Works matching DE "SILICON testing"
1
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 24, p. 18331, doi. 10.1007/s10854-017-7779-4
- Wu, Cheng-You;
- Lin, Yow-Jon
- Article
2
- EFSA Journal, 2018, v. 16, n. 1, p. 1, doi. 10.2903/j.efsa.2018.5086
- Younes, Maged;
- Aggett, Peter;
- Aguilar, Fernando;
- Crebelli, Riccardo;
- Dusemund, Birgit;
- Filipič, Metka;
- Frutos, Maria Jose;
- Galtier, Pierre;
- Gundert‐Remy, Ursula;
- Kuhnle, Gunter Georg;
- Lambré, Claude;
- Leblanc, Jean‐Charles;
- Lillegaard, Inger Therese;
- Moldeus, Peter;
- Mortensen, Alicja;
- Oskarsson, Agneta;
- Stankovic, Ivan;
- Waalkens‐Berendsen, Ine;
- Woutersen, Rudolf Antonius;
- Wright, Matthew
- Article
3
- 2019
- Rietjens, Ivonne M. C. M.;
- Ning, Jia;
- Chen, Lu;
- Wesseling, Sebastiaan;
- Louisse, Jochem;
- Strikwold, Marije
- Letter to the Editor
4
- Journal of Electronic Testing, 2018, v. 34, n. 5, p. 571, doi. 10.1007/s10836-018-5745-6
- Karimi, Naghmeh;
- Danger, Jean-Luc;
- Guilley, Sylvain
- Article
5
- Agricultural Management / Lucrari Stiintifice Seria I, Management Agricol, 2018, v. 20, n. 3, p. 26
- GABRIEL, CĂBĂROIU;
- IOAN, RUJESCU CIPRIAN;
- FLORIN, SALA
- Article
6
- Journal of Materials Science, 2019, v. 54, n. 2, p. 911, doi. 10.1007/s10853-018-2947-3
- Abdullah, Mohd Faizol;
- Hashim, Abdul Manaf
- Article
7
- JOM: The Journal of The Minerals, Metals & Materials Society (TMS), 2015, v. 67, n. 12, p. 2914, doi. 10.1007/s11837-015-1618-y
- Armstrong, David;
- Tarleton, Edmund
- Article
8
- 2015
- Hosemann, Peter;
- Li, Xiaodong
- Editorial
9
- Physica Status Solidi - Rapid Research Letters, 2016, v. 10, n. 3, p. 237, doi. 10.1002/pssr.201510437
- Payne, D. N. R.;
- Chan, C. E.;
- Hallam, B. J.;
- Hoex, B.;
- Abbott, M. D.;
- WENham, S. R.;
- Bagnall, D. M.
- Article
10
- Progress in Photovoltaics, 2014, v. 22, n. 5, p. 574, doi. 10.1002/pip.2290
- Yang, Xinbo;
- Fujiwara, K.;
- Maeda, K.;
- Nozawa, J.;
- Koizumi, H.;
- Uda, S.
- Article
11
- Advanced Energy Materials, 2015, v. 5, n. 6, p. n/a, doi. 10.1002/aenm.201401745
- Elbersen, Rick;
- Tiggelaar, Roald M.;
- Milbrat, Alexander;
- Mul, Guido;
- Gardeniers, Han;
- Huskens, Jurriaan
- Article
12
- Rapid Communications in Mass Spectrometry: RCM, 2014, v. 28, n. 10, p. 1153, doi. 10.1002/rcm.6880
- Lassalle, Yannick;
- Kinani, Aziz;
- Rifai, Ahmad;
- Souissi, Yasmine;
- Clavaguera, Carine;
- Bourcier, Sophie;
- Jaber, Farouk;
- Bouchonnet, Stéphane
- Article