Results
Title

Surface Passivation for Reliable Measurement of Bulk Electronic Properties of Heterojunction Devices.

Authors

Bissig, Benjamin; Guerra‐Nunez, Carlos; Carron, Romain; Nishiwaki, Shiro; La Mattina, Fabio; Pianezzi, Fabian; Losio, Paolo A.; Avancini, Enrico; Reinhard, Patrick; Haass, Stefan G.; Lingg, Martina; Feurer, Thomas; Utke, Ivo; Buecheler, Stephan; Tiwari, Ayodhya N.

Publication

Small, 2016, Vol 12, Issue 38, p5339

ISSN

1613-6810

Publication type

Academic Journal

DOI

10.1002/smll.201601575