Works matching IS 2199160X AND DT 2023 AND VI 9 AND IP 6


Results: 38
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    Colossal Gilbert Damping Anisotropy in Heusler‐Alloy Thin Films.

    Published in:
    Advanced Electronic Materials, 2023, v. 9, n. 6, p. 1, doi. 10.1002/aelm.202300049
    By:
    • Wang, Ruifeng;
    • Wang, Wenqiang;
    • Li, Zhihao;
    • Gao, Qinwu;
    • Wang, Jin;
    • Xu, Yongkang;
    • Yan, Pengfei;
    • Zhang, Xiaolong;
    • Zhang, Yilin;
    • Xu, Yongbing;
    • Liu, Ronghua;
    • He, Liang
    Publication type:
    Article
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    Origin of Topological Hall‐Like Feature in Epitaxial SrRuO<sub>3</sub> Thin Films.

    Published in:
    Advanced Electronic Materials, 2023, v. 9, n. 6, p. 1, doi. 10.1002/aelm.202300020
    By:
    • Roy, Pinku;
    • Carr, Adra;
    • Zhou, Tao;
    • Paudel, Binod;
    • Wang, Xuejing;
    • Chen, Di;
    • Kang, Kyeong Tae;
    • Pateras, Anastasios;
    • Corey, Zachary;
    • Lin, Shizeng;
    • Zhu, Jian‐Xin;
    • Holt, Martin V.;
    • Yoo, Jinkyoung;
    • Zapf, Vivien;
    • Zeng, Hao;
    • Ronning, Filip;
    • Jia, Quanxi;
    • Chen, Aiping
    Publication type:
    Article
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    Investigating the Electromechanical Behavior of Unconventionally Ferroelectric Hf<sub>0.5</sub>Zr<sub>0.5</sub>O<sub>2</sub>‐Based Capacitors Through Operando Nanobeam X‐Ray Diffraction.

    Published in:
    Advanced Electronic Materials, 2023, v. 9, n. 6, p. 1, doi. 10.1002/aelm.202201298
    By:
    • Stylianidis, Evgenios;
    • Surabhi, Pranav;
    • Hamming‐Green, Ruben;
    • Salverda, Mart;
    • Wei, Yingfen;
    • Burema, Arjan;
    • Matzen, Sylvia;
    • Banerjee, Tamalika;
    • Björling, Alexander;
    • Mukherjee, Binayak;
    • Dutta, Sangita;
    • Aramberri, Hugo;
    • Íñiguez, Jorge;
    • Noheda, Beatriz;
    • Carbone, Dina;
    • Nukala, Pavan
    Publication type:
    Article
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    Trap‐Assisted Memristive Switching in HfO<sub>2</sub>‐Based Devices Studied by In Situ Soft and Hard X‐Ray Photoelectron Spectroscopy.

    Published in:
    Advanced Electronic Materials, 2023, v. 9, n. 6, p. 1, doi. 10.1002/aelm.202201226
    By:
    • Zahari, Finn;
    • Marquardt, Richard;
    • Kalläne, Matthias;
    • Gronenberg, Ole;
    • Schlueter, Christoph;
    • Matveyev, Yury;
    • Haberfehlner, Georg;
    • Diekmann, Florian;
    • Nierhauve, Alena;
    • Buck, Jens;
    • Hanff, Arndt;
    • Kolhatkar, Gitanjali;
    • Kothleitner, Gerald;
    • Kienle, Lorenz;
    • Ziegler, Martin;
    • Carstensen, Jürgen;
    • Rossnagel, Kai;
    • Kohlstedt, Hermann
    Publication type:
    Article
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