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ToF-S-SIMS molecular 3D analysis of micro-objects as an alternative to ion beam erosion at large depth: application to single inkjet dots.
- Published in:
- Analytical & Bioanalytical Chemistry, 2013, v. 405, n. 6, p. 2053, doi. 10.1007/s00216-012-6647-6
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- Article
Ultra-low-angle microtomy and static secondary ion mass spectrometry for molecular depth profiling of UV-curable acrylate multilayers at the nanoscale.
- Published in:
- Analytical & Bioanalytical Chemistry, 2010, v. 396, n. 8, p. 2943, doi. 10.1007/s00216-010-3507-0
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- Article
TOF-S-SIMS molecular depth profiling of organic bilayers using mechanical wear test methodology.
- Published in:
- Analytical & Bioanalytical Chemistry, 2009, v. 393, n. 8, p. 1917, doi. 10.1007/s00216-009-2657-4
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- Article
Ion yield improvement for static secondary ion mass spectrometry by use of polyatomic primary ions.
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- Rapid Communications in Mass Spectrometry: RCM, 2008, v. 22, n. 10, p. 1481, doi. 10.1002/rcm.3533
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- Article