Works matching DE "PHOTOELECTRICITY"
1
- Nanomaterials (2079-4991), 2025, v. 15, n. 10, p. 727, doi. 10.3390/nano15100727
- Zhang, Bo;
- Liu, Yaqian;
- Chen, Zhen;
- Wang, Xiaofang
- Article
2
- Journal of Electronic Materials, 2024, v. 53, n. 8, p. 4869, doi. 10.1007/s11664-024-11220-8
- Hu, Shao-Hwa;
- Lin, Yen-Sheng;
- Su, Shui-Hsiang;
- Dai, Hang;
- He, Jing-Shi
- Article
3
- Macromolecular Rapid Communications, 2015, v. 36, n. 14, p. 1362, doi. 10.1002/marc.201500116
- Yang, Zhengjin;
- Hou, Jianqiu;
- Wang, Xinyu;
- Wu, Liang;
- Xu, Tongwen
- Article
4
- Angewandte Chemie, 2016, v. 128, n. 12, p. 4010, doi. 10.1002/ange.201511189
- Oshikiri, Tomoya;
- Ueno, Kosei;
- Misawa, Hiroaki
- Article
5
- Angewandte Chemie, 2015, v. 127, n. 39, p. 11688, doi. 10.1002/ange.201506154
- Sun, Zhengbo;
- Xie, Hanhan;
- Tang, Siying;
- Yu, Xue-Feng;
- Guo, Zhinan;
- Shao, Jundong;
- Zhang, Han;
- Huang, Hao;
- Wang, Huaiyu;
- Chu, Paul K.
- Article
6
- Angewandte Chemie, 2015, v. 127, n. 20, p. 5967, doi. 10.1002/ange.201411386
- Jae Dong Kim;
- June Seok Heo;
- Park, Teahoon;
- Park, Chihyun;
- Hyun Ok Kim;
- Eunkyoung Kim
- Article
7
- Angewandte Chemie, 2014, v. 126, n. 52, p. 14736, doi. 10.1002/ange.201407494
- Kean, Zachary S.;
- Akbulatov, Sergey;
- Tian, Yancong;
- Widenhoefer, Ross A.;
- Boulatov, Roman;
- Craig, Stephen L.
- Article
8
- Angewandte Chemie, 2014, v. 126, n. 26, p. 6782, doi. 10.1002/ange.201403168
- Sun, Hao;
- You, Xiao;
- Deng, Jue;
- Chen, Xuli;
- Yang, Zhibin;
- Chen, Peining;
- Fang, Xin;
- Peng, Huisheng
- Article
9
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 10, p. 9861, doi. 10.1007/s10854-019-01323-y
- Zhang, Weiguo;
- Lei, Hanxiang;
- Yao, Suwei;
- Wang, Hongzhi
- Article
10
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 6, p. 5516, doi. 10.1007/s10854-019-00845-9
- Farooq, W. A.;
- Elgazzar, Elsayed;
- Dere, A.;
- Dayan, O.;
- Serbetci, Z.;
- Karabulut, Abdulkerim;
- Atif, M.;
- Hanif, Atif
- Article
11
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 17, p. 14796, doi. 10.1007/s10854-018-9616-9
- Zheng, Wei;
- Zhang, Yinan;
- Wang, Di;
- Wang, Qiming
- Article
12
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 23, p. 17917, doi. 10.1007/s10854-017-7733-5
- Zhang, Li;
- Liang, Qing-man;
- Dai, Chao-hua;
- Zhou, Min-jie;
- Liu, You-nian;
- Yan, Jian-hui
- Article
13
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 20, p. 15618, doi. 10.1007/s10854-017-7449-6
- Zou, Zhijun;
- Qiu, Yang;
- Xu, Jinyou;
- Guo, Pengfei;
- Luo, Yongsong
- Article
14
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 9, p. 6936, doi. 10.1007/s10854-017-6394-8
- Wang, Hanying;
- Ma, Shenghua;
- Ma, Qian;
- Cheng, Xuemei;
- Wang, Hui;
- Bai, Jintao
- Article
15
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 2, p. 2241, doi. 10.1007/s10854-016-5794-5
- Hoff, Anderson;
- Cruz-Cruz, Isidro;
- Siqueira, Mariana;
- Machado, Kleber;
- Hümmelgen, Ivo
- Article
16
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 8, p. 7883, doi. 10.1007/s10854-016-4779-8
- Zou, Zhijun;
- Qiu, Yang;
- Luo, Yongsong;
- Wang, Chunlei;
- Yan, Hailong
- Article
17
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 5, p. 4665, doi. 10.1007/s10854-016-4345-4
- Sun, Qian;
- Miao, Hui;
- Hu, Xiaoyun;
- Zhang, Guowei;
- Zhang, Dekai;
- Liu, Enzhou;
- Hao, Yuanyuan;
- Liu, Xixi;
- Fan, Jun
- Article
18
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 10, p. 7873, doi. 10.1007/s10854-015-3438-9
- Sun, Xigui;
- Gao, Kewei;
- Pang, Xiaolu;
- Yang, Huisheng;
- Volinsky, Alex
- Article
19
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 9, p. 7104, doi. 10.1007/s10854-015-3332-5
- Cheng, Tie;
- Zhou, Nai;
- Li, Pei
- Article
20
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 8, p. 6240, doi. 10.1007/s10854-015-3209-7
- Luo, Yangyang;
- Tan, Guoqiang;
- Dong, Guohua;
- Ren, Huijun;
- Xia, Ao
- Article
21
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 7, p. 3057, doi. 10.1007/s10854-014-1983-2
- Lei, Yun;
- Li, Rong;
- Chen, Feifei;
- Xu, Jun
- Article
22
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 6, p. 2595, doi. 10.1007/s10854-014-1916-0
- Yu, X.;
- Chang, B.;
- Wang, H.;
- Wang, M.
- Article
23
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 11, p. 4175, doi. 10.1007/s10854-013-1379-8
- Xu, Jialin;
- Hao, Sue;
- Duan, Xiangbin;
- Gu, Shuo;
- Meng, Xianwei
- Article
24
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 6, p. 1837, doi. 10.1007/s10854-012-1021-1
- Karmouch, R.;
- Savard, G.;
- Barba, D.;
- Koshel, D.;
- Martin, F.;
- Ross, G.
- Article
25
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 1, p. 295, doi. 10.1007/s10854-011-0408-8
- Deng, Jie;
- Tao, Jie;
- Wu, Tao;
- Zhu, Hong
- Article
26
- Journal of Materials Science: Materials in Electronics, 2011, v. 22, n. 5, p. 527, doi. 10.1007/s10854-010-0172-1
- Guiquan Guo;
- Weiping Gan;
- Feng Xiang;
- Jinling Zhang;
- Hua Zhou;
- Huan Liu;
- Jian Luo
- Article
27
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 11, p. 1137, doi. 10.1007/s10854-009-0033-y
- Zhong Huang;
- Jingchang Zhang;
- Xiuying Yang;
- Weiliang Cao
- Article
28
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 6, p. 554, doi. 10.1007/s10854-009-9956-6
- Zhiyue Han;
- Jingchang Zhang;
- Xiuying Yang;
- Hong Zhu;
- Weiliang Cao
- Article
29
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 2, p. 153, doi. 10.1007/s10854-009-9886-3
- Güneş, M.;
- Yavas, M. E. D.;
- Klomfass, J.;
- Finger, F.
- Article
30
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 12, p. 1225, doi. 10.1007/s10854-009-9856-9
- Minhong Jiang;
- Xinyu Liu;
- Guohua Chen;
- Jun Cheng;
- Xiujuan Zhou
- Article
31
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 9, p. 885, doi. 10.1007/s10854-008-9811-1
- Bo-In Noh;
- Jeong-Won Yoon;
- Bo-Young Lee;
- Seung-Boo Jung
- Article
32
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 2, p. 144, doi. 10.1007/s10854-008-9667-4
- Vijayakumar, Arun;
- Warren, Andrew P.;
- Todi, Ravi M.;
- Sundaram, Kalpathy B.
- Article
33
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 446, doi. 10.1007/s10854-008-9665-6
- Jin-Kook Lee;
- Bo-Hwa Jeong;
- Sung-Il Jang;
- Yun-Seon Yeo;
- Sung-Hae Park;
- Ji-Un Kim;
- Young-Guen Kim;
- Yong-Wook Jang;
- Kim, Mi-Ra
- Article
34
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 234, doi. 10.1007/s10854-008-9694-1
- Kadys, A.;
- Jarasiunas, K.;
- Saucedo, E.;
- Dieguez, E.;
- Launay, J.;
- Verstraeten, D.
- Article
35
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 8/9, p. 868, doi. 10.1007/s10854-007-9543-7
- Fang, L. M.;
- Zu, X. T.;
- Li, Z. J.;
- Zhu, S.;
- Liu, C. M.;
- Wang, L. M.;
- Gao, F.
- Article
36
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 8/9, p. 687, doi. 10.1007/s10854-007-9380-8
- Seghier, D.;
- Gislason, H. P.
- Article
37
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, p. 111, doi. 10.1007/s10854-007-9156-1
- Gharghi, M.;
- Sivoththaman, S.
- Article
38
- Experimental Astronomy, 2011, v. 32, n. 2, p. 101, doi. 10.1007/s10686-011-9254-1
- Hosack, Michael;
- Black, J.;
- Deines-Jones, Philip;
- Dennis, Brian;
- Hill, Joanne;
- Jahoda, Keith;
- Shih, Albert;
- Urba, Christian;
- Emslie, A.
- Article
39
- Journal of Solid State Electrochemistry, 2012, v. 16, n. 9, p. 3097, doi. 10.1007/s10008-012-1748-x
- Li, Jiajia;
- Kou, Huanhuan;
- Jiang, Yimin;
- Lu, Daban;
- Zheng, Zhixiang;
- Wang, Chunming
- Article
40
- Journal of Solid State Electrochemistry, 2012, v. 16, n. 4, p. 1353, doi. 10.1007/s10008-011-1491-8
- Ma, Jun;
- Li, Baohua;
- Du, Hongda;
- Xu, Chengjun;
- Kang, Feiyu
- Article
41
- Journal of Solid State Electrochemistry, 2012, v. 16, n. 4, p. 1615, doi. 10.1007/s10008-011-1564-8
- Pan, Maosen;
- Lin, Xuehao;
- Zhou, Zhentao
- Article
42
- Journal of Solid State Electrochemistry, 2011, v. 15, n. 4, p. 731, doi. 10.1007/s10008-010-1147-0
- Xiaoling Yang;
- Ping Wang;
- Yihua Zhu;
- Chunzhong Li
- Article
43
- Space Science Reviews, 2011, v. 159, n. 1-4, p. 447, doi. 10.1007/s11214-011-9827-3
- Article
44
- Measurement Techniques, 2016, v. 59, n. 9, p. 929, doi. 10.1007/s11018-016-1069-z
- Yanushkin, V.;
- Kolyada, Yu.;
- Krushnyak, N.
- Article
45
- Measurement Techniques, 2016, v. 59, n. 5, p. 491, doi. 10.1007/s11018-016-0995-0
- Yanushkin, V.;
- Kolyada, Yu.;
- Krushnyak, N.
- Article
46
- Measurement Techniques, 2015, v. 58, n. 3, p. 272, doi. 10.1007/s11018-015-0698-y
- Article
47
- Measurement Techniques, 2015, v. 57, n. 12, p. 1338, doi. 10.1007/s11018-015-0631-4
- Bogomolova, S.;
- Lukashov, Yu.;
- Shvarts, M.
- Article
48
- Measurement Techniques, 2014, v. 57, n. 3, p. 255, doi. 10.1007/s11018-014-0441-0
- Yanushkin, V.;
- Kolyada, Yu.
- Article
49
- Measurement Techniques, 2012, v. 55, n. 3, p. 292, doi. 10.1007/s11018-012-9953-7
- Article
50
- Measurement Techniques, 2011, v. 54, n. 5, p. 490, doi. 10.1007/s11018-011-9754-4
- Krasovskii, P.;
- Troyan, V.;
- Pushkin, M.;
- Borisyuk, P.;
- Borman, V.;
- Tronin, V.
- Article