Works matching DE "THIN films analysis"
1
- Journal of Electronic Materials, 2024, v. 53, n. 9, p. 5374, doi. 10.1007/s11664-024-11290-8
- Trinidad-Urbina, R. E.;
- Castanedo-Pérez, R.;
- Torres-Delgado, G.;
- Sánchez-Martínez, A.;
- Ramírez-Bon, R.
- Article
2
- Surface Engineering, 2018, v. 34, n. 9, p. 660, doi. 10.1080/02670844.2017.1385233
- Enriquez-Flores, C. I.;
- Cruz-Valeriano, E.;
- Gutierrez-Peralta, A.;
- Gervacio-Arciniega, J. J.;
- Ramírez-Álvarez, E.;
- Leon-Sarabia, E.;
- Moreno-Palmerin, J.
- Article
3
- Surface Engineering, 2018, v. 34, n. 9, p. 655, doi. 10.1080/02670844.2017.1320033
- Choudhary, R. K.;
- Mishra, P.;
- Biswas, A.;
- Debnath, A. K.;
- Kain, V.
- Article
4
- Surface Engineering, 2018, v. 34, n. 9, p. 682, doi. 10.1080/02670844.2017.1390905
- Antosoly, D.;
- Ilangovan, S.;
- Nagarethinam, V. S.;
- Balu, A. R.
- Article
5
- Surface Engineering, 2018, v. 34, n. 9, p. 711, doi. 10.1080/02670844.2017.1383683
- Nagarajan, V.;
- Thayumanavan, A.
- Article
6
- Surface Engineering, 2018, v. 34, n. 9, p. 667, doi. 10.1080/02670844.2017.1373975
- Yang, Ya-Chu;
- Tsau, Chun-Huei;
- Yeh, Jien-Wei;
- Chen, Swe-Kai
- Article
7
- Surface Engineering, 2018, v. 34, n. 9, p. 649, doi. 10.1080/02670844.2017.1312779
- Liu, L.;
- Wang, W. T.;
- Huo, B. L.;
- Wang, M. J.;
- Yu, Z.;
- Yang, X.;
- Zhang, Y.;
- Cheng, C. H.;
- Zhao, Y.
- Article
8
- Surface Engineering, 2018, v. 34, n. 9, p. 641, doi. 10.1080/02670844.2017.1305658
- Zhang, Xian;
- Odnevall Wallinder, Inger;
- Leygraf, Christofer
- Article
9
- Surface Engineering, 2016, v. 32, n. 11, p. 846, doi. 10.1080/02670844.2016.1185838
- Sharma, P.;
- Singhal, R.;
- Vishnoi, R.;
- Banerjee, M. K.;
- Kaushik, R.;
- Kamma, K. V.;
- Lakshmi, G. B. V. S.;
- Tripathi, A.;
- Avasthi, D. K.
- Article
10
- Macromolecular Rapid Communications, 2015, v. 36, n. 1, p. 96, doi. 10.1002/marc.201400559
- Tzeng, Ping;
- Lugo, Elva L.;
- Mai, Garret D.;
- Wilhite, Benjamin A.;
- Grunlan, Jaime C.
- Article
11
- Macromolecular Rapid Communications, 2014, v. 35, n. 20, p. 1770, doi. 10.1002/marc.201400203
- Schmid, Stefanie;
- Kast, Anne K.;
- Schröder, Rasmus R.;
- Bunz, Uwe H. F.;
- Melzer, Christian
- Article
12
- Angewandte Chemie, 2014, v. 126, n. 51, p. 14420, doi. 10.1002/ange.201408374
- Solarska, Renata;
- Bienkowski, Krzysztof;
- Zoladek, Sylwia;
- Majcher, Aldona;
- Stefaniuk, Tomasz;
- Kulesza, Pawel J.;
- Augustynski, Jan
- Article
13
- Angewandte Chemie, 2014, v. 126, n. 31, p. 8231, doi. 10.1002/ange.201403702
- Hsu, Bryan B.;
- Jamieson, Kelsey S.;
- Hagerman, Samantha R.;
- Holler, Eggehard;
- Ljubimova, Julia Y.;
- Hammond, Paula T.
- Article
14
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 20, p. 19060, doi. 10.1007/s10854-019-02263-3
- Article
15
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 14, p. 13118, doi. 10.1007/s10854-019-01675-5
- Khimani, Ankurkumar J.;
- Chaki, Sunil H.;
- Chauhan, Sanjaysinh M.;
- Deshpande, M. P.
- Article
16
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 24, p. 18891, doi. 10.1007/s10854-017-7842-1
- Maldar, P.;
- Mane, A.;
- Nikam, S.;
- Giri, S.;
- Sarkar, A.;
- Moholkar, A.
- Article
17
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 21, p. 15790, doi. 10.1007/s10854-017-7473-6
- Jadkar, Vijaya;
- Pawbake, Amit;
- Waykar, Ravindra;
- Jadhavar, Ashok;
- Mayabadi, Azam;
- Date, Abhijit;
- Late, Dattatray;
- Pathan, Habib;
- Gosavi, Suresh;
- Jadkar, Sandesh
- Article
18
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 21, p. 16239, doi. 10.1007/s10854-017-7527-9
- Bai, Yuhang;
- Li, Chen;
- Wu, Di
- Article
19
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 19, p. 14728, doi. 10.1007/s10854-017-7341-4
- Prabukanthan, P.;
- Rajesh Kumar, T.;
- Harichandran, G.
- Article
20
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 17, p. 12962, doi. 10.1007/s10854-017-7127-8
- Li, Jinjin;
- Zhu, Guisheng;
- Xu, Huarui;
- Wang, Pan;
- Chen, Yida;
- Yan, Dongliang;
- Yu, Aibing
- Article
21
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 17, p. 13112, doi. 10.1007/s10854-017-7144-7
- Yadav, A.;
- Lokhande, A.;
- Shinde, P.;
- Kim, J.;
- Lokhande, C.
- Article
22
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 4, p. 3140, doi. 10.1007/s10854-016-5902-6
- Raut, Vanita;
- Lokhande, Chandrakant;
- Killedar, Vilas
- Article
23
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 4, p. 3474, doi. 10.1007/s10854-016-5945-8
- Luo, W.;
- Wu, Q.;
- Wu, C.;
- Yu, Y.;
- Shuai, Y.;
- Zhang, W.
- Article
24
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 4, p. 3495, doi. 10.1007/s10854-016-5948-5
- Zhang, Dong;
- Wang, Xuan;
- Song, Wei;
- Sun, Zhi;
- He, Li-Juan;
- Han, Bai;
- Lei, Qing-Quan
- Article
25
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 4, p. 3530, doi. 10.1007/s10854-016-5953-8
- Wang, Ying;
- Jiang, Weiwei;
- Ding, Wanyu;
- Chai, Weiping
- Article
26
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 4, p. 3481, doi. 10.1007/s10854-016-5946-7
- Xu, Bin;
- Zhao, Yun;
- Sun, Aimin;
- Li, Yan;
- Li, Wen;
- Han, Xiuxun
- Article
27
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 4, p. 3515, doi. 10.1007/s10854-016-5951-x
- Article
28
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 3, p. 2976, doi. 10.1007/s10854-016-5883-5
- Kuppan, M.;
- Kaleemulla, S.;
- MadhusudhanaRao, N.;
- Krishnamoorthi, C.;
- Omkaram, I.;
- SreekanthaReddy, D.
- Article
29
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 3, p. 2996, doi. 10.1007/s10854-016-5885-3
- Saragih, Albert;
- Kuo, Dong-Hau;
- Tuan, Thi
- Article
30
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 12, p. 13209, doi. 10.1007/s10854-016-5467-4
- Vinodkumar, R.;
- Sajna, M. S.;
- Prakashan, V. P.;
- Unnikrishnan, N.
- Article
31
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 12, p. 13192, doi. 10.1007/s10854-016-5465-6
- Chen, Julong;
- Fan, Ping;
- Liang, Guangxing;
- Gu, Di;
- Luo, Jingting;
- Zheng, Zhuanghao;
- Zhao, Jun;
- Zhang, Dongping
- Article
32
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 5, p. 4849, doi. 10.1007/s10854-016-4367-y
- Beji, Nasreddine;
- Souli, Mehdi;
- Azzaza, Sonia;
- Alleg, Safia;
- Kamoun Turki, Najoua
- Article
33
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 5, p. 4923, doi. 10.1007/s10854-016-4376-x
- Faruque, Sk;
- Sinha, Anil;
- Chakraborty, Supratic
- Article
34
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 5, p. 4981, doi. 10.1007/s10854-016-4384-x
- Li, Yuanbao;
- Liu, Yueyan;
- Liu, Juncheng;
- Ren, Lin
- Article
35
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 5, p. 5238, doi. 10.1007/s10854-016-4419-3
- Zhang, Liangzhu;
- Lin, Huixing;
- Ren, Haisen;
- Zhao, Xiangyu;
- Luo, Lan
- Article
36
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 5, p. 5243, doi. 10.1007/s10854-016-4420-x
- Adelifard, M.;
- Salamatizadeh, R.;
- Ketabi, S.
- Article
37
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 5, p. 5251, doi. 10.1007/s10854-016-4421-9
- Zhang, Hong;
- Kong, Chunyang;
- Li, Wanjun;
- Qin, Guoping;
- Ruan, Haibo;
- Tan, Mi
- Article
38
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 5, p. 5264, doi. 10.1007/s10854-016-4423-7
- Kumar, Arvind;
- Mondal, Sandip;
- Koteswara Rao, K.
- Article
39
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 5, p. 5284, doi. 10.1007/s10854-016-4426-4
- Karteri, İbrahim;
- Karataş, Şükrü;
- Yakuphanoglu, Fahrettin
- Article
40
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 4, p. 3245, doi. 10.1007/s10854-015-4151-4
- Sun, Jianbin;
- Zheng, Qiao;
- Cheng, Shuying;
- Zhou, Haifang;
- Lai, Yunfeng;
- Yu, Jinling
- Article
41
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 4, p. 3420, doi. 10.1007/s10854-015-4174-x
- Sheik Fareed, S.;
- Mythili, N.;
- Mohamed Mohaideen, H.;
- Saravanakumar, K.;
- Chandramohan, R.;
- Ravi, G.
- Article
42
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 4, p. 3549, doi. 10.1007/s10854-015-4190-x
- Wang, Lu;
- Yang, Zhouyong;
- Ni, Xiuyuan
- Article
43
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 3, p. 2866, doi. 10.1007/s10854-015-4103-z
- Goncalves, L.;
- Rocha, L.;
- Silva, C.;
- Cortés, J.;
- Ramirez, M.;
- Simões, A.
- Article
44
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 9, p. 6411, doi. 10.1007/s10854-015-3230-x
- Liu, Ting;
- Ding, Dongyan;
- Hu, Yu;
- Gong, Yihua
- Article
45
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 9, p. 7165, doi. 10.1007/s10854-015-3341-4
- Ramar, M.;
- Yadav, V.;
- Srivastava, R.;
- Suman, C.
- Article
46
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 8, p. 5562, doi. 10.1007/s10854-014-2196-4
- Vigil-Galán, O.;
- Courel, Maykel;
- Andrade-Arvizu, J.;
- Sánchez, Y.;
- Espíndola-Rodríguez, M.;
- Saucedo, E.;
- Seuret-Jiménez, D.;
- Titsworth, Matthew
- Article
47
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 9, p. 4163, doi. 10.1007/s10854-014-2144-3
- Deng, B.;
- He, G.;
- Chen, X.;
- Zhang, J.;
- Liu, M.;
- Lv, J.;
- Sun, Z.
- Article
48
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 6, p. 1169, doi. 10.1007/s10854-011-0567-7
- Article
49
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 6, p. 1219, doi. 10.1007/s10854-011-0576-6
- Article
50
- Journal of Solid State Electrochemistry, 2018, v. 22, n. 8, p. 2347, doi. 10.1007/s10008-018-3946-7
- Bouhjar, Feriel;
- Bessaïs, Brahim;
- Marí, Bernabé
- Article