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Influence of LaNiO and LaNiMnO Buffer Layers on the Structural and Electrical Properties of BiNiMnO Thin Films.
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- Journal of Electronic Materials, 2015, v. 44, n. 10, p. 3783, doi. 10.1007/s11664-015-3837-y
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Effect of annealing temperature on dielectric and pyroelectric property of highly (111)-oriented (PbLa)(ZrTi)O thin films.
- Published in:
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 3, p. 1784, doi. 10.1007/s10854-014-2610-y
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- Article