Test Technology Newsletter - December 2007.
- Published in:
- Journal of Electronic Testing, 2007, v. 23, n. 6, p. 467, doi. 10.1007/s10836-007-5058-7
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- Publication type:
- Article
Works matching IS 09238174 AND DT 2007 AND VI 23 AND IP 6
Results: 13
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2
Guest Editorial.
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- Journal of Electronic Testing, 2007, v. 23, n. 6, p. 469, doi. 10.1007/s10836-007-5057-8
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- Article
3
Fast PWM-Based Test for High Resolution ΣΠADCs.
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- Journal of Electronic Testing, 2007, v. 23, n. 6, p. 539, doi. 10.1007/s10836-007-5047-x
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- Article
4
Estimation of Test Metrics for the Optimisation of Analogue Circuit Testing.
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- Journal of Electronic Testing, 2007, v. 23, n. 6, p. 471, doi. 10.1007/s10836-007-5006-6
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- Publication type:
- Article
5
Hard-Fault Detection and Diagnosis During the Application of Model-Based Data Converter Testing.
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- Journal of Electronic Testing, 2007, v. 23, n. 6, p. 513, doi. 10.1007/s10836-007-5050-2
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- Article
6
Component Value Calculations and Characterizations for Measurements in the IEEE 1149.4 Environment.
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- Journal of Electronic Testing, 2007, v. 23, n. 6, p. 569, doi. 10.1007/s10836-007-5008-4
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- Publication type:
- Article
7
A Robust 130Â nm-CMOS Built-In Current Sensor Dedicated to RF Applications.
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- Journal of Electronic Testing, 2007, v. 23, n. 6, p. 593, doi. 10.1007/s10836-007-5025-3
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- Publication type:
- Article
8
A Case Study on Phase-Locked Loop Automatic Layout Generation and Transient Fault Injection Analysis.
- Published in:
- Journal of Electronic Testing, 2007, v. 23, n. 6, p. 625, doi. 10.1007/s10836-007-5055-x
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- Publication type:
- Article
9
A Fully-Settled Linear Behavior Plus Noise Model for Evaluating the Digital Stimuli of the Design-for-Digital-Testability Σ-ΠModulators.
- Published in:
- Journal of Electronic Testing, 2007, v. 23, n. 6, p. 527, doi. 10.1007/s10836-007-5005-7
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- Publication type:
- Article
10
A Module for BiST of CMOS RF Receivers.
- Published in:
- Journal of Electronic Testing, 2007, v. 23, n. 6, p. 605, doi. 10.1007/s10836-007-5051-1
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- Article
11
Oscillation Test Scheme of SC Biquad Filters Based on Internal Reconfiguration.
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- Journal of Electronic Testing, 2007, v. 23, n. 6, p. 485
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- Publication type:
- Article
12
Built-In Self-Test of Field Programmable Analog Arrays based on Transient Response Analysis.
- Published in:
- Journal of Electronic Testing, 2007, v. 23, n. 6, p. 497, doi. 10.1007/s10836-007-5004-8
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- Publication type:
- Article
13
Methods of Testing Discrete Semiconductors in the 1149.4 Environment.
- Published in:
- Journal of Electronic Testing, 2007, v. 23, n. 6, p. 581, doi. 10.1007/s10836-007-5007-5
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- Publication type:
- Article