Works matching Transistor Technologies
1
- IEEJ Transactions on Electrical & Electronic Engineering, 2019, v. 14, n. 9, p. 1280, doi. 10.1002/tee.22979
- Tixier‐Mita, Agnès;
- Ihida, Satoshi;
- Blanchard, Damien;
- Shinohara, Marie;
- Eiler, Anne‐Claire;
- Cathcart, Grant Alexander;
- Faure, Pierre‐Marie;
- Kohno, Takashi;
- Sakai, Yasuyuki;
- Lévi, Timothée;
- Toshiyoshi, Hiroshi
- Article
2
- Journal of Integrated Circuits & Systems, 2021, v. 16, n. 2, p. 1, doi. 10.29292/jics.v16i2.208
- Mori, Carlos A. B.;
- Agopian, Paula G. D.;
- Martino, João A.
- Article
3
- IET Circuits, Devices & Systems (Wiley-Blackwell), 2020, v. 14, n. 7, p. 1077, doi. 10.1049/iet-cds.2019.0375
- Sharma, Trapti;
- Kumre, Laxmi
- Article
4
- Sensors (14248220), 2019, v. 19, n. 11, p. 2454, doi. 10.3390/s19112454
- Božanić, Mladen;
- Sinha, Saurabh
- Article
5
- Journal of Electrical & Computer Engineering, 2019, p. 1, doi. 10.1155/2019/4792461
- Angelov, George V.;
- Nikolov, Dimitar N.;
- Hristov, Marin H.
- Article
6
- Journal of Nano- & Electronic Physics, 2019, v. 11, n. 4, p. 1, doi. 10.21272/jnep.11(4).04022
- Hatefinasab, Seyedehsomayeh
- Article
7
- Technical Transactions / Czasopismo Techniczne, 2016, v. 1-M, n. 2, p. 33, doi. 10.4467/2353737XCT.16.027.5289
- CZUCHRA, WOJCIECH;
- MYSIŃSKI, WOJCIECH;
- WOSZCZYNA, BARTOSZ
- Article
8
- Journal of Electronic Testing, 2011, v. 27, n. 2, p. 193, doi. 10.1007/s10836-011-5195-x
- Cheng, Chi-Hsuan;
- Li, James
- Article
9
- Scientific Reports, 2021, v. 11, n. 1, p. 1, doi. 10.1038/s41598-021-01917-9
- Liu, Yang;
- Lv, Yuanjie;
- Guo, Shuoshuo;
- Luan, Zhengfang;
- Cheng, Aijie;
- Lin, Zhaojun;
- Yang, Yongxiong;
- Jiang, Guangyuan;
- Zhou, Yan
- Article
10
- Semiconductors, 2010, v. 44, n. 13, p. 1669, doi. 10.1134/S1063782610130105
- Kuznetsov, E.;
- Shemyakin, A.
- Article
11
- Physica Status Solidi. A: Applications & Materials Science, 2021, v. 218, n. 18, p. 1, doi. 10.1002/pssa.202100290
- Alim, Mohammad A.;
- Naima, Jannatul;
- Rezazadeh, Ali A.
- Article
12
- Electronics & Electrical Engineering, 2009, n. 89, p. 39
- Pereira, M. C.;
- Martins, M. J.;
- Bonnaud, O.
- Article
13
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 3, p. 194, doi. 10.1049/el.2016.3882
- Yoon, D.;
- Seo, M.-G.;
- Song, K.;
- Kaynak, M.;
- Tillack, B.;
- Rieh, J.-S.
- Article
14
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 3, p. 194, doi. 10.1049/el.2016.3882
- Yoon, D.;
- Seo, M.‐G.;
- Song, K.;
- Kaynak, M.;
- Tillack, B.;
- Rieh, J.‐S.
- Article
15
- Chinese Journal of Liquid Crystal & Displays, 2021, v. 36, n. 2, p. 1, doi. 10.37188/CJLCD.2020-0268
- Article
16
- IET Circuits, Devices & Systems (Wiley-Blackwell), 2022, v. 16, n. 4, p. 360, doi. 10.1049/cds2.12112
- Mahmoodian, Hamid;
- Dolatshahi, Mehdi;
- Zanjani, S. Mohammadali;
- Honarvar, Mohammad Amin
- Article
17
- Advanced Materials Interfaces, 2022, v. 9, n. 6, p. 1, doi. 10.1002/admi.202102039
- Marks, Adam;
- Griggs, Sophie;
- Gasparini, Nicola;
- Moser, Maximilian
- Article
18
- Biosensors (2079-6374), 2023, v. 13, n. 8, p. 765, doi. 10.3390/bios13080765
- Wu, Weidong;
- Biyani, Manish;
- Hirose, Daisuke;
- Takamura, Yuzuru
- Article
19
- Telkomnika, 2020, v. 18, n. 5, p. 2597, doi. 10.12928/TELKOMNIKA.v18i5.12121
- Hashim, Yasir;
- Nazmus Shakib, Mohammed
- Article
20
- Advanced Electronic Materials, 2023, v. 9, n. 6, p. 1, doi. 10.1002/aelm.202201259
- Fuchsberger, Andreas;
- Wind, Lukas;
- Sistani, Masiar;
- Behrle, Raphael;
- Nazzari, Daniele;
- Aberl, Johannes;
- Prado Navarrete, Enrique;
- Vukŭsić, Lada;
- Brehm, Moritz;
- Schweizer, Peter;
- Vogl, Lilian;
- Maeder, Xavier;
- Weber, Walter M.
- Article
21
- International Journal of Circuit Theory & Applications, 2024, v. 52, n. 10, p. 5403, doi. 10.1002/cta.4022
- Khurshid, Tabassum;
- Singh, Vikram
- Article
22
- Lasers in Medical Science, 2024, v. 39, n. 1, p. 1, doi. 10.1007/s10103-024-04155-3
- Sun, Jie;
- Sherryn, Sherryn;
- Tong, Zhen;
- Xia, Shengqiang;
- Chen, Bin
- Article
23
- Journal of Nano- & Electronic Physics, 2019, v. 11, n. 4, p. 1, doi. 10.21272/jnep.11(4).04021
- Hebali, M.;
- Bennaoum, M.;
- Benzohra, M.;
- Chalabi, D.;
- Saïdane, A.
- Article
24
- Microwave Journal, 2010, v. 53, n. 4, p. 184
- Azam, S.;
- Svenson, C.;
- Wahab, Q.;
- Jonsson, R.
- Article
25
- Advanced Electronic Materials, 2019, v. 5, n. 8, p. N.PAG, doi. 10.1002/aelm.201970043
- Dai, Mingzhi;
- Yang, Wenwei;
- Li, Ming;
- Zhang, Lei;
- Huo, Changhe;
- Dong, Yemin;
- Webster, Thomas J.
- Article
26
- Advanced Electronic Materials, 2019, v. 5, n. 8, p. N.PAG, doi. 10.1002/aelm.201900262
- Dai, Mingzhi;
- Yang, Wenwei;
- Li, Ming;
- Zhang, Lei;
- Huo, Changhe;
- Dong, Yemin;
- Webster, Thomas J.
- Article
27
- SID Symposium Digest of Technical Papers, 2024, v. 55, n. 1, p. 1475, doi. 10.1002/sdtp.17831
- Zhou, Zhichao;
- Zhu, Yiyi;
- Zhou, Xiaoliang;
- Qiao, Lei;
- Liu, Zhongjie;
- Tan, Zhiwei
- Article
28
- SID Symposium Digest of Technical Papers, 2024, v. 55, n. 1, p. 689, doi. 10.1002/sdtp.17618
- Shi, Runxiao;
- Hu, Yushen;
- Xie, Xinying;
- Wong, Man
- Article
29
- SID Symposium Digest of Technical Papers, 2024, v. 55, n. 1, p. 29, doi. 10.1002/sdtp.17445
- Kim, Keunwoo;
- Thanh, Tien Nguyen;
- Sung, Bummo;
- Shin, Jiyeong;
- Lee, Dokyeong;
- Jang, Keunho;
- Lee, Changhee
- Article
30
- SID Symposium Digest of Technical Papers, 2023, v. 54, n. 1, p. 684, doi. 10.1002/sdtp.16651
- Cho, An-Thung;
- Dong, Hao;
- Wei, Chao;
- Yang, Feng-yun;
- Li, Wen-xin;
- Wang, Ming-liang;
- Hsu, James;
- Chen, Wade
- Article
31
- SID Symposium Digest of Technical Papers, 2023, v. 54, n. 1, p. 576, doi. 10.1002/sdtp.16623
- Kim, Keunwoo;
- Sung, Bummo;
- Kim, Doona;
- Kim, Sangsub;
- Kim, Hanbit;
- Shin, Jiyeong;
- Kwak, Hyena;
- Lee, Dokyeong;
- Seol, Chanyoub;
- Choi, Sanggun;
- Lim, Jun Hyung;
- Kang, Taewook;
- Lee, Changhee
- Article
32
- SID Symposium Digest of Technical Papers, 2022, v. 53, p. 149, doi. 10.1002/sdtp.15876
- Vasilyeva, Svetlana;
- Chen, Xiao;
- Rinzler, Andrew;
- Lemaitre, Max;
- Liu, Bo
- Article
33
- SID Symposium Digest of Technical Papers, 2021, v. 52, p. 202, doi. 10.1002/sdtp.15066
- Shi, Runxiao;
- Lei, Tengteng;
- Wang, Sisi;
- Xia, Zhihe;
- Wong, Man
- Article
34
- SID Symposium Digest of Technical Papers, 2021, v. 52, p. 51, doi. 10.1002/sdtp.15017
- Chen, Kaiqi;
- Zhou, Zhichao;
- Xia, Zhihe;
- Wong, Man
- Article
35
- SID Symposium Digest of Technical Papers, 2018, v. 49, n. 1, p. 1024, doi. 10.1002/sdtp.12195
- Cho, An-Thung;
- Liu, Zhen;
- Liu, Kai-jun;
- Yang, Feng-yun;
- Mo, Qiong-hua;
- Hsu, James;
- Chen, Wade;
- Lu, York
- Article
36
- SID Symposium Digest of Technical Papers, 2018, v. 49, n. 1, p. 1256, doi. 10.1002/sdtp.12139
- Li, Jiapeng;
- Lu, Lei;
- Xia, Zhihe;
- Wang, Sisi;
- Feng, Zhuoqun;
- Kwok, Hoi-Sing;
- Wong, Man
- Article
37
- SID Symposium Digest of Technical Papers, 2018, v. 49, p. 75, doi. 10.1002/sdtp.12644
- Lu, Lei;
- Li, Jiapeng;
- Xia, Zhihe;
- Wang, Sisi;
- Kwok, Hoi Sing;
- Wong, Man
- Article
38
- SID Symposium Digest of Technical Papers, 2017, v. 48, n. 1, p. 173, doi. 10.1002/sdtp.11614
- Liu, Kuan-Hsien;
- Chen, Wei-Han;
- Tsai, Chia-Hung;
- Wu, An-Ju;
- Hsu, Shih-Hua;
- Tu, Chun-Hao;
- Liu, Chu-Yu;
- Chiang, Ming-Feng;
- Lin, Yu-Chieh
- Article
39
- SID Symposium Digest of Technical Papers, 2017, v. 48, n. 1, p. 505, doi. 10.1002/sdtp.11675
- Nejim, Ahmed;
- Mijalkovic, Slobodan;
- Binder, Thomas;
- Kelly, Sean
- Article
40
- Progress in Electromagnetics Research M, 2023, v. 120, p. 167, doi. 10.2528/pierm23080706
- Shuxia Yan;
- Yuxing Li;
- Chenglin Li;
- Fengqi Qian;
- Xu Wang;
- Wenyuan Liu
- Article
41
- Opto-Electronics Review, 2018, v. 26, n. 4, p. 261, doi. 10.1016/j.opelre.2018.08.002
- Marczewski, J.;
- Coquillat, D.;
- Knap, W.;
- Kolacinski, C.;
- Kopyt, P.;
- Kucharski, K.;
- Lusakowski, J.;
- Obrebski, D.;
- Tomaszewski, D.;
- Yavorskiy, D.;
- Zagrajek, P.;
- Ryniec, R.;
- Palka, N.
- Article
42
- International Journal of Mechatronics & Applied Mechanics, 2024, n. 16, p. 185
- Ramezani, Ghazaleh;
- Stiharu, Ion;
- van de Ven, Theo G. M.;
- Nerguizian, Vahe
- Article
43
- Intel Technology Journal, 2002, v. 6, n. 2, p. 5
- Thompson, Scott;
- Alavi, Mohsen;
- Hussein, Makarem;
- Jacob, Pauline;
- Kenyon, Chris;
- Moon, Peter;
- Prince, Matthew;
- Sivakumar, Sam;
- Tyagi, Sunit;
- Bohr, Mark
- Article
44
- Applied Computational Electromagnetics Society Journal, 2015, v. 30, n. 8, p. 915
- Seifi, Z.;
- Abdipour, A.;
- Mirzavand, R.
- Article
45
- Business History Review, 2006, v. 80, n. 4, p. 657, doi. 10.2307/25097265
- Davids, Mila;
- Verbong, Geert
- Article
46
- Journal of Electronic Materials, 2022, v. 51, n. 10, p. 5617, doi. 10.1007/s11664-022-09834-x
- Qasrawi, A. F.;
- Daragme, Rana B.
- Article
47
- Informacije MIDEM: Journal of Microelectronics, Electronic Components & Materials, 2020, v. 50, n. 4, p. 233, doi. 10.33180/InfMIDEM2020.401
- Mamatov, Islombek;
- Özçelep, Yasin;
- Kaçar, Firat
- Article
48
- IETE Technical Review, 2010, v. 27, n. 6, p. 446, doi. 10.4103/0256-4602.72582
- Subramanian, Vaidyanathan
- Article
49
- Physica Status Solidi. A: Applications & Materials Science, 2025, v. 222, n. 3, p. 1, doi. 10.1002/pssa.202400592
- Yazdani, Hossein;
- Beleniotis, Petros;
- Brunner, Frank;
- Ostermay, Ina;
- Würfl, Joachim;
- Rudolph, Matthias;
- Heinrich, Wolfgang;
- Hilt, Oliver
- Article
50
- Physica Status Solidi. A: Applications & Materials Science, 2024, v. 221, n. 21, p. 1, doi. 10.1002/pssa.202300953
- Li, Hanchao;
- Xie, Hanlin;
- Wang, Yue;
- Yulia, Lekina;
- Ranjan, Kumud;
- Singh, Navab;
- Chung, Surasit;
- Lee, Kenneth E.;
- Arulkumaran, Subramaniam;
- Ing Ng, Geok
- Article