Works matching DE "TEMPERATURE compensation in electronic circuits"
1
- PLoS Biology, 2015, v. 13, n. 9, p. 1, doi. 10.1371/journal.pbio.1002265
- Städele, Carola;
- Heigele, Stefanie;
- Stein, Wolfgang
- Article
2
- Advanced Functional Materials, 2013, v. 23, n. 31, p. 3925, doi. 10.1002/adfm.201203147
- Freeman, Colin L.;
- Dawson, James A.;
- Chen, Hung‐Ru;
- Ben, Liubin;
- Harding, John H.;
- Morrison, Finlay D.;
- Sinclair, Derek C.;
- West, Anthony R.
- Article
3
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 9, p. 6699, doi. 10.1007/s10854-015-3272-0
- Guo, Tingting;
- Tan, Tingting;
- Liu, Zhengtang
- Article
4
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 3, p. 271, doi. 10.1007/s10854-007-9281-x
- Article
5
- Instrumentation Science & Technology, 2015, v. 43, n. 1, p. 21, doi. 10.1080/10739149.2014.942915
- Article
6
- International Journal of Circuit Theory & Applications, 2015, v. 43, n. 4, p. 421, doi. 10.1002/cta.1950
- Magnelli, Luca;
- Crupi, Felice;
- Corsonello, Pasquale;
- Iannaccone, Giuseppe
- Article
7
- International Journal of Circuit Theory & Applications, 2014, v. 42, n. 12, p. 1306, doi. 10.1002/cta.1925
- Albano, Domenico;
- Crupi, Felice;
- Cucchi, Francesca;
- Iannaccone, Giuseppe
- Article
8
- Thermal Science, 2015, v. 19, n. 4, p. 1461, doi. 10.2298/TSCI1504461L
- Ya LI;
- Ji-Huan HE;
- Qi-Long SUN;
- Ping WANG
- Article
9
- Insight: Non-Destructive Testing & Condition Monitoring, 2012, v. 54, n. 11, p. 594, doi. 10.1784/insi.2012.54.11.594
- Cawley, P;
- Cegla, F;
- Galvagni, A
- Article
10
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 8, p. 461, doi. 10.1049/el.2019.0277
- Haibin Wu;
- Qiongxia Pang;
- Xudong Zheng;
- Zhipeng Ma;
- Yiyu Lin;
- Zhonghe Jin
- Article
12
- European Journal of Organic Chemistry, 2016, v. 2016, n. 24, p. 4152, doi. 10.1002/ejoc.201600668
- Nunes, Cláudio M.;
- Pinto, Sandra M. V.;
- Reva, Igor;
- Fausto, Rui
- Article
13
- Journal of Vibroengineering, 2013, v. 15, n. 3, p. 1463
- Lei Qiu;
- Shenfang Yuan;
- Tianxiang Huang
- Article
14
- International Journal of Emerging Electric Power Systems, 2019, v. 20, n. 1, p. N.PAG, doi. 10.1515/ijeeps-2018-0215
- Hu, Jin-Lei;
- Wang, Wen-Bo;
- Zhang, Zhemin;
- Zhang, Kun;
- Hua, Kui;
- Chen, Ran
- Article
15
- PLoS Computational Biology, 2012, v. 8, n. 3, p. 1, doi. 10.1371/journal.pcbi.1002437
- Yu-Yao Tseng;
- Hunt, Suzanne M.;
- Heintzen, Christian;
- Crosthwaite, Susan K.;
- Schwartz, Jean-Marc
- Article
16
- Measurement Techniques, 2015, v. 57, n. 10, p. 1175, doi. 10.1007/s11018-015-0598-1
- Article
17
- Measurement Techniques, 2012, v. 55, n. 8, p. 876, doi. 10.1007/s11018-012-0053-5
- Domrachev, V.;
- Skripnik, A.
- Article
18
- Telecommunication Engineering, 2014, v. 54, n. 6, p. 825, doi. 10.3969/j.issn.1001-893x.2014.06.024
- YANG Hong-qiang;
- XIONG Fei;
- WANG Zhi;
- YANG Rong-bin
- Article
19
- Academic Journal of Manufacturing Engineering, 2017, v. 15, n. 3, p. 72
- Wentao SONG;
- Bin REN;
- Wenjie WANG;
- Ming Zhang;
- Yu'an Zhang
- Article
20
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 13, p. 1108, doi. 10.1049/el.2016.1039
- Shifeng Zhang;
- Ailing Li;
- Yan Han;
- Lu Jie;
- Xiaoxia Han;
- Cheung, Ray C. C.
- Article
21
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 10, p. 850, doi. 10.1049/el.2015.3781
- Lee, S.;
- Park, H.;
- Kim, W.;
- Kwon, H.;
- Jeong, J.;
- Kwon, Y.
- Article
22
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 13, p. 991, doi. 10.1049/el.2015.0476
- Castillo-Secilla, J. M.;
- León, F.;
- Olivares, J.;
- Palomares, J. M.
- Article
23
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 22, p. 1574, doi. 10.1049/el.2014.2371
- Article
25
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 3, p. 32, doi. 10.1049/el.2012.3350
- Sangirov, J.;
- Park, T. -W.;
- Ukaegbu, I. A.;
- Lee, T. -W.;
- Park, H. -H.
- Article
26
- International Journal of Distributed Sensor Networks, 2012, p. 1, doi. 10.1155/2012/167120
- Dong-Soo Hong;
- Khac-Duy Nguyen;
- In-Cheol Lee;
- Jeong-Tae Kim
- Article
27
- International Journal of Modern Physics B: Condensed Matter Physics; Statistical Physics; Applied Physics, 2017, v. 31, n. 27, p. -1, doi. 10.1142/S0217979217501922
- Hu, Mingzhe;
- Wei, Huanghe;
- Xiao, Lihua;
- Zhang, Kesheng;
- Hao, Yongde
- Article
28
- Acta Geotechnica, 2015, v. 10, n. 2, p. 275, doi. 10.1007/s11440-014-0301-8
- Jung, Soon-Hyuck;
- Yoon, Hyung-Koo;
- Lee, Jong-Sub
- Article
29
- Sensors (14248220), 2015, v. 15, n. 11, p. 29467, doi. 10.3390/s151129467
- Chin-Lung Yang;
- Gou-Tsun Zheng
- Article
30
- Sensors (14248220), 2015, v. 15, n. 5, p. 11133, doi. 10.3390/s150511133
- Nghia Trong Dinh;
- Olfa Kanoun
- Article
31
- Sensors (14248220), 2015, v. 15, n. 5, p. 10048, doi. 10.3390/s150510048
- Yinan Li;
- Junbo Wang;
- Zhenyu Luo;
- Deyong Chen;
- Jian Chen
- Article
32
- Sensors (14248220), 2014, v. 14, n. 9, p. 15836, doi. 10.3390/s140915836
- Su Sin Chong;
- Aziz, A. R. Abdul;
- Harun, Sulaiman W.;
- Arof, Hamzah
- Article
33
- Sensors (14248220), 2012, v. 12, n. 6, p. 8026, doi. 10.3390/s120608026
- Hao, Xiuchun;
- Jiang, Yonggang;
- Takao, Hidekuni;
- Maenaka, Kazusuke;
- Higuchi, Kohei
- Article
34
- Sensors (14248220), 2011, v. 11, n. 3, p. 2447, doi. 10.3390/s110302447
- Moreno, Jaime Sánchez;
- Muñoz, Diego Ramírez;
- Cardoso, Susana;
- Berga, Silvia Casans;
- Antón, Asunción Edith Navarro;
- de Freitas, Paulo Jorge Peixeiro
- Article
35
- Sensors (14248220), 2009, v. 9, n. 11, p. 8884, doi. 10.3390/s91108884
- Izu, Noriya;
- Nishizaki, Sayaka;
- Shin, Woosuck;
- Itoh, Toshio;
- Nishibori, Maiko;
- Matsubara, Ichiro
- Article
36
- Sensors (14248220), 2009, v. 9, n. 10, p. 8349, doi. 10.3390/s91008349
- Dunzhu Xia;
- Shuling Chen;
- Shourong Wang;
- Hongsheng Li
- Article
37
- Sensors (14248220), 2009, v. 9, n. 6, p. 4586, doi. 10.3390/s90604586
- Dunzhu Xia;
- Shuling Chen;
- Shourong Wang
- Article
38
- Electroanalysis, 2019, v. 31, n. 2, p. 318, doi. 10.1002/elan.201800587
- Jaworski, Aleksander;
- Wikiel, Hanna;
- Wikiel, Kazimierz
- Article
39
- Electroanalysis, 2017, v. 29, n. 1, p. 67, doi. 10.1002/elan.201600488
- Jaworski, Aleksander;
- Wikiel, Hanna;
- Wikiel, Kazimierz
- Article
40
- Microwave & Optical Technology Letters, 2010, v. 52, n. 8, p. 1906, doi. 10.1002/mop.25311
- Jun Ji;
- Shilie Zheng;
- Xiaofeng Jin;
- Xianmin Zhang;
- Hao Chi;
- Yingyin Kevin Zou
- Article
41
- Microwave & Optical Technology Letters, 2006, v. 48, n. 4, p. 827, doi. 10.1002/mop.21487
- Article
42
- Microwave & Optical Technology Letters, 2005, v. 44, n. 5, p. 480, doi. 10.1002/mop.20673
- Huang, C. W.;
- Chang, S. J.;
- Wu, W.;
- Wu, C. L.;
- Chang, C. S.
- Article
43
- Microwave & Optical Technology Letters, 2003, v. 36, n. 2, p. 87, doi. 10.1002/mop.10682
- Yuksel, Emine Yesim;
- Wong, Thomas T. Y.
- Article
44
- Infrastructures, 2022, v. 7, n. 1, p. 5, doi. 10.3390/infrastructures7010005
- Caspani, Valeria Francesca;
- Tonelli, Daniel;
- Poli, Francesca;
- Zonta, Daniele
- Article
45
- Journal of Robotics & Mechatronics, 2020, v. 32, n. 2, p. 323, doi. 10.20965/jrm.2020.p0323
- Muroyama, Masanori;
- Hirano, Hideki;
- Shao, Chenzhong;
- Tanaka, Shuji
- Article
46
- Advances in Materials Science & Engineering, 2014, p. 1, doi. 10.1155/2014/594516
- Jian-Yang Lin;
- Bing-Xun Wang
- Article
47
- Atmospheric Chemistry & Physics Discussions, 2015, v. 15, n. 12, p. 8771, doi. 10.5194/acpd-15-8771-2015
- Dinh, T.;
- Podglajen, A.;
- Hertzog, A.;
- Legras, B.;
- Plougonven, R.
- Article
48
- Optica Applicata, 2011, v. 41, n. 1, p. 145
- Article
49
- Microwave Journal, 2015, v. 58, n. 10, p. 100
- Article
50
- Microwave Journal, 2006, v. 49, n. 4, p. 68
- Bera, S. C.;
- Singh, R. V.;
- Garg, V. K.
- Article