Found: 168
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Developing ToF-SIMS methods for investigating the degradation of plastic debris on beaches.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 443, doi. 10.1002/sia.3397
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- Article
Elaboration and quantitative investigation of BCN-type films by dynamic SIMS using the MCs.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 669, doi. 10.1002/sia.3532
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The Pegase project, a new solid surface probe: focused massive cluster ion beams.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 66, doi. 10.1002/sia.3478
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Fundamental studies of molecular depth profiling using organic delta layers as model systems.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 81, doi. 10.1002/sia.3409
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Ionization effects in molecular depth profiling of trehalose films using buckminsterfullerene (C.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 99, doi. 10.1002/sia.3449
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A new approach to measuring D/H ratios with the Cameca IMS-7F.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 458, doi. 10.1002/sia.3467
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Effect of SiC bond formation in 20 keV C.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 123, doi. 10.1002/sia.3438
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Insight into the swelling mechanism involved in the recovery of serial numbers erased from polymer surfaces.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 625, doi. 10.1002/sia.3510
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NanoSIMS50 imaging of thin samples coupled with neutral cesium deposition.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 302, doi. 10.1002/sia.3550
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Imaging analysis of cosmetic ingredients interacted with human hair using TOF-SIMS.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 562, doi. 10.1002/sia.3635
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SIMS quantification of SiGe composition with low-energy ion beams.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 657, doi. 10.1002/sia.3620
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Real-time localization of single C.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 484, doi. 10.1002/sia.3400
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Alkaline earth metal salts of CaCO.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 462, doi. 10.1002/sia.3503
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Isotopic comparative method (ICM) for the determination of variations of the ion yields in boron-doped silicon as a function of oxygen concentration in the 0-10 at.% range.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 137, doi. 10.1002/sia.3657
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Erratum: Bi.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 676, doi. 10.1002/sia.3697
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A beneficial application of backside SIMS for the depth profiling characterization of implanted silicon.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 654, doi. 10.1002/sia.3646
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ToF-SIMS and PCA of surface-immobilized antibodies with different orientations.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 285, doi. 10.1002/sia.3440
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Identification and Imaging of.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 336, doi. 10.1002/sia.3679
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Evaluation of immobilized polypeptides with different C-terminal residues using argon gas-cluster SIMS.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 344, doi. 10.1002/sia.3554
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D & TOF-SIMS failure analysis of P-buried layer from BiCMOS transistors.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 609, doi. 10.1002/sia.3668
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Cluster primary ion sputtering: correlations in secondary ion intensities in TOF SIMS.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 228, doi. 10.1002/sia.3491
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ToF-SIMS analysis of myocardial infarcted tissue.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 350, doi. 10.1002/sia.3628
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Dual beam depth profiling of organic materials: Variations of analysis and sputter beam conditions.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 198, doi. 10.1002/sia.3422
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Tracing propionic acid infused to rat brain via deuterium tagging-further development of a novel rodent model of autism spectrum disorders.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 358, doi. 10.1002/sia.3536
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TOF-SIMS analysis of media lubricant under laser irradiation for HAMR application.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 406, doi. 10.1002/sia.3507
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Determining major and trace element compositions of exposed melt inclusions in minerals using ToF-SIMS.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 436, doi. 10.1002/sia.3594
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Molecular dynamics study of metal-organic samples bombarded by kiloelectronvolt projectiles.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 70, doi. 10.1002/sia.3411
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SIMS analytical technique for PV applications.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 643, doi. 10.1002/sia.3525
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Analysis of organic multilayered samples for optoelectronic devices by (low-energy) dynamic SIMS.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 194, doi. 10.1002/sia.3451
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Application of TOF-SIMS to the direct determination of syringyl to guaiacyl (S/G) ratio of lignin.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 281, doi. 10.1002/sia.3565
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The influence of beam energy on apparent layer thickness using ultralow energy O.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 211, doi. 10.1002/sia.3433
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Analysis of organic semiconductor multilayers with Ar cluster secondary ion mass spectrometry.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 95, doi. 10.1002/sia.3587
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Development of chain-folding of semicrystalline polymers in thin films: a combined ToF-SIMS and PCA analysis.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 340, doi. 10.1002/sia.3404
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Secondary ion yield enhancement in organic samples due to Au/Pt nanoparticle condensation and their substrate effects.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 74, doi. 10.1002/sia.3477
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Surface morphology of PMMA surfaces bombarded with size-selected gas cluster ion beams.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 120, doi. 10.1002/sia.3444
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Useful yields of organic molecules under dynamic SIMS cluster bombardment.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 376, doi. 10.1002/sia.3484
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ToF-SIMS imaging and depth profiling of HeLa cells treated with bromodeoxyuridine.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 354, doi. 10.1002/sia.3415
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New neutral cesium evaporation chamber and UHV suitcase.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 514, doi. 10.1002/sia.3518
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The cuticular surface of D. melanogaster: ToF-SIMS on the fly.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 317, doi. 10.1002/sia.3455
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ToF-SIMS depth profiling of vitamin C layers using Cs.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 190, doi. 10.1002/sia.3426
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Distribution of inkjet ink components via ToF-SIMS imaging.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 576, doi. 10.1002/sia.3352
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Characterizing in situ Glycerophospholipids with SIMS and MALDI Methodologies.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 269, doi. 10.1002/sia.3529
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MeV-energy probe SIMS imaging of major components in washed and fractured animal cells.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 363, doi. 10.1002/sia.3408
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Speciation and quantification of surface gold in carbonaceous matter by TOF-SIMS: a new approach in characterizing losses during the gold recovery process.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 446, doi. 10.1002/sia.3448
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Molecular SIMS imaging; spatial resolution and molecular sensitivity: have we reached the end of the road? Is there light at the end of the tunnel?
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 253, doi. 10.1002/sia.3488
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Study of charge effect during Cs.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 201, doi. 10.1002/sia.3419
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Advanced SIMS quantification in the first few nm of B, P and As ultrashallow implants.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 522, doi. 10.1002/sia.3459
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Failure analysis of fine Cu patterning by shave-off profiling.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 621, doi. 10.1002/sia.3396
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Molecular ion yield enhancement in static secondary ion mass spectrometry by soft landing of protonated water clusters.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 498, doi. 10.1002/sia.3161
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VAMAS interlaboratory study on organic depth profiling. Part I: Preliminary report.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 510, doi. 10.1002/sia.3268
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