Works matching IS 14381656 AND DT 2009 AND VI 11 AND IP 4

Results: 18

Reliability Aspects of Microsystems for Automotive Applications.

Published in:

Advanced Engineering Materials, 2009, v. 11, n. 4, p. 316, doi. 10.1002/adem.200800290

By:

Müller-Fiedler, Roland;
Nötzold, Kerstin;
Schneider, Arnold;
Rank, Holger;
Graf, Jürgen

Publication type:

Article

Dislocations as Active Components in Novel Silicon Devices.

Published in:

Advanced Engineering Materials, 2009, v. 11, n. 4, p. 249, doi. 10.1002/adem.200800283

By:

Kittler, Martin;
Reiche, Manfred

Publication type:

Article

Nonvolatile Memory Concepts Based on Resistive Switching in Inorganic Materials.

Published in:

Advanced Engineering Materials, 2009, v. 11, n. 4, p. 235, doi. 10.1002/adem.200800294

By:

Mikolajick, Thomas;
Salinga, Martin;
Kund, Michael;
Kever, Thorsten

Publication type:

Article

New Materials in Memory Development Sub 50 nm: Trends in Flash and DRAM.

Published in:

Advanced Engineering Materials, 2009, v. 11, n. 4, p. 241, doi. 10.1002/adem.200800298

By:

Kuesters, Karl Heinz;
Beug, Marc Florian;
Schroeder, Uwe;
Nagel, Nicolas;
Bewersdorff, Ulrike;
Dallmann, Gerald;
Jakschik, Stefan;
Knoefler, Roman;
Kudelka, Stephan;
Ludwig, Christoph;
Manger, Dirk;
Mueller, Wolfgang;
Tilke, Armin

Publication type:

Article

Advanced Experimental and Simulation Approaches to Meet Reliability Challenges of New Electronics Systems.

Published in:

Advanced Engineering Materials, 2009, v. 11, n. 4, p. 309, doi. 10.1002/adem.200800330

By:

Vogel, Dietmar;
Auersperg, Jürgen;
Michel, Bernd

Publication type:

Article

Atomic Layer Deposition of High- k Oxides of the Group 4 Metals for Memory Applications.

Published in:

Advanced Engineering Materials, 2009, v. 11, n. 4, p. 223, doi. 10.1002/adem.200800316

By:

Niinistö, Jaakko;
Kukli, Kaupo;
Heikkilä, Mikko;
Ritala, Mikko;
Leskelä, Markku

Publication type:

Article

C<sub>60</sub> Nanostructures for Applications in Information Technology.

Published in:

Advanced Engineering Materials, 2009, v. 11, n. 4, p. 278, doi. 10.1002/adem.200800293

By:

Senftleben, Oliver;
Stimpel-Lindner, Tanja;
Iskra, Peter;
Eisele, Jgnaz;
Baumgärtner, Hermann

Publication type:

Article

Interface Reactions in Ultrathin Functional Dielectric Films.

Published in:

Advanced Engineering Materials, 2009, v. 11, n. 4, p. 269, doi. 10.1002/adem.200800297

By:

Schmeißer, Dieter;
Henkel, Karsten;
Müller, Klaus;
Tallarida, Massimo

Publication type:

Article

Conductance Enhancement Mechanisms of Printable Nanoparticulate Indium Tin Oxide (ITO) Layers for Application in Organic Electronic Devices.

Published in:

Advanced Engineering Materials, 2009, v. 11, n. 4, p. 295, doi. 10.1002/adem.200800292

By:

Gross, Michael;
Linse, Nicolas;
Maksimenko, Ilja;
Wellmann, Peter J.

Publication type:

Article

In-Situ Studies of ALD Growth of Hafnium Oxide Films.

Published in:

Advanced Engineering Materials, 2009, v. 11, n. 4, p. 265, doi. 10.1002/adem.200800348

By:

Karavaev, Konstantin;
Kolanek, Krzysztof;
Tallarida, Massimo;
Schmeißer, Dieter;
Zschech, Ehrenfried

Publication type:

Article

Contents: (Adv. Eng. Mater. 4/2009).

Published in:: Advanced Engineering Materials, 2009, v. 11, n. 4, p. 217, doi. 10.1002/adem.200990009
Publication type:: Article

Perovskite BaHfO<sub>3</sub> Dielectric Layers for Dynamic Random Access Memory Storage Capacitor Applications.

Published in:

Advanced Engineering Materials, 2009, v. 11, n. 4, p. 259, doi. 10.1002/adem.200800296

By:

Lupina, Grzegorz;
Dabrowski, Jarek;
Dudek, Piotr;
Kozlowski, Grzegorz;
Lukosius, Mindaugas;
Wenger, Christian;
Müssig, Hans-Joachim

Publication type:

Article

Atomic Layer Deposition of High- k Oxides of the Group 4 Metals for Memory Applications (Adv. Eng. Mater. 4/2009).

Published in:

Advanced Engineering Materials, 2009, v. 11, n. 4, p. n/a, doi. 10.1002/adem.200990008

By:

Niinistö, Jaakko;
Kukli, Kaupo;
Heikkilä, Mikko;
Ritala, Mikko;
Leskelä, Markku

Publication type:

Article

Editorial.

Published in:: Advanced Engineering Materials, 2009, v. 11, n. 4, p. 215, doi. 10.1002/adem.200900004
Publication type:: Article

The Role of Strain in New Semiconductor Devices.

Published in:

Advanced Engineering Materials, 2009, v. 11, n. 4, p. 275, doi. 10.1002/adem.200800343

By:

Dommann, Alex;
Neels, Antonia

Publication type:

Article

Energy Level Alignment and Interactions at Potential Contacts for Spin Injection into Organic Semiconductors.

Published in:

Advanced Engineering Materials, 2009, v. 11, n. 4, p. 285, doi. 10.1002/adem.200800240

By:

Grobosch, Mandy;
Dörr, Katrin;
Gangineni, Ramesh B.;
Knupfer, Martin

Publication type:

Article

High-Reliability Connection Products for Packaging Technology in Microelectronics.

Published in:

Advanced Engineering Materials, 2009, v. 11, n. 4, p. 302, doi. 10.1002/adem.200800336

By:

Trodler, Joerg;
Mueller, Tobias

Publication type:

Article

Dewetting of an Organic Semiconductor Thin Film Observed in Real-time.

Published in:

Advanced Engineering Materials, 2009, v. 11, n. 4, p. 291, doi. 10.1002/adem.200800289

By:

Kowarik, Stefan;
Gerlach, Alexander;
Sellner, Stefan;
Cavalcanti, Leide;
Schreiber, Frank

Publication type:

Article