Works matching IS 03615235 AND DT 2006 AND VI 35 AND IP 2
1
- Journal of Electronic Materials, 2006, v. 35, n. 2, p. 372, doi. 10.1007/BF02692459
- Liang, J.;
- Dariavach, N.;
- Barr, G.;
- Fang, Z.
- Article
2
- Journal of Electronic Materials, 2006, v. 35, n. 2, p. 366, doi. 10.1007/BF02692458
- Chang, C. W.;
- Lee, Q. P.;
- Ho, C. E.;
- Kao, C. R.
- Article
3
- Journal of Electronic Materials, 2006, v. 35, n. 2, p. 360, doi. 10.1007/BF02692457
- Lee, D. M.;
- Lim, C. H.;
- Cho, D. C.;
- Lee, Y. S.;
- Lee, C. H.
- Article
4
- Journal of Electronic Materials, 2006, v. 35, n. 2, p. 353, doi. 10.1007/BF02692456
- Article
5
- Journal of Electronic Materials, 2006, v. 35, n. 2, p. 343, doi. 10.1007/BF02692455
- Chia-Ying Li;
- Guo-Jyun Chiou;
- Jenq-Gong Duh
- Article
6
- Journal of Electronic Materials, 2006, v. 35, n. 2, p. 333, doi. 10.1007/BF02692454
- Hung-Kai Chen;
- Shih-Hai Li;
- Jenq-Gong Duh
- Article
7
- Journal of Electronic Materials, 2006, v. 35, n. 2, p. 323, doi. 10.1007/BF02692453
- Guh-Yaw Jang;
- Jenq-Gong Duh;
- Takahashi, Hideyuki;
- Su, David
- Article
8
- Journal of Electronic Materials, 2006, v. 35, n. 2, p. 319, doi. 10.1007/BF02692452
- Gan Feng;
- Yoshimoto, Masahiro
- Article
9
- Journal of Electronic Materials, 2006, v. 35, n. 2, p. 310, doi. 10.1007/BF02692451
- Tung-Han Chuang;
- Shiu-Fang Yen;
- Hui-Min Wu
- Article
10
- Journal of Electronic Materials, 2006, v. 35, n. 2, p. 302, doi. 10.1007/BF02692450
- Chuang, T. H.;
- Yen, S. F.;
- Cheng, M. D.
- Article
11
- Journal of Electronic Materials, 2006, v. 35, n. 2, p. 292, doi. 10.1007/BF02692449
- Chih-Kuang Lin;
- Chun-Ming Huang
- Article
12
- Journal of Electronic Materials, 2006, v. 35, n. 2, p. 284, doi. 10.1007/BF02692448
- Whitney, M.;
- Corbin, S. F.
- Article
13
- Journal of Electronic Materials, 2006, v. 35, n. 2, p. 279, doi. 10.1007/BF02692447
- Yeau Ren Jeng;
- Sang Mao Chiu
- Article
14
- Journal of Electronic Materials, 2006, v. 35, n. 2, p. 273, doi. 10.1007/BF02692446
- Article
15
- Journal of Electronic Materials, 2006, v. 35, n. 2, p. 266, doi. 10.1007/BF02692445
- Yongkun Sin;
- Presser, Nathan;
- Adams, Paul
- Article
16
- Journal of Electronic Materials, 2006, v. 35, n. 2, p. 257, doi. 10.1007/BF02692444
- Chen, K. M.;
- Chiang, K. N.
- Article
17
- Journal of Electronic Materials, 2006, v. 35, n. 2, p. 250, doi. 10.1007/BF02692443
- Mattila, T. T.;
- Kivilahti, J. K.
- Article
18
- Journal of Electronic Materials, 2006, v. 35, n. 2, p. 243, doi. 10.1007/BF02692442
- Po-Hsun Lei;
- Chyi-Dar Yang;
- Ming-Yuan Wu;
- Chih-Wei Hu;
- Meng-Chyi Wu;
- Yin-Hsun Huang;
- Wen-Jeng Ho
- Article
19
- Journal of Electronic Materials, 2006, v. 35, n. 2, p. 235, doi. 10.1007/BF02692441
- Kay Hyeok An;
- Chol-Min Yang;
- Ji Yeong Lee;
- Seong Chu Lim;
- Chul Kang;
- Joo-Hiuk Son;
- Mun Seok Jeong;
- Young Hee Lee
- Article
20
- Journal of Electronic Materials, 2006, v. 35, n. 2, p. 230, doi. 10.1007/BF02692440
- Chen, K. N.;
- Fan, A.;
- Tan, C. S.;
- Reif, R.
- Article
21
- Journal of Electronic Materials, 2006, v. 35, n. 2, p. 224, doi. 10.1007/BF02692439
- Gupta, Sidhartha;
- Ou, Runqing;
- Gerhardt, Rosario A.
- Article
22
- Journal of Electronic Materials, 2006, v. 35, n. 2, p. 211, doi. 10.1007/BF02692438
- Deck, Christian P.;
- McKee, Gregg S. B.;
- Vecchio, Kenneth S.
- Article
23
- Journal of Electronic Materials, 2006, v. 35, n. 2, p. 207, doi. 10.1007/BF02692437
- Feng Ding;
- Bolton, Kim;
- Rosén, Arne
- Article
24
- Journal of Electronic Materials, 2006, v. 35, n. 2, p. 200, doi. 10.1007/BF02692436
- Nguyen, Pho;
- Vaddiraju, Sreeram;
- Meyyappan, M.
- Article
25
- Journal of Electronic Materials, 2006, v. 35, n. 2, p. 195, doi. 10.1007/BF02692435
- Lingbo Zhu;
- Jianwen Xu;
- Yonghao Xiu;
- Hess, Dennis W.;
- Wong, C. P.
- Article
26
- Journal of Electronic Materials, 2006, v. 35, n. 2, p. 192, doi. 10.1007/BF02692434
- Turano, Stephan P.;
- Ready, Jud
- Article
27
- Journal of Electronic Materials, 2006, v. 35, n. 2, p. 191, doi. 10.1007/BF02692433
- Ready, W. Jud;
- Rao, Apparao M.
- Article