Works matching IS 00498246 AND DT 1988 AND VI 17 AND IP 2
Results: 9
Absolute method for determination of metallic film thickness by X-ray fluorescence.
- Published in:
- XRS: X-ray Spectrometry, 1988, v. 17, n. 2, p. 43, doi. 10.1002/xrs.1300170203
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- Article
Comparison of fundamental parameters programs for quantitative X-ray fluoréscence spectrometry.
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- XRS: X-ray Spectrometry, 1988, v. 17, n. 2, p. 63, doi. 10.1002/xrs.1300170207
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- Article
Editorial.
- Published in:
- XRS: X-ray Spectrometry, 1988, v. 17, n. 2, p. 41, doi. 10.1002/xrs.1300170202
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- Article
Optimization and coupled absorption effects in diamond anvil energy-dispersive X-ray diffraction measurements.
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- XRS: X-ray Spectrometry, 1988, v. 17, n. 2, p. 55, doi. 10.1002/xrs.1300170206
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- Article
Masthead.
- Published in:
- XRS: X-ray Spectrometry, 1988, v. 17, n. 2, p. fmi, doi. 10.1002/xrs.1300170201
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- Article
Photon-excited K X-ray fluorescence cross-section measurements for some low- Z-elements.
- Published in:
- XRS: X-ray Spectrometry, 1988, v. 17, n. 2, p. 53, doi. 10.1002/xrs.1300170205
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- Article
Forthcoming meetings & events.
- Published in:
- XRS: X-ray Spectrometry, 1988, v. 17, n. 2, p. 81, doi. 10.1002/xrs.1300170209
- Publication type:
- Article
Deconvolution problems and information theory.
- Published in:
- XRS: X-ray Spectrometry, 1988, v. 17, n. 2, p. 47, doi. 10.1002/xrs.1300170204
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- Publication type:
- Article
Method for the determination of Mg and Si contents in aluminium alloys.
- Published in:
- XRS: X-ray Spectrometry, 1988, v. 17, n. 2, p. 75, doi. 10.1002/xrs.1300170208
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- Publication type:
- Article