Structural and optical properties of Bi_3.25Nd_0.75Ti₃O₁₂ ferroelectric thin films.

Ma, J. H.; Meng, X. J.; Sun, J. L.; Xue, J. Q.; Hu, Z. G.; Shi, F. W.; Lin, T.; Chu, J. H.

Ferroelectric Bi3.25Nd0.75Ti3O12 (BNT) thin films were grown on (111)Pt/Ti/SiO2/Si substrates by a chemical solution method. The films were composed of large rod-like grains. XRD and Raman spectroscopy measurements showed they were polycrystalline perovskite structure with a good crystallinity. Pt/BNT/Pt capacitors had been fabricated and showed good ferroelectricity. The optical constants (n, k) of BNT thin films in the wavelength ranges of 0.2–1.7 μm and 2.5–11.4 μm were obtained by spectroscopic ellipsometry measurements. The dispersion of the refractive index in the interband transition region followed the single electronic oscillator model. The optical band gap was found to be about 3.61 eV.

FERROELECTRIC thin films; PLATINUM compounds; MOLECULAR structure; BISMUTH compounds; FERROELECTRICITY; RAMAN spectroscopy; X-ray diffraction

Applied Physics A: Materials Science & Processing, 2007, Vol 88, Issue 2, p439

0947-8396

Academic Journal

10.1007/s00339-007-4014-9