Ensembles of Neural Networks for Fault Diagnosis in Analog Circuits.
- Published in:
- Journal of Electronic Testing, 2007, v. 23, n. 4, p. 323, doi. 10.1007/s10836-006-0710-1
- By:
- Publication type:
- Article
Works matching IS 09238174 AND DT 2007 AND VI 23 AND IP 4
Results: 8
1
2
Functionally Fault-tolerant DSP Microprocessor using Sigma–delta Modulated Signals.
- Published in:
- Journal of Electronic Testing, 2007, v. 23, n. 4, p. 275, doi. 10.1007/s10836-007-0760-z
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- Publication type:
- Article
3
Techniques for Disturb Fault Collapsing.
- Published in:
- Journal of Electronic Testing, 2007, v. 23, n. 4, p. 363, doi. 10.1007/s10836-006-0629-6
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- Publication type:
- Article
4
IEEE Standard 1500 Compatible Oscillation Ring Test Methodology for Interconnect Delay and Crosstalk Detection.
- Published in:
- Journal of Electronic Testing, 2007, v. 23, n. 4, p. 341, doi. 10.1007/s10836-007-0759-5
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- Publication type:
- Article
5
The Effectiveness of Test in Controlling Quality Costs: A Conformability Analysis Based Approach.
- Published in:
- Journal of Electronic Testing, 2007, v. 23, n. 4, p. 293, doi. 10.1007/s10836-006-0711-0
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- Publication type:
- Article
6
Test Technology Newsletter.
- Published in:
- Journal of Electronic Testing, 2007, v. 23, n. 4, p. 273, doi. 10.1007/s10836-007-0778-2
- Publication type:
- Article
7
A Formal Analysis of Fault Diagnosis with D -matrices.
- Published in:
- Journal of Electronic Testing, 2007, v. 23, n. 4, p. 309, doi. 10.1007/s10836-006-0628-7
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- Publication type:
- Article
8
Editorial.
- Published in:
- Journal of Electronic Testing, 2007, v. 23, n. 4, p. 271, doi. 10.1007/s10836-007-0777-3
- Publication type:
- Article