogram Method.
- Published in:
- Journal of Electronic Testing, 2010, v. 26, n. 1, p. 47, doi. 10.1007/s10836-009-5130-6
- By:
- Publication type:
- Article
Works matching IS 09238174 AND DT 2010 AND VI 26 AND IP 1
Results: 14
1
2
Fault Coverage Analysis of Peak-Detector Based BIST for RF LNAs.
- Published in:
- Journal of Electronic Testing, 2010, v. 26, n. 1, p. 37, doi. 10.1007/s10836-009-5129-z
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- Publication type:
- Article
3
Low-Cost 20 Gbps Digital Test Signal Synthesis Using SiGe and InP Logic.
- Published in:
- Journal of Electronic Testing, 2010, v. 26, n. 1, p. 87, doi. 10.1007/s10836-009-5124-4
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- Publication type:
- Article
4
Estimation of RF PA Nonlinearities after Cross-correlating Current and Output Voltage.
- Published in:
- Journal of Electronic Testing, 2010, v. 26, n. 1, p. 25, doi. 10.1007/s10836-009-5128-0
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- Publication type:
- Article
5
Testing Multilayer Flexible Wireless Multisensor Platforms.
- Published in:
- Journal of Electronic Testing, 2010, v. 26, n. 1, p. 127, doi. 10.1007/s10836-009-5127-1
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- Publication type:
- Article
6
Calibration and Test Time Reduction Techniques for Digitally-Calibrated Designs: an ADC Case Study.
- Published in:
- Journal of Electronic Testing, 2010, v. 26, n. 1, p. 59, doi. 10.1007/s10836-009-5123-5
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- Publication type:
- Article
7
Editorial.
- Published in:
- Journal of Electronic Testing, 2010, v. 26, n. 1, p. 1, doi. 10.1007/s10836-009-5132-4
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- Publication type:
- Article
8
Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits.
- Published in:
- Journal of Electronic Testing, 2010, v. 26, n. 1, p. 73, doi. 10.1007/s10836-009-5136-0
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- Publication type:
- Article
9
Study of an Electrical Setup for Capacitive MEMS Accelerometers Test and Calibration.
- Published in:
- Journal of Electronic Testing, 2010, v. 26, n. 1, p. 111, doi. 10.1007/s10836-009-5122-6
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- Publication type:
- Article
10
Using Stochastic Differential Equation for Verification of Noise in Analog/RF Circuits.
- Published in:
- Journal of Electronic Testing, 2010, v. 26, n. 1, p. 97, doi. 10.1007/s10836-009-5137-z
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- Publication type:
- Article
11
General Design for Test Guidelines for RF IC.
- Published in:
- Journal of Electronic Testing, 2010, v. 26, n. 1, p. 7, doi. 10.1007/s10836-009-5121-7
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- Publication type:
- Article
12
Applications for Low Frequency Impedance Analysis Systems.
- Published in:
- Journal of Electronic Testing, 2010, v. 26, n. 1, p. 139, doi. 10.1007/s10836-009-5125-3
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- Publication type:
- Article
13
Guest Editorial.
- Published in:
- Journal of Electronic Testing, 2010, v. 26, n. 1, p. 5, doi. 10.1007/s10836-009-5133-3
- By:
- Publication type:
- Article
14
Low-Cost Specification Based Testing of RF Amplifier Circuits using Oscillation Principles.
- Published in:
- Journal of Electronic Testing, 2010, v. 26, n. 1, p. 13, doi. 10.1007/s10836-009-5126-2
- By:
- Publication type:
- Article