Works matching DE "ELLIPSOMETRY"

Results: 993

Effect of Ionic Strength and Layer Number on Swelling of Polyelectrolyte Multilayers in Water Vapour.

Published in:

Soft Materials, 2013, v. 11, n. 2, p. 157, doi. 10.1080/1539445X.2011.607203

By:

Dodoo, Samuel;
Balzer, BizanN.;
Hugel, Thorsten;
Laschewsky, André;
Klitzing, Reginevon

Publication type:

Article

Photochromic Polymer and Hybrid Materials Containing Azo Methylisoxazole Dye.

Published in:

Soft Materials, 2011, v. 9, n. 4, p. 335, doi. 10.1080/1539445X.2010.525434

By:

Ortyl, Ewelina;
Jaworowska, Jolanta;
Tajalli Seifi, Payman;
Barille, Regis;
Kucharski, Stanisław

Publication type:

Article

Characterizing resists and films with VUV spectroscopic ellipsometry.

Published in:

Solid State Technology, 2001, v. 44, n. 7, p. 165

By:

Boher, Pierre;
Evrard, Patrick;
Piel, Jean Philippe;
Defranoux, Christophe;
Stehle, Jean Louis

Publication type:

Article

Successful ellipsometry at 157nm.

Published in:

Solid State Technology, 2000, v. 43, n. 5, p. 36

By:

Burggraaf, Pieter

Publication type:

Article

Meeting the challenges of thin ONO measurement.

Published in:

Solid State Technology, 1999, v. 42, n. 9, p. S9

By:

Ying, Jin;
Sin, Chiew

Publication type:

Article

A novel pretreatment for thin-film measurements.

Published in:

Solid State Technology, 1999, v. 42, n. 9, p. 83

By:

Danel, Adrien;
Tardif, Francois

Publication type:

Article

Spectroscopic ellipsometry for polymer thin films.

Published in:

Solid State Technology, 1998, v. 41, n. 10, p. 101

By:

Hilfiker, James N.;
Synowicki, Ron A.

Publication type:

Article

Composition-sensitive growth kinetics and dispersive optical properties of thin HfxTi1−xO2 (0 ≤ x ≤ 1) films prepared by the ALD method.

Published in:

Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 1, p. 812, doi. 10.1007/s10854-018-0351-z

By:

Atuchin, V. V.;
Lebedev, M. S.;
Korolkov, I. V.;
Kruchinin, V. N.;
Maksimovskii, E. A.;
Trubin, S. V.

Publication type:

Article

Oxidation mode on charge transfer mechanism in formation of Mn-Co-Ni-O spinel films by RF sputtering.

Published in:

Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 18, p. 13659, doi. 10.1007/s10854-017-7208-8

By:

Shi, Qin;
Ren, Wei;
Kong, Wenwen;
Wang, Lei;
Ma, Chao;
Xu, Jinbao;
Chang, Aimin;
Jiang, Chunqi

Publication type:

Article

Evolution of nanostructure in hydrogenated amorphous silicon thin films with substrate temperature studied by Raman mapping, Raman scattering and spectroscopic ellipsometry.

Published in:

Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 12, p. 8885, doi. 10.1007/s10854-017-6618-y

By:

Madaka, Ramakrishna;
Kanneboina, Venkanna;
Agarwal, Pratima

Publication type:

Article

Optoelectronic and photocatalytic properties of in situ platinum-doped TiO films deposited by means of pulsed laser ablation technique.

Published in:

Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 4, p. 3317, doi. 10.1007/s10854-016-5925-z

By:

Trabelsi, K.;
Hajjaji, A.;
Ka, I.;
Gaidi, M.;
Bessais, B.;
El Khakani, M.

Publication type:

Article

Optical and electrical properties of synthesized reactive rf sputter deposited boron-rich and boron-doped diamond-like carbon thin films.

Published in:

Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 2, p. 1695, doi. 10.1007/s10854-016-5715-7

By:

Ahmad, A.

Publication type:

Article

Structural, morphological and spectroscopic ellipsometry studies on sputter deposited SbS thin films.

Published in:

Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 9, p. 9710, doi. 10.1007/s10854-016-5033-0

By:

Medina-Montes, M.;
Montiel-González, Z.;
Paraguay-Delgado, F.;
Mathews, N.;
Mathew, X.

Publication type:

Article

Transparent conductive ZnO thin films grown by chemical spray pyrolysis: the effect of Mg.

Published in:

Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 8, p. 8478, doi. 10.1007/s10854-016-4862-1

By:

Kurtaran, S.;
Aldag, S.;
Ofofoglu, G.;
Akyuz, I.;
Atay, F.

Publication type:

Article

Borosilicate glass nanolayer as a spin-on dopant source: FTIR and spectroscopic ellipsometry investigations.

Published in:

Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 6, p. 6292, doi. 10.1007/s10854-016-4561-y

By:

Perova, T.;
Nolan-Jones, M.;
McGilp, J.;
Gamble, H.

Publication type:

Article

Assessment of refractive index changes by spectral reflectance in the first stages of AlGaN layer growth using SiN treatment.

Published in:

Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 6, p. 6336, doi. 10.1007/s10854-016-4568-4

By:

Benzarti, Z.;
Khelifi, M.;
Khalfallah, A.;
El Jani, B.

Publication type:

Article

Effect of substrate temperature and post-deposition annealing on intrinsic a-SiO:H film for n-Cz-Si wafer passivation.

Published in:

Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 5, p. 4659, doi. 10.1007/s10854-016-4344-5

By:

He, Yuping;
Huang, Haibin;
Zhou, Lang;
Yue, Zhihao;
Yuan, Jiren

Publication type:

Article

Enhancement in the physical properties of spray deposited nanostructured ternary PbMgS thin films towards optoelectronic applications.

Published in:

Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 5, p. 5070, doi. 10.1007/s10854-016-4396-6

By:

Rajashree, C.;
Balu, A.;
Nagarethinam, V.

Publication type:

Article

Lutentium incorporation influence on ZnO thin films coated via a sol-gel route: spin coating technique.

Published in:

Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 5, p. 5089, doi. 10.1007/s10854-016-4399-3

By:

Turgut, G.;
Duman, S.;
Ozcelik, F.;
Gurbulak, B.;
Doğan, S.

Publication type:

Article

Structural modification and piezoelectric properties in BiNaTiO-BaTiO-SrTiO thin films.

Published in:

Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 1, p. 215, doi. 10.1007/s10854-015-3740-6

By:

Li, Wei;
Li, Peng;
Zeng, Huarong;
Hao, Jigong;
Yue, Zhenxing;
Zhai, Jiwei

Publication type:

Article

Optical properties of ZnS/Ag/ZnS transparent conductive sandwich structures investigated by spectroscopic ellipsometry.

Published in:

Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 6, p. 4085, doi. 10.1007/s10854-015-2948-9

By:

Zolanvari, A.;
Norouzi, R.;
Sadeghi, H.

Publication type:

Article

Effect of Cr doping on the structure, optical and magnetic properties of multiferroic BiFeO thin films.

Published in:

Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 6, p. 1215, doi. 10.1007/s10854-011-0575-7

By:

Deng, Huan;
Deng, Hongmei;
Yang, Pingxiong;
Chu, Junhao

Publication type:

Article

Optical, structural and surface characterization of CdO:Mg films.

Published in:

Journal of Materials Science: Materials in Electronics, 2011, v. 22, n. 5, p. 492, doi. 10.1007/s10854-010-0166-z

By:

Atay, F.;
Akyuz, I.;
Kose, S.;
Ketenci, E.;
Bilgin, V.

Publication type:

Article

Spectroscopic ellipsometry study of plasma-polymerised vinyltriethoxysilane films.

Published in:

Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 451, doi. 10.1007/s10854-008-9668-3

By:

Mistrik, J.;
Cechalova, B.;
Studynka, J.;
Cech, V.

Publication type:

Article

Spectroscopic ellipsometry study of In2O3 thin films.

Published in:

Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 71, doi. 10.1007/s10854-007-9447-6

By:

Miao, L.;
Tanemura, S.;
Cao, Y. G.;
Xu, G.

Publication type:

Article

1D-photonic crystals prepared from the amorphous chalcogenide films.

Published in:

Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 346, doi. 10.1007/s10854-008-9619-z

By:

Kohoutek, Tomas;
Orava, Jiri;
Wagner, Tomas;
Hrdlicka, Martin;
Vlcek, Milan;
Frumar, Miloslav

Publication type:

Article

Characterization of poly(vinylidene fluoride-trifluoroethylene) 50/50 copolymer films as a gate dielectric.

Published in:

Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 1, p. 45, doi. 10.1007/s10854-007-9266-9

By:

Wi, Soojin;
Senthilkumar, N.;
Rhee, Shi-Woo

Publication type:

Article

Optical properties and electronic energy-band structure of CdIn2Te4.

Published in:

Journal of Materials Science: Materials in Electronics, 2007, v. 18, p. 347, doi. 10.1007/s10854-007-9244-2

By:

Ozaki, Shunji;
Take, Yoshinari;
Adachi, Sadao

Publication type:

Article

Thickness-dependent optical properties of ZnO thin films.

Published in:

Journal of Materials Science: Materials in Electronics, 2007, v. 18, p. 343, doi. 10.1007/s10854-007-9243-3

By:

Miao, L.;
Tanemura, S.;
Tanemura, M.;
Lau, S. P.;
Tay, B. K.

Publication type:

Article

Crystallization of thin-film Si monitored in real time by in-situ spectroscopic techniques.

Published in:

Journal of Materials Science: Materials in Electronics, 2007, v. 18, p. 309, doi. 10.1007/s10854-007-9222-8

By:

Stradins, P.;
Teplin, C. W.;
Young, D. L.;
Yan, Y.;
Branz, H. M.;
Wang, Q.

Publication type:

Article

Optical properties of nanocrystalline diamond films from mid-infrared to ultraviolet using reflectometry and ellipsometry.

Published in:

Journal of Materials Science: Materials in Electronics, 2007, v. 18, p. 37, doi. 10.1007/s10854-007-9175-y

By:

Hu, Z. G.;
Prunici, P.;
Hess, P.;
Chen, K. H.

Publication type:

Article

Opening a new window to other worlds with spectropolarimetry.

Published in:

Experimental Astronomy, 2010, v. 28, n. 2/3, p. 101, doi. 10.1007/s10686-010-9193-2

By:

Mohler, Maren;
Bühl, Johannes;
Doherty, Stephen;
Eggl, Siegfried;
Eybl, Vera;
Farago, François;
Jaćimović, Aleksandar;
Hunger, Lars;
Lauritsen, Nynne;
Ludena, David;
Meisnar, Martina;
Reissner, Alexander;
Sarda, Nicolas;
Toullec, Benjamin;
Tió, Meritxell

Publication type:

Article

POLARIX: a pathfinder mission of X-ray polarimetry.

Published in:

Experimental Astronomy, 2010, v. 28, n. 2/3, p. 137, doi. 10.1007/s10686-010-9194-1

By:

Costa, Enrico;
Bellazzini, Ronaldo;
Tagliaferri, Gianpiero;
Matt, Giorgio;
Argan, Andrea;
Attinà, Primo;
Baldini, Luca;
Basso, Stefano;
Brez, Alessandro;
Citterio, Oberto;
Cosimo, Sergio;
Cotroneo, Vincenzo;
Fabiani, Sergio;
Feroci, Marco;
Ferri, Antonella;
Latronico, Luca;
Lazzarotto, Francesco;
Minuti, Massimo;
Morelli, Ennio;
Muleri, Fabio

Publication type:

Article

Ellipsometric and mechanical characterization of nanostructured anodic oxide film formed on Ti-6Al-7Nb alloy.

Published in:

Journal of Solid State Electrochemistry, 2016, v. 20, n. 9, p. 2517, doi. 10.1007/s10008-016-3140-8

By:

Guedes, Luis;
Dalboni Garcia, Marcela;
Cunha, Jéssica;
Duarte, Lais;
Bertagnolli, Denise;
Silva, Ladário;
Huguenin, José;
Ferreira, Elivelton

Publication type:

Article

Simultaneous ellipsometric and chronoamperometric study of barrier aluminium oxide growth and dissolution in acetate buffer.

Published in:

Journal of Solid State Electrochemistry, 2015, v. 19, n. 12, p. 3473, doi. 10.1007/s10008-015-2878-8

By:

Giskeødegård, Nils;
Hunderi, Ola;
Nisancioglu, Kemal

Publication type:

Article

Titanium surface anodized under UV light irradiation observed by ellipso-microscopy.

Published in:

Journal of Solid State Electrochemistry, 2015, v. 19, n. 12, p. 3579, doi. 10.1007/s10008-015-2753-7

By:

Fushimi, K.;
Kurauchi, K.;
Ikeyama, H.;
Kitagawa, Y.;
Nakanishi, T.;
Hasegawa, Y.;
Ueda, M.;
Ohtsuka, T.

Publication type:

Article

In situ monitoring of electrostriction in anodic and thermal silicon dioxide thin films.

Published in:

Journal of Solid State Electrochemistry, 2013, v. 17, n. 7, p. 1945, doi. 10.1007/s10008-013-2036-0

By:

Blaffart, Frédéric;
Overmeere, Quentin;
Pardoen, Thomas;
Proost, Joris

Publication type:

Article

Activation process in hydrogen storage related to oxide layers formed on zirconium alloys.

Published in:

Journal of Solid State Electrochemistry, 2005, v. 9, n. 5, p. 254, doi. 10.1007/s10008-004-0608-8

By:

J. O. Zerbino;
A. Visintin;
W. E. Triaca

Publication type:

Article

Phase-Spectral Ellipsometry Method for Nondestructive Control of the Chemical Composition of thin Metal-Oxide Heterostructures.

Published in:

Measurement Techniques, 2022, v. 65, n. 8, p. 608, doi. 10.1007/s11018-023-02128-6

By:

Tyurin, D. N.;
Kotenev, V. A.

Publication type:

Article

Ellipsometric Technique for Estimating the Thickness Nonuniformity of Thin-Film Coatings.

Published in:

Measurement Techniques, 2014, v. 56, n. 11, p. 1224, doi. 10.1007/s11018-014-0358-7

By:

Baturin, A.;
Bormashov, V.;
Gavrilenko, V.;
Zablotskii, A.;
Zaitsev, S.;
Kuzin, A.;
Todua, P.;
Filippov, M.

Publication type:

Article

Spectral ellipsometry study of thin films grown on GaAs by chemically stimulated thermal oxidation.

Published in:

Inorganic Materials, 2014, v. 50, n. 9, p. 882, doi. 10.1134/S0020168514090052

By:

Kostryukov, V.;
Mittova, I.;
Shvets, V.;
Tomina, E.;
Sladkopevtsev, B.;
Tret'yakov, N.

Publication type:

Article

High-speed determination of the thickness and spectral ellipsometry investigation of films produced by the thermal oxidation of InP and VO/InP structures.

Published in:

Inorganic Materials, 2013, v. 49, n. 2, p. 179, doi. 10.1134/S0020168513020143

By:

Mittova, I.;
Shvets, V.;
Tomina, E.;
Sladkopevtsev, B.;
Tret'yakov, N.;
Lapenko, A.

Publication type:

Article

Properties of BC xN y films grown by plasma-enhanced chemical vapor deposition from N-trimethylborazine-nitrogen mixtures.

Published in:

Inorganic Materials, 2010, v. 46, n. 5, p. 487, doi. 10.1134/S0020168510050092

By:

Sulyaeva, V. S.;
Kosinova, M. L.;
Rumyantsev, Yu. M.;
Golubenko, A. N.;
Fainer, N. I.;
Alferova, N. I.;
Ayupov, B. M.;
Gevko, P. N.;
Kesler, V. G.;
Kolesov, B. A.;
Maksimovskii, E. A.;
Myakishev, K. G.;
Yushina, I. V.;
Kuznetsov, F. A.

Publication type:

Article

Composition and structure of hafnia films on silicon.

Published in:

Inorganic Materials, 2008, v. 44, n. 9, p. 965, doi. 10.1134/S0020168508090124

By:

Smirnova, T.;
Kaichev, V.;
Yakovkina, L.;
Kosyakov, V.;
Beloshapkin, S.;
Kuznetsov, F.;
Lebedev, M.;
Gritsenko, V.

Publication type:

Article

Studies on the RF sputtered amorphous SiGe thin films.

Published in:

Inorganic Materials, 2006, v. 42, n. 1, p. 3, doi. 10.1134/S002016850601002X

By:

Serényi, M.;
Lohner, T.;
Zolnai, Z.;
Petrik, P.;
Nemcsics, Á.;
Khánh, N.;
Turmezei, P.

Publication type:

Article

Structural, optical, and electrical properties of doped samarium chromite.

Published in:

Inorganic Materials, 2005, v. 41, n. 2, p. 172, doi. 10.1007/s10789-005-0038-8

By:

Sal'nikov, V. V.;
Pankratov, A. A.;
Zemtsov, V.I.

Publication type:

Article

Nanoscale Potential Fluctuations in Zirconium Oxide and the Flash Memory Based on Electron and Hole Localization.

Published in:

Advanced Electronic Materials, 2018, v. 4, n. 9, p. 1, doi. 10.1002/aelm.201700592

By:

Gritsenko, Vladimir A.;
Novikov, Yuriy N.;
Perevalov, Timofey V.;
Kruchinin, Vladimir N.;
Aliev, Vladimir S.;
Gerasimova, Alina K.;
Erenburg, Simon B.;
Trubina, Svetlana V.;
Kvashnina, Kristina O.;
Prosvirin, Igor P.;
Lanza, Mario

Publication type:

Article

Achieving 6.7% Efficiency in P3HT/Indene‐C70 Bisadduct Solar Cells through the Control of Vertical Volume Fraction Distribution and Optimized Regio‐Isomer Ratios.

Published in:

Advanced Electronic Materials, 2016, v. 2, n. 12, p. 1, doi. 10.1002/aelm.201600362

By:

Kutsarov, Dimitar I.;
Rašović, Ilija;
Zachariadis, Alexandros;
Laskarakis, Argiris;
Lebedeva, Maria A.;
Porfyrakis, Kyriakos;
Mills, Christopher A.;
Beliatis, Michail J.;
Fisher, Brett;
Bruchlos, Kirsten;
Ludwigs, Sabine;
Logothetidis, Stergios;
Silva, S. Ravi P.

Publication type:

Article

Polarization Effects in the Radiation of Magnetized Envelopes and Extended Accretion Structures.

Published in:

Astronomy Reports, 2005, v. 49, n. 3, p. 179, doi. 10.1134/1.1882776

By:

Gnedin, Yu. N.;
Silant'ev, N. A.;
Piotrovich, M. Yu.;
Pogodin, M. A.

Publication type:

Article

Quantitative characterization and modeling of sub-bandgap absorption features in thin oxide films from spectroscopic ellipsometry data.

Published in:

AIMS Materials Science, 2015, v. 2, n. 4, p. 356, doi. 10.3934/matersci.2015.4.356

By:

Likhachev, Dmitriy V.;
Malkova, Natalia;
Poslavsky, Leonid

Publication type:

Article