Works matching IS 09238174 AND DT 2009 AND VI 25 AND IP 1

Results: 14

Healing DNA Self-Assemblies Using Punctures.

Published in:

Journal of Electronic Testing, 2009, v. 25, n. 1, p. 25, doi. 10.1007/s10836-008-5082-2

By:

Masoud Hashempour;
Zahra Mashreghian Arani;
Fabrizio Lombardi

Publication type:

Article

A Layout Sensitivity Model for Estimating Electromigration-vulnerable Narrow Interconnects.

Published in:

Journal of Electronic Testing, 2009, v. 25, n. 1, p. 67, doi. 10.1007/s10836-008-5079-x

By:

Rani Ghaida;
Payman Zarkesh-Ha

Publication type:

Article

Guest Editorial.

Published in:

Journal of Electronic Testing, 2009, v. 25, n. 1, p. 9, doi. 10.1007/s10836-009-5098-2

By:

Cristiana Bolchini;
Yong-Bin Kim

Publication type:

Article

New Editors.

Published in:: Journal of Electronic Testing, 2009, v. 25, n. 1, p. 3, doi. 10.1007/s10836-009-5101-y
Publication type:: Article

2008 List of Referees.

Published in:: Journal of Electronic Testing, 2009, v. 25, n. 1, p. 5, doi. 10.1007/s10836-009-5099-1
Publication type:: Article

SET Emulation Under a Quantized Delay Model.

Published in:

Journal of Electronic Testing, 2009, v. 25, n. 1, p. 107

By:

Mario García Valderas;
Luis Entrena;
Raúl Fernández Cardenal;
Celia López Ongil;
Marta Portela García

Publication type:

Article

How Many Test Vectors We Need to Detect a Bridging Fault?

Published in:

Journal of Electronic Testing, 2009, v. 25, n. 1, p. 79, doi. 10.1007/s10836-008-5084-0

By:

Michele Favalli;
Marcello Dalpasso

Publication type:

Article

Detecting Multiple Faults in One-Dimensional Arrays of Reversible QCA Gates.

Published in:

Journal of Electronic Testing, 2009, v. 25, n. 1, p. 39, doi. 10.1007/s10836-008-5078-y

By:

Xiaojun Ma;
Jing Huang;
Cecilia Metra;
Fabrizio Lombardi

Publication type:

Article

Design for Test of Asynchronous NULL Convention Logic (NCL) Circuits.

Published in:

Journal of Electronic Testing, 2009, v. 25, n. 1, p. 117, doi. 10.1007/s10836-008-5083-1

By:

Waleed Al-Assadi;
Sindhu Kakarla

Publication type:

Article

An Efficient Framework for Scalable Defect Isolation in Large Scale Networks of DNA Self-Assembly.

Published in:

Journal of Electronic Testing, 2009, v. 25, n. 1, p. 11, doi. 10.1007/s10836-008-5086-y

By:

Masaru Fukushi;
Susumu Horiguchi;
Luke Demoracski;
Fabrizio Lombardi

Publication type:

Article

Test Compression for IP Core Testing with Reconfigurable Network and Fixing-Flipping Coding.

Published in:

Journal of Electronic Testing, 2009, v. 25, n. 1, p. 97, doi. 10.1007/s10836-008-5080-4

By:

Kazuteru Namba;
Yoshikazu Matsui;
Hideo Ito

Publication type:

Article

Modeling and Evaluating Errors Due to Random Clock Shifts in Quantum-Dot Cellular Automata Circuits.

Published in:

Journal of Electronic Testing, 2009, v. 25, n. 1, p. 55, doi. 10.1007/s10836-008-5088-9

By:

Faizal Karim;
Marco Ottavi;
Hamidreza Hashempour;
Vamsi Vankamamidi;
Konrad Walus;
André Ivanov;
Fabrizio Lombardi

Publication type:

Article

Test Technology Newsletter.

Published in:: Journal of Electronic Testing, 2009, v. 25, n. 1, p. 7, doi. 10.1007/s10836-009-5100-z
Publication type:: Article

Editorial.

Published in:

Journal of Electronic Testing, 2009, v. 25, n. 1, p. 1, doi. 10.1007/s10836-009-5102-x

By:

Vishwani Agrawal

Publication type:

Article