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Title

Scanning probe microscopy and spectroscopy of graphene on metals.

Authors

Dedkov, Yuriy; Voloshina, Elena; Fonin, Mikhail

Abstract

Graphene, a two-dimensional (2D) material with unique electronic properties, appears to be an ideal object for the application of surface-science methods. Among them, a family of scanning probe microscopy methods (STM, AFM, KPFM) and the corresponding spectroscopy add-ons provide information about the structure and electronic properties of graphene on the local scale (from

Subjects

SCANNING probe microscopy; ELECTRIC properties of graphene; SPECTRUM analysis; SOLID state physics; SURFACES (Physics)

Publication

Physica Status Solidi (B), 2015, Vol 252, Issue 3, p451

ISSN

0370-1972

Publication type

Academic Journal

DOI

10.1002/pssb.201451466