Works matching DE "METAL inclusions"


Results: 1294
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    Characterization deep boron diffused p silicon layer.

    Published in:
    Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 8, p. 1569, doi. 10.1007/s10854-012-0630-z
    By:
    • Dutta, Shankar;
    • Pandey, Akhilesh;
    • Saxena, G.;
    • Raman, R.;
    • Dhaul, A.;
    • Pal, Ramjay;
    • Chatterjee, Ratnamala
    Publication type:
    Article
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    Impurity tin atoms in glassy AsS and AsSe.

    Published in:
    Inorganic Materials, 2014, v. 50, n. 11, p. 1162, doi. 10.1134/S0020168514110028
    By:
    • Bordovsky, G.;
    • Marchenko, A.;
    • Seregin, P.;
    • Bobokhuzhaev, K.
    Publication type:
    Article
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    ICP-AES analysis of high-purity silicon.

    Published in:
    Inorganic Materials, 2013, v. 49, n. 14, p. 1283, doi. 10.1134/S0020168513140082
    By:
    • Shaverina, A.;
    • Tsygankova, A.;
    • Shelpakova, I.;
    • Saprykin, A.
    Publication type:
    Article
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    Preparation of extrapure potassium nitrate.

    Published in:
    Inorganic Materials, 2012, v. 48, n. 8, p. 836, doi. 10.1134/S0020168512070138
    By:
    • Polishchuk, O.;
    • Fakeev, A.;
    • Krasil'shchik, V.;
    • Vendilo, A.
    Publication type:
    Article
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