Works matching DE "ELECTRONIC appliance testing"

Results: 136

The development of the physical fundamentals of contact soldering as a factor for reducing the number of defects in electronic devices.

Published in:

Russian Journal of Nondestructive Testing, 2013, v. 49, n. 3, p. 178, doi. 10.1134/S1061830913030078

By:

Shtennikov, V.;
Budai, B.

Publication type:

Article

Impact of the titania nanostructure on charge transport and its application in hybrid solar cells.

Published in:

Applied Nanoscience, 2018, v. 8, n. 4, p. 665, doi. 10.1007/s13204-018-0639-6

By:

Koffman-Frischknecht, Alejandro;
Gonzalez, Fernando;
Plá, Juan;
Violi, Ianina;
Soler-Illia, Galo J. A. A.;
Perez, M. Dolores

Publication type:

Article

SIGNAL GENERATOR DESIGNED IN LabVIEW PROGRAM.

Published in:

Annals of the Faculty of Engineering Hunedoara - International Journal of Engineering, 2011, v. 9, n. 4, p. 149

By:

ROB, Raluca;
PANOIU, Caius;
PANOIU, Manuela;
IORDAN, Anca

Publication type:

Article

Single-line-to-ground fault location in the compensated distribution network.

Published in:

Australian Journal of Electrical & Electronic Engineering, 2013, v. 10, n. 4, p. 449, doi. 10.7158/1448837x.2013.11464394

By:

B. Xu;
X. Cai;
M. J. Zhu;
H. Qin;
D. M. Xi

Publication type:

Article

EE PRODUCTS PICKS.

Published in:: 2012
Publication type:: Product Review

From Testing ADCs to Detecting Donkeys.

Published in:

EE: Evaluation Engineering, 2012, v. 51, n. 7, p. 22

By:

Nelson, Rick;
Lecklider, Tom

Publication type:

Article

Getting Help in Achieving Compliance.

Published in:

EE: Evaluation Engineering, 2012, v. 51, n. 5, p. 26

By:

Nelson, Rick

Publication type:

Article

PXI Matures.

Published in:

EE: Evaluation Engineering, 2011, v. 50, n. 4, p. 12

By:

Lecklider, Tom

Publication type:

Article

Distance-to-Fault Is Spelled TDR or VNA.

Published in:

EE: Evaluation Engineering, 2011, v. 50, n. 4, p. 24

By:

Lecklider, Tom

Publication type:

Article

Phase Coherent Signal Testing.

Published in:

EE: Evaluation Engineering, 2009, v. 48, n. 3, p. 24

By:

Stallings, Justin

Publication type:

Article

Tackling Next-Generation RF SOC Test.

Published in:

EE: Evaluation Engineering, 2008, v. 47, n. 10, p. 12

By:

Burke, Ron

Publication type:

Article

Eight Hints for Better Scope Probing.

Published in:

EE: Evaluation Engineering, 2008, v. 47, n. 1, p. 12

By:

Jae-Yong Chang

Publication type:

Article

Analog Signal Generators Updated.

Published in:

EE: Evaluation Engineering, 2007, v. 46, n. 11, p. 44

By:

Lecklider, Tom

Publication type:

Article

Stimulating the Pulse of Today's Electronics.

Published in:

EE: Evaluation Engineering, 2007, v. 46, n. 5, p. 32

By:

Lecklider, Tom

Publication type:

Article

Implementing Change On the Test Floor.

Published in:

EE: Evaluation Engineering, 2007, v. 46, n. 5, p. 16

By:

VanNewkirk, John

Publication type:

Article

Bridging the Gap Between Instruments And Devices Under Test.

Published in:

EE: Evaluation Engineering, 2007, v. 46, n. 3, p. 58

By:

Beaver, Patrick

Publication type:

Article

Testing Written Very Small.

Published in:

EE: Evaluation Engineering, 2006, v. 45, n. 9, p. 52

By:

Lecklider, Tom

Publication type:

Article

Acoustic Solution for Bonded Wafer Voids.

Published in:

EE: Evaluation Engineering, 2006, v. 45, n. 9, p. 60

By:

Adams, Tom

Publication type:

Article

Understanding the Role Precision Plays in HALT.

Published in:

EE: Evaluation Engineering, 2006, v. 45, n. 9, p. 42

By:

Kalal, Ted;
Levin, Mark

Publication type:

Article

Managing Electronics Validation Testing.

Published in:

EE: Evaluation Engineering, 2006, v. 45, n. 9, p. 36

By:

Porter, Alexander J.

Publication type:

Article

Generators Offer Low Phase Noise and Fast Switching.

Published in:: EE: Evaluation Engineering, 2006, v. 45, n. 8, p. 10
Publication type:: Article

Technology Provides Immunity To Wafer Probing Systems.

Published in:: 2005
Publication type:: Product Review

Improving the Structural Stability Of Probe Cards.

Published in:

EE: Evaluation Engineering, 2004, v. 43, n. 10, p. 30

By:

Dabrowiecki, Krzysztof

Publication type:

Article

PCB Testing Goes Socketless.

Published in:

EE: Evaluation Engineering, 2004, v. 43, n. 7, p. 84

By:

Parker, Matt;
Smith, Jeff

Publication type:

Article

Ruling the Waves.

Published in:

EE: Evaluation Engineering, 2004, v. 43, n. 7, p. 32

By:

Mercadé, Joan

Publication type:

Article

Controlling Contact Resistance.

Published in:

EE: Evaluation Engineering, 2004, v. 43, n. 5, p. 56

By:

Broz, Jerry J.;
Stalnaker, Scott;
Humphrey, Gene

Publication type:

Article

NEW PRODUCTS.

Published in:: 2004
Publication type:: Product Review

Separating One Micron From Another.

Published in:

EE: Evaluation Engineering, 2003, v. 42, n. 9, p. 26

By:

Lecklider, Tom

Publication type:

Article

Function Generators Offer More Than Sine Waves.

Published in:

EE: Evaluation Engineering, 2003, v. 42, n. 8, p. 12

By:

Lecklider, Tom

Publication type:

Article

Compatibility of Automatic Threshold Tracking Pacemakers with Previously Implanted Pacing Leads in Children.

Published in:

Pacing & Clinical Electrophysiology, 2002, v. 25, n. 11, p. 1624, doi. 10.1046/j.1460-9592.2002.01624.x

By:

Kugukosmanoglu, Osman;
Celiker, Alp Ay;
Ozer, Sema;
Karagoz, Tevfik

Publication type:

Article

Should Unipolar Leads Be Implanted in the Atrium? A Holter Electrocardiographic Comparison of Threshold Adapted Unipolar and High Sensitive Bipolar Sensing.

Published in:

Pacing & Clinical Electrophysiology, 1998, v. 21, n. 8, p. 1601, doi. 10.1111/j.1540-8159.1998.tb00249.x

By:

Wiegand, Uwe K. H.;
Schier, Helmut;
Bode, Frank;
Brandes, Axel;
Potratz, Jürgen

Publication type:

Article

Italian Experience with AutoCapture in Conjunction with a Membrane Lead.

Published in:

Pacing & Clinical Electrophysiology, 1996, v. 19, n. 11, p. 1799

By:

Sermasi, Sergio;
Marconi, Marco;
Libero, Luigi;
Moracchini, Pier Vittorio;
Rusconi, Luigi;
Mininno, Antonio;
Sigliano, Riccardo

Publication type:

Article

Erosion of Internal Cardioverter Defibrillator Pocket and Migration of Pulse Generator into the Peritoneal Cavity.

Published in:

Pacing & Clinical Electrophysiology, 1996, v. 19, n. 10, p. 1528, doi. 10.1111/j.1540-8159.1996.tb03173.x

By:

Chitkara, Vinay K.;
Vlay, Stephen C.

Publication type:

Article

Test Technology Newsletter.

Published in:: Journal of Electronic Testing, 2017, v. 33, n. 1, p. 5, doi. 10.1007/s10836-017-5641-5
Publication type:: Article

Test Technology Newsletter.

Published in:: Journal of Electronic Testing, 2016, v. 32, n. 5, p. 507, doi. 10.1007/s10836-016-5612-2
Publication type:: Article

Test Technology Newsletter.

Published in:: Journal of Electronic Testing, 2013, v. 29, n. 2, p. 123, doi. 10.1007/s10836-013-5366-z
Publication type:: Article

On Chip Signal Generators for Low Overhead ADC BIST.

Published in:

Journal of Electronic Testing, 2012, v. 28, n. 5, p. 615, doi. 10.1007/s10836-012-5320-5

By:

Duan, Jingbo;
Vasan, Bharath;
Zhao, Chen;
Chen, Degang;
Geiger, Randall

Publication type:

Article

Fault Detection, Diagnosis and Prediction in Electrical Valves Using Self-Organizing Maps.

Published in:

Journal of Electronic Testing, 2011, v. 27, n. 4, p. 551, doi. 10.1007/s10836-011-5220-0

By:

Gonçalves, Luiz;
Bosa, Jefferson;
Balen, Tiago;
Lubaszewski, Marcelo;
Schneider, Eduardo;
Henriques, Renato

Publication type:

Article

A fast technique to evaluate uniformity conformity to standards' requirement for a reverberation chamber at the low end of test frequency.

Published in:

International Journal of RF & Microwave Computer-Aided Engineering, 2002, v. 12, n. 3, p. 296, doi. 10.1002/mmce.10028

By:

Daming Zhang;
Erping Li

Publication type:

Article

A Frequency Domain Approach for Predicting the Signal Strength of Tsunamis at Coastal Tide Gauges.

Published in:

Journal of Coastal Research, 2014, v. 30, n. 3, p. 562, doi. 10.2112/JCOASTRES-D-13-00076.1

By:

Breaker, L.C.;
Murty, T.S.;
Carroll, D.

Publication type:

Article

A Programmable Device for Experiments Employing a Superheated Probe in the Pulsed Operation Mode.

Published in:

Instruments & Experimental Techniques, 2004, v. 47, n. 4, p. 539, doi. 10.1023/B:INET.0000038405.46121.0b

By:

Vasil'ev, S.N.;
Volosnikov, D.V.;
Skripov, P.V.;
Starostin, A.A.;
Shishkin, A.V.

Publication type:

Article

A Multiposition Material Probe.

Published in:

Instruments & Experimental Techniques, 2004, v. 47, n. 2, p. 264, doi. 10.1023/B:INET.0000025215.56834.3f

By:

Begrambekov, L. B.;
Shigin, P. A.

Publication type:

Article

A Precision Device for the Positioning of the Probe in Scanning-Probe Microscopy.

Published in:

Instruments & Experimental Techniques, 2003, v. 46, n. 3, p. 402, doi. 10.1023/A:1024439127165

By:

Zhikharev, A. V.;
Bystrov, S. G.;
Karban, O. V.

Publication type:

Article

Negative four-terminal resistance as a probe of crossed Andreev reflection.

Published in:

Applied Physics A: Materials Science & Processing, 2007, v. 89, n. 3, p. 603, doi. 10.1007/s00339-007-4193-4

By:

Beckmann, D.;
Löhneysen, H. V.

Publication type:

Article

Electric Probe Measurements of the Poloidal Velocity in the Scrape-Off Layer of ASDEX Upgrade.

Published in:

Contributions to Plasma Physics, 2014, v. 54, n. 3, p. 273, doi. 10.1002/ctpp.201410078

By:

Mehlmann, F.;
Costea, S.;
Schrittwieser, R.;
Naulin, V.;
Rasmussen, J. J.;
Müller, H. W.;
Nielsen, A. H.;
Vianello, N.;
Carralero, D.;
Rohde, V.;
Lux, C.;
Ionita, C.;
ASDEX Up-grade Team

Publication type:

Article

Characterization of Hardware Impairments in Multiple Antenna Systems for DoA Estimation.

Published in:

Journal of Electrical & Computer Engineering, 2011, p. 1, doi. 10.1155/2011/908234

By:

Inserra, Daniele;
Tonello, Andrea M.

Publication type:

Article

Single CDTA-Based CurrentMode All-Pass Filter and Its Applications.

Published in:

Journal of Electrical & Computer Engineering, 2011, p. 1, doi. 10.1155/2011/897631

By:

Pandey, Neeta;
Paul, Sajal K.

Publication type:

Article

An Interpolated Flying-Adder-Based Frequency Synthesizer.

Published in:

Journal of Electrical & Computer Engineering, 2011, p. 1, doi. 10.1155/2011/871385

By:

Pao-Lung Chen;
Chun-Chien Tsai

Publication type:

Article

A New Approach for Multi-Emitter Test Signal Generation.

Published in:

EE: Evaluation Engineering, 2013, v. 52, n. 12, p. 20

By:

Jue, Greg

Publication type:

Article

Depth profiling of semiconductor structures by X-ray microanalysis using the electron probe energy variation technique.

Published in:

Semiconductors, 2009, v. 43, n. 4, p. 544, doi. 10.1134/S1063782609040265

By:

Bakaleinikov, L. A.;
Domrachova, Ya. V.;
Kolesnikova, E. V.;
Zamoryanskaya, M. V.;
Popova, T. B.;
Flegontova, E. Yu.

Publication type:

Article