Works matching IS 02683768 AND DT 2003 AND VI 22 AND IP 1/2
1
- International Journal of Advanced Manufacturing Technology, 2003, v. 22, n. 1/2, p. 75, doi. 10.1007/s00170-002-1444-6
- Article
2
- International Journal of Advanced Manufacturing Technology, 2003, v. 22, n. 1/2, p. 101, doi. 10.1007/s00170-002-1447-3
- Tandon, Puneet;
- Gupta, P.;
- Dhande, S. G.
- Article
3
- International Journal of Advanced Manufacturing Technology, 2003, v. 22, n. 1/2, p. 33, doi. 10.1007/s00170-002-1440-x
- Article
4
- International Journal of Advanced Manufacturing Technology, 2003, v. 22, n. 1/2, p. 89, doi. 10.1007/s00170-002-1446-4
- Article
5
- International Journal of Advanced Manufacturing Technology, 2003, v. 22, n. 1/2, p. 112, doi. 10.1007/s00170-002-1448-2
- Yibao Chen;
- Meifa Huang;
- Jianchu Yao;
- Yifang Zhong
- Article
6
- International Journal of Advanced Manufacturing Technology, 2003, v. 22, n. 1/2, p. 12, doi. 10.1007/s00170-002-1435-7
- Hambli, Ridha;
- Mkaddem, Ali;
- Potiron, Alain
- Article
7
- International Journal of Advanced Manufacturing Technology, 2003, v. 22, n. 1/2, p. 20, doi. 10.1007/s00170-002-1437-5
- Hambli, R.;
- Richir, S.;
- Crubleau, P.;
- Taravel, B.
- Article
8
- International Journal of Advanced Manufacturing Technology, 2003, v. 22, n. 1/2, p. 26, doi. 10.1007/s00170-002-1439-3
- Yanrong Ni;
- Feiya Fan;
- Juanqi Yan;
- Dengzhe Ma;
- Ye Jin
- Article
9
- International Journal of Advanced Manufacturing Technology, 2003, v. 22, n. 1/2, p. 118, doi. 10.1007/s00170-002-1450-8
- Article
10
- International Journal of Advanced Manufacturing Technology, 2003, v. 22, n. 1/2, p. 41, doi. 10.1007/s00170-002-1441-9
- Yousef, Basem F.;
- Knopf, George K.;
- Bordatchev, Evgueni V.;
- Nikumb, Suwas K.
- Article
11
- International Journal of Advanced Manufacturing Technology, 2003, v. 22, n. 1/2, p. 54, doi. 10.1007/s00170-002-1442-8
- Zheng, J. M.;
- Chan, K. W.;
- Gibson, I
- Article
12
- International Journal of Advanced Manufacturing Technology, 2003, v. 22, n. 1/2, p. 68, doi. 10.1007/s00170-002-1443-7
- Shin, B. S.;
- Yang, D. Y.;
- Choi, D. S.;
- Lee, E. S.;
- Je, T. J.;
- Whang, K. H.
- Article
13
- International Journal of Advanced Manufacturing Technology, 2003, v. 22, n. 1/2, p. 125, doi. 10.1007/s00170-002-1451-7
- George, Abraham P.;
- Rajendran, Chandrasekharan;
- Ghosh, Soumyadip
- Article
14
- International Journal of Advanced Manufacturing Technology, 2003, v. 22, n. 1/2, p. 1, doi. 10.1007/s00170-003-1621-2
- LungHsi Chen;
- Jyhjeng Deng;
- HsinShih Chen;
- MingHua Chen
- Article
15
- International Journal of Advanced Manufacturing Technology, 2003, v. 22, n. 1/2, p. 134, doi. 10.1007/s00170-002-1453-5
- Chung Yeh;
- Hung-Cheng Yang
- Article
16
- International Journal of Advanced Manufacturing Technology, 2003, v. 22, n. 1/2, p. 141, doi. 10.1007/s00170-002-1455-3
- Zhang, W. Z.;
- Wang, G. X.;
- Cheok, B. T.;
- Nee, A. Y. C.
- Article
17
- International Journal of Advanced Manufacturing Technology, 2003, v. 22, n. 1/2, p. 150, doi. 10.1007/s00170-002-1460-6
- Gian, Robert;
- T. W. Lin;
- Lin, Alan C.
- Article