Works matching DE "IEEE Computer Society"


Results: 180
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    2

    PREFACE.

    Published in:
    International Journal of High Speed Electronics & Systems, 2011, v. 20, n. 3, p. iii, doi. 10.1142/S0129156411006659
    By:
    • Wraback, Michael;
    • Shur, Michael
    Publication type:
    Article
    3
    4

    International Diary.

    Published in:
    Insight: Non-Destructive Testing & Condition Monitoring, 2012, v. 54, n. 5, p. 284
    Publication type:
    Article
    5

    Acknowledgements.

    Published in:
    Journal of Grey System, 2013, v. 25, n. 1, p. 1
    Publication type:
    Article
    6
    7

    Foreword.

    Published in:
    IADIS International Journal on Computer Science & Information Systems, 2014, v. 9, n. 1, p. 81
    Publication type:
    Article
    8

    EDITORIAL.

    Published in:
    International Journal on Artificial Intelligence Tools, 2013, v. 22, n. 5, p. -1, doi. 10.1142/S0218213013020016
    By:
    • Zhu, Xingquan;
    • Khoshgoftaar, Taghi M.
    Publication type:
    Article
    9
    10

    CALENDAR OF EVENTS.

    Published in:
    International Journal of Computational Intelligence & Applications, 2013, v. 12, n. 1, p. 1, doi. 10.1142/S1469026813830010
    Publication type:
    Article
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    14

    Test Technology Newsletter.

    Published in:
    Journal of Electronic Testing, 2015, v. 31, n. 3, p. 227, doi. 10.1007/s10836-015-5532-6
    Publication type:
    Article
    15

    Test Technology Newsletter.

    Published in:
    Journal of Electronic Testing, 2015, v. 31, n. 1, p. 9, doi. 10.1007/s10836-015-5508-6
    Publication type:
    Article
    16

    Test Technology Newsletter.

    Published in:
    Journal of Electronic Testing, 2014, v. 30, n. 6, p. 641, doi. 10.1007/s10836-014-5493-1
    Publication type:
    Article
    17

    Test Technology Newsletter.

    Published in:
    Journal of Electronic Testing, 2014, v. 30, n. 2, p. 157, doi. 10.1007/s10836-014-5443-y
    Publication type:
    Article
    18

    Test Technology Newsletter.

    Published in:
    Journal of Electronic Testing, 2013, v. 29, n. 6, p. 743, doi. 10.1007/s10836-013-5422-8
    Publication type:
    Article
    19

    Test Technology Newsletter.

    Published in:
    Journal of Electronic Testing, 2013, v. 29, n. 5, p. 619, doi. 10.1007/s10836-013-5412-x
    Publication type:
    Article
    20

    Test Technology Newsletter.

    Published in:
    Journal of Electronic Testing, 2013, v. 29, n. 3, p. 257, doi. 10.1007/s10836-013-5381-0
    Publication type:
    Article
    21

    Test Technology Newsletter.

    Published in:
    Journal of Electronic Testing, 2012, v. 28, n. 2, p. 153, doi. 10.1007/s10836-012-5288-1
    Publication type:
    Article
    22

    Test Technology Newsletter.

    Published in:
    Journal of Electronic Testing, 2011, v. 27, n. 4, p. 427, doi. 10.1007/s10836-011-5236-5
    Publication type:
    Article
    23
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    25

    Front Cover.

    Published in:
    IEEE Software, 2015, v. 32, n. 2, p. c1, doi. 10.1109/MS.2015.42
    Publication type:
    Article
    26
    27

    Passing the Baton.

    Published in:
    IEEE Software, 2014, v. 31, n. 6, p. 4, doi. 10.1109/MS.2014.143
    By:
    • Shull, Forrest
    Publication type:
    Article
    28
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    32

    Front Cover.

    Published in:
    IEEE Software, 2014, v. 31, n. 3, p. c1, doi. 10.1109/MS.2014.61
    Publication type:
    Article
    33
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    36

    Masthead.

    Published in:
    IEEE Software, 2014, v. 31, n. 3, p. 1, doi. 10.1109/MS.2014.65
    Publication type:
    Article
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    49

    Giving Back.

    Published in:
    IEEE Software, 2006, v. 23, n. 6, p. 5, doi. 10.1109/MS.2006.161
    By:
    • Harrison, Warren
    Publication type:
    Article
    50