Works matching DE "ELECTRIC contactors"
1
- Government Technology, 2011, v. 24, n. 7, p. 46
- Article
2
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 4, p. 3860, doi. 10.1007/s10854-019-00669-7
- Shi, Jianjun;
- Xia, Xiaochuan;
- Liang, Hongwei;
- Abbas, Qasim;
- Liu, Jun;
- Zhang, Heqiu;
- Liu, Yang
- Article
3
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 8/9, p. 855, doi. 10.1007/s10854-007-9520-1
- Liday, J.;
- Hotový, I.;
- Sitter, H.;
- Vogrinčič, P.;
- Vincze, A.;
- Vávra, I.;
- Šatka, A.;
- Ecke, G.;
- Bonanni, A.;
- Breza, J.;
- Simbrunner, C.;
- Plochberger, B.
- Article
4
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 8, p. 805, doi. 10.1007/s10854-007-9210-z
- Article
5
- Biotechnology Letters, 2000, v. 22, n. 22, p. 1789, doi. 10.1023/A:1005606421379
- Teixeira, P.;
- Oliveira, R.
- Article
6
- Journal of Solid State Electrochemistry, 2009, v. 13, n. 8, p. 1259, doi. 10.1007/s10008-008-0660-x
- R. Singh;
- A. Singh;
- Anindita
- Article
7
- Journal of Solid State Electrochemistry, 2009, v. 13, n. 5, p. 733, doi. 10.1007/s10008-008-0603-6
- Article
8
- Journal of Solid State Electrochemistry, 2009, v. 13, n. 1, p. 123, doi. 10.1007/s10008-008-0579-2
- Chun-Ze Lai;
- Marti Joyer;
- Melissa Fierke;
- Nicholas Petkovich;
- Andreas Stein;
- Philippe Bühlmann
- Article
9
- Prace Instytutu Elektrotechniki, 2017, v. 64, n. 276, p. 7, doi. 10.5604/01.3001.0010.0034
- KRASUSKI, Krzysztof;
- BŁAŻEJCZYK, Tomasz;
- SIBILSKI, Henryk;
- KOZAK, Sławomir
- Article
10
- Cogent Engineering, 2018, v. 5, n. 1, p. 1, doi. 10.1080/23311916.2018.1470889
- Wong, Chin jie;
- Nirmal, Umar;
- Murugan, Sharmeeni
- Article
11
- EE: Evaluation Engineering, 2011, v. 50, n. 12, p. 14
- Article
12
- Australian Journal of Pharmacy, 2011, v. 92, n. 1089, p. 40
- Article
13
- Steel Research International, 2017, v. 88, n. 9, p. n/a, doi. 10.1002/srin.201600484
- Article
14
- Transactions of FAMENA, 2016, v. 40, n. 3, p. 57, doi. 10.21278/TOF.40305
- Article
15
- Journal of Thermal Spray Technology, 2012, v. 21, n. 5, p. 758, doi. 10.1007/s11666-012-9756-z
- Rolland, G.;
- Sallamand, P.;
- Guipont, V.;
- Jeandin, M.;
- Boller, E.;
- Bourda, C.
- Article
16
- Radiophysics & Quantum Electronics, 2004, v. 47, n. 5/6, p. 396, doi. 10.1023/B:RAQE.0000046313.84364.3c
- Zapevalov, V. E.;
- Bogdashov, A. A.;
- Denisov, G. G.;
- Kuftin, A. N.;
- Lygin, V. K.;
- Moiseev, M. A.;
- Chirkov, A. V.
- Article
17
- Journal of Electronic Testing, 2015, v. 31, n. 4, p. 339, doi. 10.1007/s10836-015-5535-3
- Renbi, Abdelghani;
- Delsing, Jerker
- Article
18
- Electrica, 2022, v. 22, n. 2, p. 278, doi. 10.54614/electrica.2022.210123
- Article
19
- Instruments & Experimental Techniques, 2005, v. 48, n. 2, p. 219, doi. 10.1007/s10786-005-0037-7
- Emel’yanov, A.;
- Emel’yanova, E.;
- Kubyshkina, M.
- Article
20
- Canadian Journal of Chemical Engineering, 2011, v. 89, n. 6, p. 1464, doi. 10.1002/cjce.20472
- Molavi, Hoda;
- Hosseinpour, Sima;
- Bahmanyar, Hossein;
- Shariaty-Niasar, Mojtaba
- Article
21
- Canadian Journal of Chemical Engineering, 2011, v. 89, n. 6, p. 1536, doi. 10.1002/cjce.20469
- Kubsad, Vijay;
- Gupta, Sudhir Kumar;
- Chaudhari, Sanjeev
- Article
22
- Canadian Journal of Chemical Engineering, 2011, v. 89, n. 5, p. 1236, doi. 10.1002/cjce.20488
- Molavi, Hoda;
- Hosseinpour, Sima;
- Bahmanyar, Hossein;
- Niasar, Mojtaba Shariaty
- Article
23
- Applied Physics A: Materials Science & Processing, 2005, v. 81, n. 3, p. 561, doi. 10.1007/s00339-004-2673-3
- Reddy, V. R.;
- Kim, S.-H.;
- Seong, T.-Y.
- Article
24
- International Journal of Electrical Engineering Education, 2014, v. 51, n. 4, p. 306, doi. 10.7227/IJEEE.0003
- Daszczyński, T.;
- Chmielak, W.;
- Pochanke, Z.
- Article
26
- Semiconductors, 2018, v. 52, n. 1, p. 131, doi. 10.1134/S1063782618010190
- Sachenko, A.;
- Belyaev, A.;
- Konakova, R.
- Article
27
- Semiconductors, 2017, v. 51, n. 4, p. 438, doi. 10.1134/S1063782617040194
- Slapovskiy, D.;
- Pavlov, A.;
- Pavlov, V.;
- Klekovkin, A.
- Article
28
- Semiconductors, 2015, v. 49, n. 4, p. 461, doi. 10.1134/S1063782615040193
- Sachenko, A.;
- Belyaev, A.;
- Boltovets, N.;
- Brunkov, P.;
- Jmerik, V.;
- Ivanov, S.;
- Kapitanchuk, L.;
- Konakova, R.;
- Klad'ko, V.;
- Romanets, P.;
- Saja, P.;
- Safryuk, N.;
- Sheremet, V.
- Article
29
- Semiconductors, 2012, v. 46, n. 3, p. 330, doi. 10.1134/S1063782612030074
- Belyaev, A.;
- Boltovets, N.;
- Konakova, R.;
- Kudryk, Ya.;
- Sachenko, A.;
- Sheremet, V.;
- Vinogradov, A.
- Article
30
- Semiconductors, 2008, v. 42, n. 11, p. 1286, doi. 10.1134/S1063782608110079
- Parfenyuk, O. A.;
- Ilashchuk, M. I.;
- Ulyanitsky, K. S.
- Article
31
- Semiconductors, 2008, v. 42, n. 11, p. 1315, doi. 10.1134/S1063782608110134
- Bessolov, V. N.;
- Blank, T. V.;
- Goldberg, Yu. A.;
- Konstantinov, O. V.;
- Posse, E. A.
- Article
32
- Semiconductors, 2006, v. 40, n. 10, p. 1173, doi. 10.1134/S1063782606100095
- Blank, T.;
- Gol'dberg, Yu.;
- Konstantinov, O.;
- Nikitin, V.;
- Posse, E.
- Article
33
- Semiconductors, 2004, v. 38, n. 11, p. 1356, doi. 10.1134/1.1823074
- Imenkov, A.N.;
- Grebenshchikova, E.A.;
- Zhurtanov, B.E.;
- Danilova, T.N.;
- Sipovskaya, M.A.;
- Vlasenko, N.V.;
- Yakovlev, Yu.P.
- Article
34
- Semiconductors, 2004, v. 38, n. 9, p. 1105, doi. 10.1134/1.1797494
- Pavel'ev, D. G.;
- Demarina, N. V.;
- Koshurinov, Yu. I.;
- Vasil'ev, A. P.;
- Semenova, E. S.;
- Zhukov, A. E.;
- Ustinov, V. M.
- Article
35
- International Power Generation, 2006, v. 29, n. 1, p. 26
- Article
36
- International Power Generation, 2001, v. 24, n. 7, p. 45
- Article
37
- Journal of Electronic Materials, 2017, v. 46, n. 8, p. 4750, doi. 10.1007/s11664-017-5406-z
- Kim, Dae-Hyun;
- Park, Jae-Seong;
- Kang, Daesung;
- Seong, Tae-Yeon
- Article
38
- Journal of Electronic Materials, 2016, v. 45, n. 6, p. 2802, doi. 10.1007/s11664-016-4375-y
- Liu, Dan;
- Lin, Chun;
- Zhou, Songmin;
- Hu, Xiaoning
- Article
39
- Journal of Electronic Materials, 2016, v. 45, n. 4, p. 2087, doi. 10.1007/s11664-015-4278-3
- Zhao, Shirong;
- McFavilen, Heather;
- Wang, Shuo;
- Ponce, Fernando A.;
- Arena, Chantal;
- Goodnick, Stephen;
- Chowdhury, Srabanti
- Article
40
- Journal of Electronic Materials, 2015, v. 44, n. 1, p. 457, doi. 10.1007/s11664-014-3399-4
- Biyik, Serkan;
- Arslan, Fazli;
- Aydin, Murat
- Article
41
- Journal of Electronic Materials, 2007, v. 36, n. 12, p. 1662, doi. 10.1007/s11664-007-0277-3
- Voss, L. F.;
- Stafford, L.;
- Khanna, R.;
- Gila, B. P.;
- Abernathy, C. R.;
- Pearton, S. J.;
- Ren, F.;
- Kravchenko, I. I.
- Article
42
- Journal of Electronic Materials, 2004, v. 33, n. 11, p. 1406, doi. 10.1007/s11664-004-0171-1
- Huang, Robin K.;
- Wang, Christine A.;
- Harris, Christopher T.;
- Connors, Michael K.;
- Shiau, Daniel A.
- Article
43
- Journal of Electronic Materials, 2004, v. 33, n. 5, p. 418, doi. 10.1007/s11664-004-0194-7
- Wang, J. H.;
- Mohney, S. E.;
- Wang, S. H.;
- Chowdhury, U.;
- Dupuis, R. D.
- Article
44
- Philosophical Magazine, 2004, v. 84, n. 24, p. 2559, doi. 10.1080/14786430410001697306
- Article
45
- Microwave & Optical Technology Letters, 2001, v. 30, n. 4, p. 257, doi. 10.1002/mop.1284
- Ahouassa, P.;
- Boussey, J.;
- Bouthinon, M.;
- Vilcot, A.
- Article
46
- Microwave & Optical Technology Letters, 1996, v. 11, n. 2, p. 59, doi. 10.1002/(SICI)1098-2760(19960205)11:2<59::AID-MOP2>3.0.CO;2-N
- Yeo, S. P.;
- Leong, M. S.;
- Kooi, P. S.;
- Yeo, T. S.;
- Zhou, X. D.
- Article
47
- Journal of the National Academy of Forensic Engineers, 2021, v. 38, n. 1, p. 25, doi. 10.51501/jotnafe.v38i1.133
- Icove, David J.;
- Lawton, Thomas A.
- Article
48
- Technical Physics, 2007, v. 52, n. 2, p. 285, doi. 10.1134/S1063784207020235
- Blank, T.;
- Gol’dberg, Yu.;
- Konstantinov, O.;
- Nikitin, V.;
- Posse, E.
- Article
49
- Proceedings of Odessa Polytechnic University / Odes'kyi Politechnichnyi Universytet Pratsi, 2017, v. 51, n. 1, p. 92, doi. 10.15276/opu.1.51.2017.14
- Glukhenkaya, T. A.;
- Egorov, V. V.;
- Kanischeva, N. O.;
- Nazarov, E. I.;
- Kipenskiy, A. V.
- Article
50
- Applied Physics A: Materials Science & Processing, 2017, v. 123, n. 5, p. 1, doi. 10.1007/s00339-017-0947-9
- Huang, Xin;
- Zhang, Huaiwu;
- Lai, Yuanming;
- Li, Jie
- Article