Found: 15
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Continuous Multiple Pass Electron Counted Spectrum Imaging Optimized for In-Situ Analysis.
- Published in:
- 2023
- By:
- Publication type:
- Abstract
Electron Counted STEM-EELS Spectroscopy Optimized for low kV (< 80 kV) via Hybrid Pixel Detection.
- Published in:
- 2022
- By:
- Publication type:
- Abstract
Advantages of Direct Detection and Electron Counting for High-Energy Resolution and Monochromated Electron Energy Loss Spectroscopy Data Acquisition.
- Published in:
- Microscopy & Microanalysis, 2019, p. 474, doi. 10.1017/S1431927618002866
- By:
- Publication type:
- Article
Using EELS to Determine He Pressure Inside Nanometer-Scale Bubbles.
- Published in:
- Microscopy & Microanalysis, 2019, p. 438, doi. 10.1017/S1431927618002684
- By:
- Publication type:
- Article
Advantages of Direct Detection and Electron Counting for High-Energy Resolution and Monochromated Electron Energy Loss Spectroscopy Data Acquisition.
- Published in:
- 2018
- By:
- Publication type:
- Abstract
Using EELS to Determine He Pressure Inside Nanometer-Scale Bubbles.
- Published in:
- 2018
- By:
- Publication type:
- Abstract
Advantages of Direct Detection and Electron Counting for Electron Energy Loss Spectroscopy Data Acquisition and the Quest of Extremely High-Energy Edges Using Eels.
- Published in:
- Microscopy & Microanalysis, 2017, v. 23, p. 60, doi. 10.1017/S1431927617000988
- By:
- Publication type:
- Article
Observation of layer by layer graphitization of 4H-SiC, through atomic-EELS at low energy.
- Published in:
- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 560, doi. 10.1017/S1431927614004528
- By:
- Publication type:
- Article
Probing the Chemical Structure in Diamond-Based Materials Using Combined Low-Loss and Core-Loss Electron Energy-Loss spectroscopy.
- Published in:
- Microscopy & Microanalysis, 2014, v. 20, n. 3, p. 779, doi. 10.1017/S1431927614000579
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- Publication type:
- Article
Outlook of Application of Aberration Corrected-Electron Microscopy in the Ligandprotected Metal Clusters.
- Published in:
- Microscopy & Microanalysis, 2004, v. 10, n. S03, p. 62, doi. 10.1017/S1431927604555812
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- Publication type:
- Article
Review of recent advances in spectrum imaging and its extension to reciprocal space.
- Published in:
- Journal of Electron Microscopy, 2009, v. 58, n. 3, p. 99, doi. 10.1093/jmicro/dfp022
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- Publication type:
- Article
Atomic Elemental and Chemical Analysis of SrTiO3/LaMnO3 Multilayers Using Fast Simultaneous EELS and EDS Analysis in DigitalMicrograph.
- Published in:
- Microscopy Today, 2015, v. 23, n. 4, p. 44, doi. 10.1017/S1551929515000589
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- Publication type:
- Article
Simultaneous EELS/EDS Composition Mapping at Atomic Resolution Using Fast STEM Spectrum-Imaging.
- Published in:
- Microscopy Today, 2013, v. 21, n. 4, p. 36, doi. 10.1017/S1551929513000643
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- Publication type:
- Article
Fast STEM Spectrum Imaging Using Simultaneous EELS and EDS.
- Published in:
- Microscopy Today, 2013, v. 21, n. 1, p. 28, doi. 10.1017/S1551929512000909
- By:
- Publication type:
- Article
Atomic-Level EELS Mapping Using High-Energy Edges in Dualeels™ Mode.
- Published in:
- Microscopy Today, 2012, v. 20, n. 4, p. 30, doi. 10.1017/S1551929512000478
- By:
- Publication type:
- Article