Test Technology Newsletter - October 2007.
- Published in:
- Journal of Electronic Testing, 2007, v. 23, n. 5, p. 371, doi. 10.1007/s10836-007-5046-y
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- Article
Works matching IS 09238174 AND DT 2007 AND VI 23 AND IP 5
Results: 8
1
2
Editorial.
- Published in:
- Journal of Electronic Testing, 2007, v. 23, n. 5, p. 369, doi. 10.1007/s10836-007-5045-z
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- Article
3
Too Few or Too Many Properties? Measure it by ATPG!
- Published in:
- Journal of Electronic Testing, 2007, v. 23, n. 5, p. 373, doi. 10.1007/s10836-007-5015-5
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- Article
4
A System-layer Infrastructure for SoC Diagnosis.
- Published in:
- Journal of Electronic Testing, 2007, v. 23, n. 5, p. 389, doi. 10.1007/s10836-007-5014-6
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- Article
5
Dynamic Fault Diagnosis of Combinational and Sequential Circuits on Reconfigurable Hardware.
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- Journal of Electronic Testing, 2007, v. 23, n. 5, p. 405, doi. 10.1007/s10836-007-5009-3
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- Article
6
Securing Scan Control in Crypto Chips.
- Published in:
- Journal of Electronic Testing, 2007, v. 23, n. 5, p. 457
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- Publication type:
- Article
7
Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits.
- Published in:
- Journal of Electronic Testing, 2007, v. 23, n. 5, p. 435, doi. 10.1007/s10836-007-5003-9
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- Publication type:
- Article
8
Functional Constraints vs. Test Compression in Scan-Based Delay Testing.
- Published in:
- Journal of Electronic Testing, 2007, v. 23, n. 5, p. 445, doi. 10.1007/s10836-007-5013-7
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- Publication type:
- Article