Works matching IS 00498246 AND DT 1991 AND VI 20 AND IP 6
Results: 19
Current work on total reflection x-ray fluorescence spectrometry at the GKSS research centre.
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- XRS: X-ray Spectrometry, 1991, v. 20, n. 6, p. 277, doi. 10.1002/xrs.1300200606
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- Article
Narrow-beam attenuation curve as a functional description of a low-energy x-ray beam.
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- XRS: X-ray Spectrometry, 1991, v. 20, n. 6, p. 343, doi. 10.1002/xrs.1300200617
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Masthead.
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- XRS: X-ray Spectrometry, 1991, v. 20, n. 6, p. fmi, doi. 10.1002/xrs.1300200601
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- Article
SHAPE: A computer simulation of energy-dispersive x-ray spectra.
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- XRS: X-ray Spectrometry, 1991, v. 20, n. 6, p. 315, doi. 10.1002/xrs.1300200612
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Current trends in the literature on x-ray emission spectrometry.
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- XRS: X-ray Spectrometry, 1991, v. 20, n. 6, p. 271, doi. 10.1002/xrs.1300200605
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- Article
Beam profile studies in an x-ray fluorescence spectrometer.
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- XRS: X-ray Spectrometry, 1991, v. 20, n. 6, p. 337, doi. 10.1002/xrs.1300200616
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- Article
Determination of trace elements in aluminium with synchrotron radiation-induced x-ray fluorescence.
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- XRS: X-ray Spectrometry, 1991, v. 20, n. 6, p. 293, doi. 10.1002/xrs.1300200609
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Comparison between two x-ray analysis software packages.
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- XRS: X-ray Spectrometry, 1991, v. 20, n. 6, p. 305, doi. 10.1002/xrs.1300200611
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Guest editorial.
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- XRS: X-ray Spectrometry, 1991, v. 20, n. 6, p. 269, doi. 10.1002/xrs.1300200604
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Comparison of highly oriented pyrolytic and ordinary graphite as polarizers of Mo Kα radiation in EDXRF.
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- XRS: X-ray Spectrometry, 1991, v. 20, n. 6, p. 331, doi. 10.1002/xrs.1300200615
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Multi-element trace analysis of rocks and soils by EDXRF using polarized radiation.
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- XRS: X-ray Spectrometry, 1991, v. 20, n. 6, p. 287, doi. 10.1002/xrs.1300200608
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Forthcoming meetings and events.
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- XRS: X-ray Spectrometry, 1991, v. 20, n. 6, p. 346, doi. 10.1002/xrs.1300200619
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- Article
Some applications of the fundamental parameter method in energy-dispersive x-ray fluorescence analysis by isotope excitation.
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- XRS: X-ray Spectrometry, 1991, v. 20, n. 6, p. 297, doi. 10.1002/xrs.1300200610
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Obituary.
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- XRS: X-ray Spectrometry, 1991, v. 20, n. 6, p. 267, doi. 10.1002/xrs.1300200603
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Polarization effects in a Si(Li) detector.
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- XRS: X-ray Spectrometry, 1991, v. 20, n. 6, p. 325, doi. 10.1002/xrs.1300200614
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PIXE and micro-PIXE studies of exogenous element distributions in animal organs.
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- XRS: X-ray Spectrometry, 1991, v. 20, n. 6, p. 283, doi. 10.1002/xrs.1300200607
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Announcements.
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- XRS: X-ray Spectrometry, 1991, v. 20, n. 6, p. 345, doi. 10.1002/xrs.1300200618
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- Article
From the editor.
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- XRS: X-ray Spectrometry, 1991, v. 20, n. 6, p. 265, doi. 10.1002/xrs.1300200602
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- Article
Sample area dependence in quantitative EDXRF analysis.
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- XRS: X-ray Spectrometry, 1991, v. 20, n. 6, p. 321, doi. 10.1002/xrs.1300200613
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- Article