Works matching Insulators


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    基于U-net和YOLOv4的绝缘子图像分割与缺陷检测.

    Published in:
    Journal of South China Normal University (Natural Science Edition) / Huanan Shifan Daxue Xuebao (Ziran Kexue Ban), 2020, v. 52, n. 6, p. 15, doi. 10.6054/j.jscnun.2020088
    By:
    • 唐小煜;
    • 黄进波;
    • 冯洁文;
    • 陈锡和
    Publication type:
    Article
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