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Published in:
Surface & Interface Analysis: SIA, 1990, v. 15, n. 8, p. 502, doi. 10.1002/sia.740150810
Publication type:
Article
Surface investigation of copper in the printed circuit board.
Published in:
Surface & Interface Analysis: SIA, 1990, v. 15, n. 8, p. 457, doi. 10.1002/sia.740150803
By:
- Manara, A.;
- Sirtori, V.
Publication type:
Article
Surface characterization of butyl methacrylate polymers by XPS and static SIMS.
Published in:
Surface & Interface Analysis: SIA, 1990, v. 15, n. 8, p. 479, doi. 10.1002/sia.740150807
By:
- Castner, David G.;
- Ratner, Buddy D.
Publication type:
Article
Forthcoming events.
Published in:
Surface & Interface Analysis: SIA, 1990, v. 15, n. 8, p. ii, doi. 10.1002/sia.740150802
Publication type:
Article
Silver halide infrared fibre-optic evanescent wave spectroscopy for in situ monitoring of the chemical processes in adhesive curing.
Published in:
Surface & Interface Analysis: SIA, 1990, v. 15, n. 8, p. 473, doi. 10.1002/sia.740150806
By:
- Margalit, E.;
- Katzir, A.;
- Dodiuk, H.;
- Kosower, E. M.
Publication type:
Article
Masthead.
Published in:
Surface & Interface Analysis: SIA, 1990, v. 15, n. 8, p. fmi, doi. 10.1002/sia.740150801
Publication type:
Article
Evaluation of correction accuracy of several schemes for AES matrix effect corrections.
Published in:
Surface & Interface Analysis: SIA, 1990, v. 15, n. 8, p. 466, doi. 10.1002/sia.740150805
By:
- Tanuma, S.;
- Sekine, T.;
- Yoshihara, K.;
- Shimizu, R.;
- Homma, T.;
- Tokutaka, H.;
- Goto, K.;
- Uemura, M.;
- Fujita, D.;
- Kurokawa, A.;
- Ichimura, S.;
- Oshima, C.;
- Kurahashi, M.;
- Kudo, M.;
- Hashiguchi, Y.;
- Suzuki, T.;
- Ohmura, T.;
- Soeda, F.;
- Tanaka, K.;
- Tanaka, A.
Publication type:
Article
XPS analysis of silane coupling agents and silane-treated E-glass fibers.
Published in:
Surface & Interface Analysis: SIA, 1990, v. 15, n. 8, p. 498, doi. 10.1002/sia.740150809
By:
- Pantano, Carlo G.;
- Wittberg, T. N.
Publication type:
Article
Sputter depth profile analysis of marker layers.
Published in:
Surface & Interface Analysis: SIA, 1990, v. 15, n. 8, p. 463, doi. 10.1002/sia.740150804
By:
- Peinador, J. A.;
- Abril, I.;
- Jiménez-Rodríguez, J. J.;
- Gras-Marti, A.
Publication type:
Article
Sputter reduction of oxides by ion bombardment during Auger depth profile analysis.
Published in:
Surface & Interface Analysis: SIA, 1990, v. 15, n. 8, p. 487, doi. 10.1002/sia.740150808
By:
- Mitchell, D. F.;
- Sproule, G. I.;
- Graham, M. J.
Publication type:
Article

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