Works matching DE "ELECTRIC properties of silicon"
1
- Revista Cubana de Física, 2023, v. 40, p. 2
- Article
2
- Angewandte Chemie, 2013, v. 125, n. 46, p. 12246, doi. 10.1002/ange.201304688
- Fabre, Bruno;
- Li, Yan;
- Scheres, Luc;
- Pujari, Sidharam P.;
- Zuilhof, Han
- Article
3
- Angewandte Chemie, 2013, v. 125, n. 41, p. 11040, doi. 10.1002/ange.201304594
- Nakata, Norio;
- Rodriguez, Ricardo;
- Troadec, Thibault;
- Saffon ‐ Merceron, Nathalie;
- Sotiropoulos, Jean ‐ Marc;
- Baceiredo, Antoine;
- Kato, Tsuyoshi
- Article
4
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 12, p. 5322, doi. 10.1007/s10854-014-2308-1
- Chen, Dongpo;
- Zhao, Lei;
- Diao, Hongwei;
- Zhang, Wenbin;
- Wang, Ge;
- Wang, Wenjing
- Article
5
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 12, p. 5410, doi. 10.1007/s10854-014-2321-4
- Chen, Xiaobo;
- Yang, Peizhi
- Article
6
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 12, p. 5356, doi. 10.1007/s10854-014-2313-4
- Jiang, Qian;
- Wang, Weiyan;
- Zeng, Yuheng;
- Xu, Wei;
- Huang, Jinhua;
- Zhou, Ti;
- Song, Weijie
- Article
7
- Journal of Materials Science: Materials in Electronics, 2011, v. 22, n. 10, p. 1553, doi. 10.1007/s10854-011-0450-6
- Boostandoost, M.;
- Friedrich, F.;
- Kerst, U.;
- Boit, C.;
- Gall, S.;
- Yokoyama, Y.
- Article
8
- PAMM: Proceedings in Applied Mathematics & Mechanics, 2013, v. 13, n. 1, p. 207, doi. 10.1002/pamm.201310099
- Dal, Hüsnü;
- Miehe, Christian
- Article
9
- International Journal of Energy Research, 2018, v. 42, n. 3, p. 919, doi. 10.1002/er.3826
- Huang, Shu;
- Ren, Jianguo;
- Liu, Rong;
- Yue, Min;
- Huang, Youyuan;
- Yuan, Guohui
- Article
10
- International Journal of Energy Research, 2018, v. 42, n. 3, p. 1148, doi. 10.1002/er.3913
- Yuca, Neslihan;
- Cetintasoglu, Mehmet E.;
- Dogdu, Murat F.;
- Akbulut, Huseyin;
- Tabanli, Sevcan;
- Colak, Uner;
- Taskin, Omer S.
- Article
11
- International Journal of Energy Research, 2007, v. 31, n. 6/7, p. 548, doi. 10.1002/er.1280
- La O, Gerardo Jose;
- Hyun Jin In;
- Crumlin, Ethan;
- Barbastathis, George;
- Yang Shao-Horn
- Article
12
- Doklady Chemistry, 2017, v. 477, n. 2, p. 271, doi. 10.1134/S0012500817120011
- Abramova, E.;
- Khort, A.;
- Yakovenko, A.;
- Tsygankov, V.;
- Slipchenko, E.;
- Shvets, V.
- Article
13
- Physica Status Solidi - Rapid Research Letters, 2016, v. 10, n. 4, p. 305, doi. 10.1002/pssr.201510443
- Fritz, Susanne;
- Engelhardt, Josh;
- Ebert, Stefanie;
- Hahn, Giso
- Article
14
- Physica Status Solidi - Rapid Research Letters, 2014, v. 8, n. 2, p. 163, doi. 10.1002/pssr.201308209
- Ghoneim, Mohamed T.;
- Rojas, Jhonathan P.;
- Hussain, Aftab M.;
- Hussain, Muhammad M.
- Article
15
- Physica Status Solidi - Rapid Research Letters, 2013, v. 7, n. 6, p. n/a, doi. 10.1002/pssr.201370433
- Article
16
- Journal of Superconductivity & Novel Magnetism, 2018, v. 31, n. 3, p. 723, doi. 10.1007/s10948-017-4329-5
- Pudalov, V. M.;
- Gershenson, M. E.
- Article
17
- AAPPS Bulletin, 2015, v. 25, n. 2, p. 8
- JIN SANG KIM;
- HYUN CHEOL KOO;
- JEON-KOOK LEE;
- SUNG WOOK MOON;
- JIN DONG SONG;
- YONG-WON SONG;
- JOONYEON CHANG
- Article
18
- Materials Science (0137-1339), 2005, v. 23, n. 1, p. 61
- Hübert, Thomas;
- Shimamura, Aki;
- Klyszcz, Andreas
- Article
19
- Applied Physics A: Materials Science & Processing, 2009, v. 96, n. 1, p. 153, doi. 10.1007/s00339-009-5090-9
- Article
20
- Applied Physics A: Materials Science & Processing, 2009, v. 96, n. 1, p. 171, doi. 10.1007/s00339-008-4981-5
- Article
21
- Applied Physics A: Materials Science & Processing, 2009, v. 96, n. 1, p. 145, doi. 10.1007/s00339-008-5017-x
- Article
22
- Applied Physics A: Materials Science & Processing, 2001, v. 72, n. 6, p. 721, doi. 10.1007/s003390000562
- Wang, P.-F.;
- Ding, S.-J.;
- Zhang, J.-Y.;
- Zhang, D.W.;
- Wang, J.-T.;
- Lee, W.W.
- Article
23
- Applied Physics A: Materials Science & Processing, 2001, v. 72, n. 1, p. 85, doi. 10.1007/s003390000568
- Li, W.P.;
- Liu, Y.M.;
- Zhang, R.;
- Chen, J.;
- Cheng, P.;
- Yuan, X.L.;
- Zhou, Y.G.;
- Shen, B.;
- Jiang, R.L.;
- Shi, Y.;
- Liu, Z.G.;
- Zheng, Y.D.
- Article
24
- Canadian Journal of Physics, 2006, v. 84, n. 8, p. 707, doi. 10.1139/P06-062
- Jha, Alok K. S.;
- Singh, Narendra;
- Verma, Nupur;
- Mohan, Man
- Article
25
- Semiconductors, 2018, v. 52, n. 3, p. 273, doi. 10.1134/S1063782618030065
- Bannaya, V. F.;
- Nikitina, E. V.
- Article
26
- Semiconductors, 2018, v. 52, n. 3, p. 282, doi. 10.1134/S1063782618030089
- Borshch, N. A.;
- Kurganskii, S. I.
- Article
27
- Semiconductors, 2016, v. 50, n. 9, p. 1156, doi. 10.1134/S1063782616090104
- Kalygina, V.;
- Egorova, I.;
- Novikov, V.;
- Prudaev, I.;
- Tolbanov, O.
- Article
28
- Semiconductors, 2016, v. 50, n. 8, p. 1065, doi. 10.1134/S1063782616080066
- Antonova, I.;
- Kotin, I.;
- Popov, V.;
- Vasileva, F.;
- Kapitonov, A.;
- Smagulova, S.
- Article
29
- Semiconductors, 2016, v. 50, n. 6, p. 761, doi. 10.1134/S106378261606021X
- Sachenko, A.;
- Belyaev, A.;
- Konakova, R.
- Article
30
- Semiconductors, 2015, v. 49, n. 7, p. 939, doi. 10.1134/S1063782615070088
- Golobokova, L.;
- Nastaushev, Yu.;
- Dultsev, F.;
- Kryzhanovskaya, N.;
- Moiseev, E.;
- Kozhukhov, A.;
- Latyshev, A.
- Article
31
- Semiconductors, 2014, v. 48, n. 8, p. 1041, doi. 10.1134/S1063782614080119
- Fastykovsky, P.;
- Glauberman, M.
- Article
32
- Semiconductors, 2009, v. 43, n. 3, p. 313, doi. 10.1134/S1063782609030105
- Lobanov, D. N.;
- Novikov, A. V.;
- Kudryavtsev, K. E.;
- Shengurov, D. V.;
- Drozdov, Yu. N.;
- Yablonskiy, A. N.;
- Shmagin, V. B.;
- Krasilnik, Z. F.;
- Zakharov, N. D.;
- Werner, P.
- Article
33
- Semiconductors, 2008, v. 42, n. 7, p. 873, doi. 10.1134/S1063782608070208
- Pokotilo, Yu. M.;
- Petukh, A. N.;
- Dzichkovski, O. A.
- Article
34
- Semiconductors, 2008, v. 42, n. 6, p. 655, doi. 10.1134/S1063782608060055
- Article
35
- Semiconductors, 2006, v. 40, n. 2, p. 234, doi. 10.1134/S1063782606020229
- Berashevich, J. A.;
- Lazarouk, S. K.;
- Borisenko, V. E.
- Article
36
- Semiconductors, 2003, v. 37, n. 1, p. 92, doi. 10.1134/1.1538545
- Naumova, O.V.;
- Antonova, I.V.;
- Popov, V.P.;
- Stas', V.F.
- Article
37
- Semiconductors, 2003, v. 37, n. 1, p. 103, doi. 10.1134/1.1538547
- Venger, E.F.;
- Holiney, R.Yu.;
- Matveeva, L.A.;
- Vasin, A.V.
- Article
38
- Semiconductors, 1999, v. 33, n. 3, p. 359, doi. 10.1134/1.1187695
- Astrova, E. V.;
- Voronkov, V. B.;
- Lebedev, A. A.;
- Lodygin, A. N.;
- Remenyuk, A. D.
- Article
39
- Journal of Electronic Materials, 2018, v. 47, n. 9, p. 5212, doi. 10.1007/s11664-018-6396-1
- Azadgar, Navid;
- Naderi, Nima;
- Eshraghi, Mohamad Javad
- Article
40
- Journal of Electronic Materials, 2018, v. 47, n. 9, p. 5056, doi. 10.1007/s11664-018-6324-4
- Tajima, Michio;
- Kiuchi, Hirotatsu;
- Higuchi, Fumito;
- Ishikawa, Yoichiro;
- Ogura, Atsushi
- Article
41
- Journal of Electronic Materials, 2018, v. 47, n. 9, p. 5039, doi. 10.1007/s11664-018-6299-1
- Li, Jiyang;
- Song, Lihui;
- Yu, Xuegong;
- Yang, Deren
- Article
42
- Journal of Electronic Materials, 2018, v. 47, n. 9, p. 4970, doi. 10.1007/s11664-018-6194-9
- Gao, Yuhan;
- Shen, Hao;
- Cao, Jiahao;
- Li, Dongsheng;
- Yang, Deren
- Article
43
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 1572, doi. 10.1007/s11664-010-1277-2
- Nemoto, Takashi;
- Iida, Tsutomu;
- Sato, Junichi;
- Oguni, Yohei;
- Matsumoto, Atsunobu;
- Miyata, Takahiro;
- Sakamoto, Tatsuya;
- Nakajima, Tadao;
- Taguchi, Hirohisa;
- Nishio, Keishi;
- Takanashi, Yoshifumi
- Article
44
- Philosophical Magazine, 2008, v. 88, n. 2, p. 171, doi. 10.1080/14786430701798944
- Kim, T. H.;
- Goldman, A. I.;
- Kelton, K. F.
- Article
45
- Advanced Functional Materials, 2014, v. 24, n. 20, p. 3036, doi. 10.1002/adfm.201303766
- Chae, Changju;
- Noh, Hyung‐Joo;
- Lee, Jung Kyoo;
- Scrosati, Bruno;
- Sun, Yang‐Kook
- Article
46
- Technical Physics, 2016, v. 61, n. 11, p. 1711, doi. 10.1134/S1063784216110256
- Sominskii, G.;
- Taradaev, E.;
- Tumareva, T.;
- Givargizov, M.;
- Stepanova, A.
- Article
47
- Technical Physics, 2014, v. 59, n. 3, p. 411, doi. 10.1134/S1063784214030281
- Article
48
- Metals (2075-4701), 2017, v. 7, n. 6, p. 184, doi. 10.3390/met7060184
- Yunhu Zhang;
- Chunyang Ye;
- Yanyi Xu;
- Honggang Zhong;
- Xiangru Chen;
- Xincheng Miao;
- Changjiang Song;
- Qijie Zhai
- Article
49
- Applied Physics A: Materials Science & Processing, 2011, v. 105, n. 4, p. 1021, doi. 10.1007/s00339-011-6537-3
- Li, Xinyi;
- Han, Peide;
- Gao, Lipeng;
- Mao, Xue;
- Hu, Shaoxu
- Article
50
- Journal of Mechanical Science & Technology, 2013, v. 27, n. 6, p. 1809, doi. 10.1007/s12206-013-0502-3
- Zhang, Xiaoling;
- Meng, Qingduan;
- Yu, Qian;
- Zhang, Liwen;
- Lv, Yanqiu
- Article