Found: 10
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Quantitative thickness determination using x-ray fluorescence: application to multiple layers.
- Published in:
- XRS: X-ray Spectrometry, 2004, v. 33, n. 5, p. 354, doi. 10.1002/xrs.729
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- Article
Inelastic and elastic scattering differential cross-sections of 59.5 keV photons for Cu and Zn targets.
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- XRS: X-ray Spectrometry, 2004, v. 33, n. 5, p. 349, doi. 10.1002/xrs.724
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- Article
Speeding up of internal excitation calculations and application to x-ray analysis.
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- XRS: X-ray Spectrometry, 2004, v. 33, n. 5, p. 387, doi. 10.1002/xrs.773
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- Article
EPMA mapping method for small particles of Al.
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- XRS: X-ray Spectrometry, 2004, v. 33, n. 5, p. 321, doi. 10.1002/xrs.755
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- Article
Measurements of the surface ionization in multilayered specimens.
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- XRS: X-ray Spectrometry, 2004, v. 33, n. 5, p. 376, doi. 10.1002/xrs.757
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- Article
Planar waveguide-resonator: a new device for x-ray optics.
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- XRS: X-ray Spectrometry, 2004, v. 33, n. 5, p. 360, doi. 10.1002/xrs.735
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- Article
Study of the deterioration of sandstone due to acid rain and humid SO.
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- XRS: X-ray Spectrometry, 2004, v. 33, n. 5, p. 342, doi. 10.1002/xrs.723
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- Article
Monte Carlo calculation using a personal computer for electron probe microanalysis.
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- XRS: X-ray Spectrometry, 2004, v. 33, n. 5, p. 334, doi. 10.1002/xrs.669
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- Article
L x-ray fluorescence cross-sections of heavy elements in the atomic region 57 ≤ Z ≤ 71 excited by 17.78 keV photons.
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- XRS: X-ray Spectrometry, 2004, v. 33, n. 5, p. 372, doi. 10.1002/xrs.741
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- Article
EPMA and µ-SRXRF analysis and TEM-based microstructure characterization of a set of Roman glass fragments.
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- XRS: X-ray Spectrometry, 2004, v. 33, n. 5, p. 326, doi. 10.1002/xrs.734
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- Article