Works matching IS 00498246 AND DT 1983 AND VI 12 AND IP 2
1
- XRS: X-ray Spectrometry, 1983, v. 12, n. 2, p. 82, doi. 10.1002/xrs.1300120208
- Article
2
- XRS: X-ray Spectrometry, 1983, v. 12, n. 2, p. vii, doi. 10.1002/xrs.1300120210
- Article
3
- XRS: X-ray Spectrometry, 1983, v. 12, n. 2, p. 52, doi. 10.1002/xrs.1300120203
- Article
4
- XRS: X-ray Spectrometry, 1983, v. 12, n. 2, p. 79, doi. 10.1002/xrs.1300120207
- Ponchon, J. L.;
- Bourrain, P.;
- Palsky, A.
- Article
5
- XRS: X-ray Spectrometry, 1983, v. 12, n. 2, p. 51, doi. 10.1002/xrs.1300120202
- Article
6
- XRS: X-ray Spectrometry, 1983, v. 12, n. 2, p. 72, doi. 10.1002/xrs.1300120206
- Wobrauschek, P.;
- Aiginger, H.
- Article
7
- XRS: X-ray Spectrometry, 1983, v. 12, n. 2, p. viii, doi. 10.1002/xrs.1300120213
- Article
8
- XRS: X-ray Spectrometry, 1983, v. 12, n. 2, p. fmi, doi. 10.1002/xrs.1300120201
- Article
9
- XRS: X-ray Spectrometry, 1983, v. 12, n. 2, p. vii, doi. 10.1002/xrs.1300120212
- Article
10
- XRS: X-ray Spectrometry, 1983, v. 12, n. 2, p. 67, doi. 10.1002/xrs.1300120205
- Shenberg, C.;
- Boazi, M.;
- Rapaport, M. S.
- Article
11
- XRS: X-ray Spectrometry, 1983, v. 12, n. 2, p. 87, doi. 10.1002/xrs.1300120209
- Huang, Chung-Hsi;
- Smith, T. E.
- Article
12
- XRS: X-ray Spectrometry, 1983, v. 12, n. 2, p. vii, doi. 10.1002/xrs.1300120211
- Article
13
- XRS: X-ray Spectrometry, 1983, v. 12, n. 2, p. 59, doi. 10.1002/xrs.1300120204
- Wicks, F. J.;
- Plant, A. G.
- Article