Found: 12
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Growth and characterization of III-N bulk crystals.
- Published in:
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 8/9, p. 845, doi. 10.1007/s10854-007-9500-5
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- Article
Assessing Hexagonal Boron Nitride Crystal Quality by Defect Sensitive Etching.
- Published in:
- Microscopy & Microanalysis, 2017, v. 23, p. 1518, doi. 10.1017/S143192761700825X
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- Publication type:
- Article
Energy-Filtered Transmission Electron Microscope Tomography of Silicon Nanoparticles in Silicon Dioxide Deposited with High Density Plasma Chemical Vapor Deposition.
- Published in:
- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 810, doi. 10.1017/S1431927614005777
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- Article
Towards Non-Destructive Burgers Vector Identification of Dislocations in Electronic Materials via Electron Channeling Contrast Imaging.
- Published in:
- 2010
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- Publication type:
- Abstract
Diffraction Contrast of Threading Dislocations in GaN and 4H-SiC Epitaxial Layers Using Electron Channeling Contrast Imaging.
- Published in:
- Journal of Electronic Materials, 2010, v. 39, n. 6, p. 743, doi. 10.1007/s11664-010-1143-2
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- Article
Imaging Surface Pits and Dislocations in 4H-SiC by Forescattered Electron Detection and Photoluminescence.
- Published in:
- Journal of Electronic Materials, 2008, v. 37, n. 5, p. 655, doi. 10.1007/s11664-007-0327-x
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- Publication type:
- Article
Investigation of Three-Step Epilayer Growth Approach of GaN Films to Minimize Compensation.
- Published in:
- Journal of Electronic Materials, 2005, v. 34, n. 9, p. 1187, doi. 10.1007/s11664-005-0263-6
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- Article
Planar Defects in 4H-SiC PiN Diodes.
- Published in:
- Journal of Electronic Materials, 2005, v. 34, n. 4, p. 351, doi. 10.1007/s11664-005-0109-2
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- Publication type:
- Article
Partial Dislocations and Stacking Faults in 4H-SiC PiN Diodes.
- Published in:
- Journal of Electronic Materials, 2004, v. 33, n. 5, p. 472, doi. 10.1007/s11664-004-0205-8
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- Publication type:
- Article
Diffraction pattern indexing in lithium niobate.
- Published in:
- Journal of Microscopy, 1986, v. 142, n. 3, p. 277, doi. 10.1111/j.1365-2818.1986.tb04283.x
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- Publication type:
- Article
THE EFFECT OF BREMSSTRAHLUNG-PRODUCED FLUORESCENCE ON X-RAY MICROANALYSIS IN THE ANALYTICAL TRANSMISSION ELECTRON MICROSCOPE.
- Published in:
- Journal of Microscopy, 1984, v. 134, n. 2, p. RP1, doi. 10.1111/j.1365-2818.1984.tb02500.x
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- Publication type:
- Article
A comparison of two models for the characteristic X-ray fluorescence correction in thin foil analysis.
- Published in:
- Journal of Microscopy, 1984, v. 133, n. 1, p. 61, doi. 10.1111/j.1365-2818.1984.tb00463.x
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- Publication type:
- Article