Works matching DE "ELECTRIC potential measurement"
1
- Sensors (14248220), 2025, v. 25, n. 10, p. 3118, doi. 10.3390/s25103118
- Peng, Haojie;
- Liu, Hongwei;
- Shang, Kuo;
- Li, Gaoyue;
- Zhao, Liping
- Article
2
- Symmetry (20738994), 2025, v. 17, n. 5, p. 712, doi. 10.3390/sym17050712
- Article
3
- Energies (19961073), 2025, v. 18, n. 10, p. 2551, doi. 10.3390/en18102551
- He, Guorun;
- Liang, Dong;
- Zhao, Yuezi;
- Wang, Xiaoxue
- Article
4
- Surface Engineering, 2019, v. 35, n. 7, p. 573, doi. 10.1080/02670844.2018.1542054
- Article
5
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 2301, doi. 10.1007/s10854-017-8146-1
- Yuan, Yafei;
- Cao, Xinran;
- Sun, Yan;
- Su, Jing;
- Liu, Chunmin;
- Cheng, Ling;
- Li, Yaopeng;
- Yuan, Lihua;
- Zhang, Hao;
- Li, Jing
- Article
6
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 3, p. 2846, doi. 10.1007/s10854-015-4100-2
- Sohila, Subramaniam;
- Rajendran, Ramesh;
- Yaakob, Zahira;
- Teridi, Mohd;
- Sopian, Kamaruzzaman
- Article
7
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 1, p. 118, doi. 10.1007/s10854-015-3726-4
- Gholamrezaei, Sousan;
- Salavati Niasari, Masoud;
- Dadkhah, Mahnaz;
- Sarkhosh, Bijan
- Article
8
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 10, p. 3856, doi. 10.1007/s10854-013-1329-5
- Chougule, P.;
- Kolekar, Y.;
- Bhosale, C.
- Article
9
- PAMM: Proceedings in Applied Mathematics & Mechanics, 2013, v. 13, n. 1, p. 497, doi. 10.1002/pamm.201310241
- Dreyer, Wolfgang;
- Guhlke, Clemens;
- Müller, Rüdiger
- Article
10
- Journal of Solid State Electrochemistry, 2015, v. 19, n. 9, p. 2803, doi. 10.1007/s10008-015-2855-2
- Martemianov, S.;
- Adiutantov, N.;
- Evdokimov, Yu.;
- Madier, L.;
- Maillard, F.;
- Thomas, A.
- Article
11
- Journal of Solid State Electrochemistry, 2013, v. 17, n. 11, p. 2833, doi. 10.1007/s10008-013-2187-z
- Choi, Sung;
- Lee, Jong-Heun;
- Ji, Ho;
- Yoon, Kyung;
- Son, Ji-Won;
- Kim, Byung-Kook;
- Je, Hae;
- Lee, Hae-Weon;
- Lee, Jong-Ho
- Article
12
- Russian Journal of Nondestructive Testing, 2022, v. 58, n. 11, p. 1026, doi. 10.1134/S1061830922600708
- Velev, B. G.;
- Kamenov, V. V.
- Article
13
- Russian Journal of Nondestructive Testing, 2014, v. 50, n. 7, p. 385, doi. 10.1134/S1061830914070067
- Konovalov, S.;
- Kuz'menko, A.
- Article
14
- Russian Journal of Nondestructive Testing, 2013, v. 49, n. 12, p. 735, doi. 10.1134/S106183091312005X
- Mel'kanovich, A.;
- Konovalov, S.
- Article
15
- Measurement Techniques, 2024, v. 67, n. 7, p. 564, doi. 10.1007/s11018-024-02377-z
- Vasilev, Yu. A.;
- Akhmedzyanova, M. R.;
- Zelikman, M. I.;
- Kruchinin, S. A.
- Article
16
- Measurement Techniques, 2023, v. 66, n. 7, p. 447, doi. 10.1007/s11018-023-02246-1
- Katkov, A. S.;
- Shevtsov, V. I.;
- Gromova, Ju. A.
- Article
17
- Measurement Techniques, 2014, v. 57, n. 8, p. 855, doi. 10.1007/s11018-014-0548-3
- Troyan, V.;
- Borisyuk, P.;
- Vasil'ev, O.;
- Krasavin, A.;
- Florentsev, V.
- Article
18
- Measurement Techniques, 2013, v. 56, n. 5, p. 570, doi. 10.1007/s11018-013-0246-6
- Katkov, A. S.;
- Chernyaev, P. A.
- Article
19
- Measurement Techniques, 2012, v. 55, n. 2, p. 167, doi. 10.1007/s11018-012-9935-9
- Article
20
- Automation & Remote Control, 2012, v. 73, n. 3, p. 561, doi. 10.1134/S0005117912030137
- Bumagin, A.;
- Rutkevich, A.;
- Sakharov, K.;
- Steshenko, V.;
- Shishkin, G.
- Article
21
- Chips, 2022, v. 1, n. 3, p. 218, doi. 10.3390/chips1030015
- Li, Junyao;
- Chan, Pak Kwong
- Article
22
- Chips, 2022, v. 1, n. 2, p. 72, doi. 10.3390/chips1020007
- Ballo, Andrea;
- Grasso, Alfio Dario;
- Palumbo, Gaetano
- Article
23
- Electrochem, 2024, v. 5, n. 2, p. 162, doi. 10.3390/electrochem5020011
- Dijoux, Etienne;
- Damour, Cédric;
- Alicalapa, Frédéric;
- Aubier, Alexandre;
- Benne, Michel
- Article
24
- Electrochem, 2023, v. 4, n. 3, p. 350, doi. 10.3390/electrochem4030023
- Article
25
- EMERG: Energy. Environment. Efficiency. Resources. Globalization, 2021, v. 7, n. 3, p. 52
- CALININ, Lev;
- ZAITEV, Dmitrii;
- TIRSU, Mihai;
- GOLUB, Irina;
- KALOSHIN, Danila
- Article
26
- Separations (2297-8739), 2022, v. 9, n. 2, p. N.PAG, doi. 10.3390/separations9020025
- El Deeb, Sami;
- Ibrahim, Adel Ehab;
- Al-Harrasi, Ahmed;
- Wolber, Gerhard;
- Gust, Ronald
- Article
27
- Experimental Technology & Management, 2023, v. 40, n. 1, p. 101, doi. 10.16791/j.cnki.sjg.2023.01.016
- Article
28
- International Journal of Energy Research, 2022, v. 46, n. 12, p. 17096, doi. 10.1002/er.8373
- Shi, Haotian;
- Wang, Shunli;
- Fernandez, Carlos;
- Huang, Junhan;
- Xu, Wenhua;
- Wang, Liping
- Article
29
- International Journal of Energy Research, 2022, v. 46, n. 11, p. 15948, doi. 10.1002/er.8293
- Zhou, Hao;
- Wu, Hang;
- Han, Xuebing;
- Zheng, Yuejiu;
- Yan, Liqin;
- Lv, Taolin;
- Xie, Jingying
- Article
30
- International Journal of Energy Research, 2020, v. 44, n. 3, p. 2337, doi. 10.1002/er.5083
- Li, Xinzhou;
- Zhang, Lizhong;
- Liu, Yi;
- Pan, Aiqiang;
- Liao, Qiangqiang;
- Yang, Xiu
- Article
31
- Mugla Journal of Science & Technology, 2024, v. 10, n. 2, p. 13, doi. 10.22531/muglajsci.1517897
- Article
32
- Advanced Electronic Materials, 2022, v. 8, n. 11, p. 1, doi. 10.1002/aelm.202200514
- Tang, Aihua;
- Xu, Teng;
- Liu, Shengsheng;
- Liang, Yuhan;
- Chen, Hetian;
- Yan, Dayu;
- Shi, Youguo;
- Yu, Pu;
- Yu, Rong;
- Lin, Yuanhua;
- Nan, Tianxiang;
- Jiang, Wanjun;
- Yi, Di
- Article
33
- Advanced Electronic Materials, 2022, v. 8, n. 3, p. 1, doi. 10.1002/aelm.202100772
- Bai, Hao;
- Xu, Teng;
- Dong, Yiqing;
- Zhou, Heng‐An;
- Jiang, Wanjun
- Article
34
- Advanced Electronic Materials, 2020, v. 6, n. 3, p. 1, doi. 10.1002/aelm.201901340
- Pan, Zhenyu;
- Zhu, Zheng;
- Wilcox, Jonathon;
- Urban, Jeffrey J.;
- Yang, Fan;
- Wang, Heng
- Article
35
- Lighting Research & Technology, 2016, v. 48, n. 6, p. 771, doi. 10.1177/1477153515575585
- Pan, Y.;
- Lin, J.;
- Su, S.;
- Shih, T-M
- Article
36
- Building Services Engineering Research & Technology, 2017, v. 38, n. 4, p. 436, doi. 10.1177/0143624417690192
- So, Albert;
- Chan, Wai L.;
- Tsang, Steve K. M.
- Article
37
- AIMS Energy, 2025, v. 13, n. 2, p. 1, doi. 10.3934/energy.2025010
- Zhou, Weiji;
- Lin, Jun;
- Long, Zekun;
- Liu, Feifei;
- He, Mingfei
- Article
38
- AIMS Energy, 2017, v. 5, n. 3, p. 482, doi. 10.3934/energy.2017.3.482
- Ryuto Shigenobu;
- Oludamilare Bode Adewuyi;
- Atsushi Yona;
- Tomonobu Senjyu
- Article
39
- Photonics, 2024, v. 11, n. 9, p. 880, doi. 10.3390/photonics11090880
- Lago, Nicolò;
- Moretti, Francesco;
- Tormena, Noah;
- Caria, Alessandro;
- Buffolo, Matteo;
- De Santi, Carlo;
- Trivellin, Nicola;
- Cester, Andrea;
- Meneghesso, Gaudenzio;
- Zanoni, Enrico;
- Meneghini, Matteo;
- Matteocci, Fabio;
- Barichello, Jessica;
- Vesce, Luigi;
- Di Carlo, Aldo;
- Quartiani, Federico
- Article
40
- Telecommunication Engineering, 2023, v. 63, n. 1, p. 131, doi. 10.20079/j.issn.1001-893x.211014001
- Article
41
- SID Symposium Digest of Technical Papers, 2014, v. 45, n. 1, p. 1039, doi. 10.1002/j.2168-0159.2014.tb00270.x
- Lin, Chih‐Lung;
- Du, Yuan‐Wei;
- Cheng, Mao‐Hsun;
- Chen, Yuan‐Chih;
- Tu, Chun‐Da
- Article
42
- SID Symposium Digest of Technical Papers, 2012, v. 43, n. 1, p. 452, doi. 10.1002/j.2168-0159.2012.tb05814.x
- Andreev, Alexander L.;
- Andreeva, Tatiana B.;
- Kompanets, Igor N.
- Article
43
- SID Symposium Digest of Technical Papers, 2012, v. 43, n. 1, p. 434, doi. 10.1002/j.2168-0159.2012.tb05809.x
- Pflumm, Christof;
- Kaiser, Joachim;
- Kröber, Jonas;
- Voges, Frank;
- Jatsch, Anja;
- Parham, Amir;
- Böhm, Edgar;
- Eberle, Thomas;
- Büsing, Arne;
- Heil, Holger;
- Stößel, Philipp;
- Mujica, Teresa
- Article
44
- SID Symposium Digest of Technical Papers, 2012, v. 43, n. 1, p. 449, doi. 10.1002/j.2168-0159.2012.tb05813.x
- Guo, Qi;
- Pozhidaev, Eugene P.;
- Srivastava, Abhishek K.;
- Ma, Ying;
- Wang, Xiaoqian;
- Chigrinov, Vladimir G.;
- Kwok, Hoi Sing
- Article
45
- SID Symposium Digest of Technical Papers, 2012, v. 43, n. 1, p. 1442, doi. 10.1002/j.2168-0159.2012.tb06080.x
- Chen, Kuan-Ting;
- Chao, Yu-Ju;
- Lai, Chun-Chun;
- Liu, Po-Wen;
- Tsai, Yi-Shou;
- Lu, Jhih-Ping;
- Hsu, Chien-Chih;
- Lee, Huei-Lun;
- Lin, Shu-Hua
- Article
46
- Nanomaterials (2079-4991), 2013, v. 3, n. 2, p. 229, doi. 10.3390/nano3020229
- Mohsin, Kaji Muhammad;
- Ashok Srivastava;
- Sharma, Ashwani K.;
- Mayberry, Clay
- Article
47
- Communications on Pure & Applied Analysis, 2021, v. 20, n. 11, p. 4025, doi. 10.3934/cpaa.2021142
- Moradifam, Amir;
- Lopez, Robert
- Article
48
- Transactions of the Institute of Measurement & Control, 2020, v. 42, n. 6, p. 1239, doi. 10.1177/0142331219884804
- Mehdi, Muhammad;
- Saad, Muhammad;
- Jamali, Saeed Zaman;
- Kim, Chul-Hwan
- Article
49
- Transactions of the Institute of Measurement & Control, 2019, v. 41, n. 14, p. 4035, doi. 10.1177/0142331219845037
- Li, Xiuyan;
- Zhou, Yong;
- Wang, Jianming;
- Wang, Qi;
- Lu, Yang;
- Duan, Xiaojie;
- Sun, Yukuan;
- Zhang, Jingwan;
- Liu, Zongyu
- Article
50
- Transactions of the Institute of Measurement & Control, 2019, v. 41, n. 10, p. 2803, doi. 10.1177/0142331218812563
- Wang, Qi;
- He, Jing;
- Wang, Jianming;
- Li, Xiuyan;
- Duan, Xiaojie;
- Zhang, Pengcheng;
- Chen, Xiaojing;
- Sun, Yukuan
- Article