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Title

Eliminating the Trade-Off between the Throughput and Pattern Quality of Sub-15 nm Directed Self-Assembly via Warm Solvent Annealing.

Authors

Kim, Jong Min; Kim, YongJoo; Park, Woon Ik; Hur, Yoon Hyung; Jeong, Jae Won; Sim, Dong Min; Baek, Kwang Min; Lee, Jung Hye; Kim, Mi‐Jeong; Jung, Yeon Sik

Abstract

The directed self-assembly (DSA) of block copolymers (BCPs) has been suggested as a promising nanofabrication solution. However, further improvements of both the pattern quality and manufacturability remain as critical challenges. Although the use of BCPs with a high Flory-Huggins interaction parameter ( χ) has been suggested as a potential solution, this practical self-assembly route has yet to be developed due to their extremely slow self-assembly kinetics. In this study, it is reported that warm solvent annealing (WSA) in a controlled environment can markedly improve both the self-assembly kinetics and pattern quality. A means of avoiding the undesirable trade-off between the quality and formation throughput of the self-assembled patterns, which is a dilemma which arises when using the conventional solvent vapor treatment, is suggested. As a demonstration, the formation of well-defined 13-nm-wide self-assembled patterns (3σ line edge roughness of ≈2.50 nm) in treatment times of 0.5 min (for 360-nm-wide templates) is shown. Self-consistent field theory (SCFT) simulation results are provided to elucidate the mechanism of the pattern quality improvement realized by WSA.

Subjects

BLOCK copolymers; NANOFABRICATION; FLORY-Huggins theory; SIMULATED annealing; SOLUTION (Chemistry)

Publication

Advanced Functional Materials, 2015, Vol 25, Issue 2, p306

ISSN

1616-301X

Publication type

Academic Journal

DOI

10.1002/adfm.201401529

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