Works matching DE "IEEE Computer Society"
1
- Electrical Engineering, 2018, v. 100, n. 1, p. 333, doi. 10.1007/s00202-017-0508-4
- Article
2
- International Journal of High Speed Electronics & Systems, 2011, v. 20, n. 3, p. iii, doi. 10.1142/S0129156411006659
- Wraback, Michael;
- Shur, Michael
- Article
3
- Neural Computing & Applications, 2013, v. 23, n. 3/4, p. 1185, doi. 10.1007/s00521-012-0980-8
- Sheikhan, Mansour;
- Mohammadi, Najmeh
- Article
4
- Insight: Non-Destructive Testing & Condition Monitoring, 2012, v. 54, n. 5, p. 284
- Article
5
- Journal of Grey System, 2013, v. 25, n. 1, p. 1
- Article
6
- Research in Higher Education, 2019, v. 60, n. 1, p. 64, doi. 10.1007/s11162-018-9503-5
- Lukács J., Ágnes;
- Dávid, Beáta
- Article
7
- IADIS International Journal on Computer Science & Information Systems, 2014, v. 9, n. 1, p. 81
- Article
8
- International Journal on Artificial Intelligence Tools, 2013, v. 22, n. 5, p. -1, doi. 10.1142/S0218213013020016
- Zhu, Xingquan;
- Khoshgoftaar, Taghi M.
- Article
9
- International Journal on Artificial Intelligence Tools, 2013, v. 22, n. 4, p. -1, doi. 10.1142/S021821301350022X
- NIU, YONGYONG;
- CAI, ZIXING;
- JIN, MIN
- Article
10
- International Journal of Computational Intelligence & Applications, 2013, v. 12, n. 1, p. 1, doi. 10.1142/S1469026813830010
- Article
11
- International Journal of Neural Systems, 2022, v. 32, n. 12, p. 1, doi. 10.1142/S0129065722500514
- Wu, Binyi;
- Waschneck, Bernd;
- Mayr, Christian Georg
- Article
12
- Journal of Electronic Testing, 2022, v. 38, n. 4, p. 337, doi. 10.1007/s10836-022-06021-y
- Article
13
- Journal of Electronic Testing, 2019, v. 35, n. 6, p. 765, doi. 10.1007/s10836-019-05847-3
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14
- Journal of Electronic Testing, 2015, v. 31, n. 3, p. 227, doi. 10.1007/s10836-015-5532-6
- Article
15
- Journal of Electronic Testing, 2015, v. 31, n. 1, p. 9, doi. 10.1007/s10836-015-5508-6
- Article
16
- Journal of Electronic Testing, 2014, v. 30, n. 6, p. 641, doi. 10.1007/s10836-014-5493-1
- Article
17
- Journal of Electronic Testing, 2014, v. 30, n. 2, p. 157, doi. 10.1007/s10836-014-5443-y
- Article
18
- Journal of Electronic Testing, 2013, v. 29, n. 6, p. 743, doi. 10.1007/s10836-013-5422-8
- Article
19
- Journal of Electronic Testing, 2013, v. 29, n. 5, p. 619, doi. 10.1007/s10836-013-5412-x
- Article
20
- Journal of Electronic Testing, 2013, v. 29, n. 3, p. 257, doi. 10.1007/s10836-013-5381-0
- Article
21
- Journal of Electronic Testing, 2012, v. 28, n. 2, p. 153, doi. 10.1007/s10836-012-5288-1
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22
- Journal of Electronic Testing, 2011, v. 27, n. 4, p. 427, doi. 10.1007/s10836-011-5236-5
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23
- IEEE Software, 2015, v. 32, n. 3, p. c2, doi. 10.1109/MS.2015.72
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24
- IEEE Software, 2015, v. 32, n. 3, p. c4, doi. 10.1109/MS.2015.69
- Article
25
- IEEE Software, 2015, v. 32, n. 2, p. c1, doi. 10.1109/MS.2015.42
- Article
26
- IEEE Software, 2014, v. 31, n. 6, p. 41, doi. 10.1109/MS.2014.149
- Smite, Darja;
- Kuhrmann, Marco;
- Keil, Patrick
- Article
27
- IEEE Software, 2014, v. 31, n. 6, p. 4, doi. 10.1109/MS.2014.143
- Article
28
- IEEE Software, 2014, v. 31, n. 5, p. c2, doi. 10.1109/MS.2014.122
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29
- IEEE Software, 2014, v. 31, n. 5, p. c3, doi. 10.1109/MS.2014.116
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30
- IEEE Software, 2014, v. 31, n. 5, p. c4, doi. 10.1109/MS.2014.121
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32
- IEEE Software, 2014, v. 31, n. 3, p. c1, doi. 10.1109/MS.2014.61
- Article
33
- IEEE Software, 2014, v. 31, n. 3, p. c3, doi. 10.1109/MS.2014.66
- Article
34
- IEEE Software, 2014, v. 31, n. 3, p. c4, doi. 10.1109/MS.2014.70
- Article
35
- IEEE Software, 2014, v. 31, n. 3, p. 55, doi. 10.1109/MS.2014.60
- Article
36
- IEEE Software, 2014, v. 31, n. 3, p. 1, doi. 10.1109/MS.2014.65
- Article
39
- IEEE Software, 2014, v. 31, n. 1, p. c2, doi. 10.1109/MS.2014.6
- Article
40
- IEEE Software, 2013, v. 30, n. 5, p. c3, doi. 10.1109/MS.2013.107
- Article
41
- IEEE Software, 2012, v. 29, n. 5, p. c3, doi. 10.1109/MS.2012.115
- Article
42
- IEEE Software, 2012, v. 29, n. 1, p. c4, doi. 10.1109/MS.2012.11
- Article
43
- IEEE Software, 2011, v. 28, n. 6, p. 1, doi. 10.1109/MS.2011.142
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44
- IEEE Software, 2011, v. 28, n. 5, p. 85, doi. 10.1109/MS.2011.100
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45
- IEEE Software, 2011, v. 28, n. 5, p. 45, doi. 10.1109/MS.2011.99
- Article
46
- IEEE Software, 2011, v. 28, n. 4, p. c3, doi. 10.1109/MS.2011.79
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47
- IEEE Software, 2010, v. 27, n. 5, p. c3, doi. 10.1109/MS.2010.120
- Article
48
- IEEE Software, 2006, v. 23, n. 6, p. 16, doi. 10.1109/MS.2006.164
- Lutz, Michael J.;
- Bagert, Donald G.
- Article
49
- IEEE Software, 2006, v. 23, n. 6, p. 5, doi. 10.1109/MS.2006.161
- Article
50
- IEEE Software, 2005, v. 22, n. 1, p. 5, doi. 10.1109/MS.2005.5
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