Works matching DE "RADIO frequency discharges"
1
- Technical Physics Letters, 2008, v. 34, n. 10, p. 845, doi. 10.1134/S1063785008100106
- Plyaka, P. S.;
- Tolmachev, G. N.;
- Kovtun, A. P.
- Article
2
- Technical Physics Letters, 2008, v. 34, n. 8, p. 685, doi. 10.1134/S106378500808018X
- Vasilyak, L. M.;
- Vetchinin, S. P.;
- Obvival’neva, A. A.;
- Polyakov, D. N.
- Article
3
- Technical Physics Letters, 1999, v. 25, n. 11, p. 858, doi. 10.1134/1.1262661
- Lomaev, M. I.;
- Skakun, V. S.;
- Sosnin, É. A.;
- Tarasenko, V. F.;
- Shitts, D. V.
- Article
4
- Technical Physics Letters, 1999, v. 25, n. 10, p. 772, doi. 10.1134/1.1262630
- Aleksandrov, A. F.;
- Rukhadze, A. A.;
- Savinov, V. P.;
- Singaevskiı, I. F.
- Article
5
- Technical Physics Letters, 1998, v. 24, n. 3, p. 233, doi. 10.1134/1.1262066
- Article
6
- Technical Physics Letters, 1997, v. 23, n. 1, p. 26, doi. 10.1134/1.1261608
- Smirnov, A. S.;
- Orlov, K. E.
- Article
7
- Technical Physics Letters, 1997, v. 23, n. 1, p. 75, doi. 10.1134/1.1261622
- Raızer, Yu. P.;
- Schneıder, M. N.
- Article
8
- Applied Physics B: Lasers & Optics, 2005, v. 81, n. 8, p. 1149, doi. 10.1007/s00340-005-1955-6
- Agroskin, V.Y.;
- Bravy, B.G.;
- Chernyshev, Y.A.;
- Kashtanov, S.A.;
- Kirianov, V.I.;
- Makarov, E.F.;
- Papin, V.G.;
- Sotnichenko, S.A.;
- Vasiliev, G.K.
- Article
9
- Insight: Non-Destructive Testing & Condition Monitoring, 2009, v. 51, n. 8, p. 442, doi. 10.1784/insi.2009.51.8.442
- Shan, Q;
- Bhatti, S;
- Glover, I A;
- Atkinson, R;
- Rutherford, R
- Article
10
- Advances in Radio Science, 2009, v. 7, p. 197, doi. 10.5194/ars-7-197-2009
- Sooksood, K.;
- Stieglitz, T.;
- Ortmanns, M.
- Article
11
- Radiophysics & Quantum Electronics, 2003, v. 46, n. 8/9, p. 737, doi. 10.1023/B:RAQE.0000025006.22680.6e
- Vodopyanov, A.;
- Golubev, S.;
- Zorin, V.;
- Razin, S.;
- Sidorov, A.;
- Skalyga, V.;
- Shalashov, A.
- Article
12
- Materials Science & Technology, 2009, v. 25, n. 6, p. 739, doi. 10.1179/174328408X383766
- Qiu, L.;
- Yang, C. L.;
- Lin, S. B.;
- Fan, C. L.
- Article
13
- Materials Science & Technology, 2009, v. 25, n. 5, p. 591, doi. 10.1179/174328408X388167
- Arora, A.;
- George, P. J.;
- Dwivedi, V. K.;
- Gupta, V.
- Article
14
- Journal of Engineering Physics & Thermophysics, 2005, v. 78, n. 2, p. 394, doi. 10.1007/s10891-005-0074-x
- Chernukho, A.;
- Migun, A.;
- Zhdanok, S.;
- Rostaing, J.;
- Perrin, J.
- Article
15
- Journal of Otolaryngology -- Head & Neck Surgery, 2008, v. 37, n. 2, p. 260, doi. 10.2310/7070.2008.0054
- Labra, Alberto;
- Huerta-Delgado, Angel-Daniel;
- Gutierrez-Sanchez, Carolina;
- Haro-Valencia, Reyes;
- Cordero-Chacon, Sealtiel-Aaron
- Article
16
- Microwave & Optical Technology Letters, 2010, v. 52, n. 11, p. 2441, doi. 10.1002/mop.25496
- Shekhar, Sameer;
- Abbaspour-Tamijani, Abbas
- Article
17
- Microwave & Optical Technology Letters, 2010, v. 52, n. 11, p. 2459, doi. 10.1002/mop.25504
- Ho-Sub Shin;
- Yong-Woong Jang
- Article
18
- Microwave & Optical Technology Letters, 2010, v. 52, n. 11, p. 2456, doi. 10.1002/mop.25505
- Lan Liu;
- Shilie Zheng;
- Jun Ji;
- Minghui Guo;
- Xianmin Zhang;
- Xiaofeng Jin;
- Hao Chi;
- Yingyin Kevin Zou
- Article
19
- Microwave & Optical Technology Letters, 2010, v. 52, n. 11, p. 2448, doi. 10.1002/mop.25510
- Zhou Cao;
- Xiaohong Tang;
- Ling Wang
- Article
20
- Microwave & Optical Technology Letters, 2010, v. 52, n. 11, p. 2438, doi. 10.1002/mop.25512
- Ji-Yeon Kim;
- Sang-Hyun Chun;
- Dong-Hee Jang;
- Jong-Heon Kim;
- Kennedy, Gray P.
- Article
21
- Microwave & Optical Technology Letters, 2010, v. 52, n. 11, p. 2608, doi. 10.1002/mop.25525
- Yuanxin Li;
- Quan Xue;
- Yunliang Long
- Article
22
- Microwave & Optical Technology Letters, 2010, v. 52, n. 11, p. 2563, doi. 10.1002/mop.25535
- Garmjani, N. Molaei;
- Komjani, Nader
- Article
23
- Microwave & Optical Technology Letters, 2010, v. 52, n. 11, p. 2621, doi. 10.1002/mop.25539
- Lv, H.;
- Lu, G. H.;
- Jing, X. J.;
- Wang, J. Q.
- Article
24
- Microwave & Optical Technology Letters, 2010, v. 52, n. 11, p. 2594, doi. 10.1002/mop.25540
- Lu, W. J.;
- Weng, Y.F.;
- Cheung, S.W.;
- Zhu, H. B.
- Article
25
- Microwave & Optical Technology Letters, 2010, v. 52, n. 11, p. 2618, doi. 10.1002/mop.25546
- Yong-Hyun Baek;
- Sang-Jin Lee;
- Tae-Jong Baek;
- Sung-Woon Mun;
- Dong-Sik Ko;
- Byoung-Chul Jeon;
- Wan-Joo Kim;
- Jae-Hyun Choi;
- Nam-Jae Lee;
- Jin-Koo Rhee
- Article
26
- Doklady Physics, 2003, v. 48, n. 3, p. 119, doi. 10.1134/1.1565615
- Rusanov, V. D.;
- Babaritskiı, A. I.;
- Gerasimov, E. N.;
- Deminskiı, M. A.;
- Demkin, S. A.;
- Zhivotov, V. K.;
- Moskovskiı, A. S.;
- Potapkin, B. V.;
- Smirnov, R. V.;
- Strelkova, M. I.
- Article
27
- Electrical Engineering in Japan, 2000, v. 130, n. 1, p. 1, doi. 10.1002/(SICI)1520-6416(200001)130:1<1::AID-EEJ1>3.0.CO;2-R
- Iizuka, Satoru;
- Sato, Noriyoshi
- Article
28
- Electrical Engineering in Japan, 1999, v. 127, n. 4, p. 9, doi. 10.1002/(SICI)1520-6416(199906)127:4<9::AID-EEJ2>3.0.CO;2-5
- Takaki, Koichi;
- Sayama, Kunio;
- Takahashi, Atsushi;
- Fujiwara, Tamiya;
- Nagata, Masakatsu;
- Ono, Motoyuki;
- Jani, Muaffaq Achmad
- Article
29
- International Journal on Electrical Engineering & Informatics, 2011, v. 3, n. 1, p. 74
- Vibhakar, C. K.;
- Kanitkar, S. A.
- Article
30
- Doklady Earth Sciences, 2015, v. 462, n. 2, p. 596, doi. 10.1134/S1028334X15060021
- Babich, L.;
- Bochkov, E.;
- Kutsyk, I.
- Article
31
- Surface Engineering, 2018, v. 34, n. 1, p. 1, doi. 10.1179/1743294415Y.0000000010
- Stadnichenko, A. I.;
- Kibis, L. S.;
- Svintsitskiy, D. A.;
- Koshcheev, S. V.;
- Boronin, A. I.
- Article
32
- Transactions of the Japan Society of Aeronautical & Space Sciences, Aerospace Technology Japan, 2016, v. 14, n. ists 30, p. 23
- VOLKMAR, Chris;
- RICKLEFS, Ubbo;
- KLAR, Peter J.
- Article
33
- Transactions of the Japan Society of Aeronautical & Space Sciences, Aerospace Technology Japan, 2016, v. 14, n. ists 30, p. 77
- Hiroki WATANABE;
- Takanori DEGUCHI;
- Shuka TAKEDA;
- Yuki MIURA;
- Masanori ICHIMURA;
- Haruki TAKEGAHARA
- Article
34
- Technical Physics, 2007, v. 52, n. 1, p. 99, doi. 10.1134/S1063784207010173
- Ivanov, A.;
- Podyminogin, A.;
- Shikhovtsev, I.
- Article
35
- Technical Physics, 2005, v. 50, n. 7, p. 951, doi. 10.1134/1.1994980
- Article
36
- Technical Physics, 1998, v. 43, n. 5, p. 526, doi. 10.1134/1.1259033
- Article
37
- Acta Physica Polonica: A, 2010, v. 117, n. 6, p. 911, doi. 10.12693/APhysPolA.117.911
- Article
38
- Plasma Chemistry & Plasma Processing, 2017, v. 37, n. 4, p. 1281, doi. 10.1007/s11090-016-9770-x
- Jiang, Xin-Xian;
- Li, Wei-Ping;
- Xu, Shao-Wei;
- He, Feng;
- Chen, Qiang
- Article
39
- Plasma Chemistry & Plasma Processing, 2017, v. 37, n. 6, p. 1655, doi. 10.1007/s11090-017-9846-2
- Kornev, R.;
- Sennikov, P.;
- Sintsov, S.;
- Vodopyanov, A.
- Article
40
- Plasma Chemistry & Plasma Processing, 2017, v. 37, n. 6, p. 1663, doi. 10.1007/s11090-017-9847-1
- Hossain, Md.;
- Ohtsu, Yasunori;
- Tabaru, Tatsuo
- Article
41
- Plasma Chemistry & Plasma Processing, 2017, v. 37, n. 6, p. 1463, doi. 10.1007/s11090-017-9833-7
- Wang, Lei;
- Wang, Jinxiu;
- Zhang, Songlin;
- Liao, Wenchao
- Article
42
- 2017
- Jiang, Xin-Xian;
- Li, Wei-Ping;
- Xu, Shao-Wei;
- He, Feng;
- Chen, Qiang
- Erratum
43
- Plasma Chemistry & Plasma Processing, 2014, v. 34, n. 5, p. 1081, doi. 10.1007/s11090-014-9559-8
- Vasko, C.;
- Liu, D.;
- Veldhuizen, E.;
- Iza, F.;
- Bruggeman, P.
- Article
44
- Plasma Chemistry & Plasma Processing, 2012, v. 32, n. 5, p. 979, doi. 10.1007/s11090-012-9386-8
- Wang, Shuang;
- Zhang, Yong;
- Liu, Xiaolin;
- Wang, Xiangrong
- Article
45
- Journal of Radioanalytical & Nuclear Chemistry, 2016, v. 309, n. 2, p. 833, doi. 10.1007/s10967-015-4687-z
- Kornev, Roman;
- Sennikov, Petr;
- Konychev, Dmitry;
- Potapov, Alexandr;
- Chuvilin, Dmitry;
- Yunin, Pavel;
- Gusev, Sergey;
- Naumann, Martin
- Article
46
- Optics & Spectroscopy, 2018, v. 125, n. 3, p. 324, doi. 10.1134/S0030400X18090175
- Kuznetsov, V. S.;
- Sosnin, E. A.;
- Panarin, V. A.;
- Skakun, V. S.;
- Tarasenko, V. F.
- Article
47
- Applied Physics A: Materials Science & Processing, 2004, v. 79, n. 4-6, p. 1283, doi. 10.1007/s00339-004-2751-6
- Verardi, P.;
- Craciun, F.;
- Scarisoreanu, N.;
- Epurescu, G.;
- Dinescu, M.;
- Vrejoiu, I.;
- Dauscher, A.
- Article
48
- Applied Physics A: Materials Science & Processing, 2004, v. 79, n. 4-6, p. 1267, doi. 10.1007/s00339-004-2733-8
- Novotný, M.;
- Jelínek, M.;
- Bulíř, J.;
- Lančok, J.;
- Vorlíček, V.;
- Bonarski, J.
- Article
49
- European Physical Journal D (EPJ D), 2012, v. 66, n. 4, p. 1, doi. 10.1140/epjd/e2012-20655-x
- Jirásek, V.;
- Schmiedberger, J.;
- Čenský, M.;
- Kodymová, J.
- Article
50
- European Physical Journal D (EPJ D), 2008, v. 48, n. 1, p. 35, doi. 10.1140/epjd/e2008-00059-5
- Lopez, O.;
- Amy-Klein, A.;
- Daussy, C.;
- Chardonnet, C.;
- Narbonneau, F.;
- Lours, M.;
- Santarelli, G.
- Article