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Composition and growth of anodic and thermal oxides on InP and GaAs.
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- Surface & Interface Analysis: SIA, 2002, v. 34, n. 1, p. 481, doi. 10.1002/sia.1343
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- Article
Behaviour of copper and generation of oxygen during anodizing of Nb-Cu alloys.
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- Surface & Interface Analysis: SIA, 2000, v. 29, n. 12, p. 895, doi. 10.1002/1096-9918(200012)29:12<895::AID-SIA944>3.0.CO;2-W
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- Article
Sputter reduction of oxides by ion bombardment during Auger depth profile analysis.
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- Surface & Interface Analysis: SIA, 1990, v. 15, n. 8, p. 487, doi. 10.1002/sia.740150808
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- Article
Optimized ion beam raster for SIMS sputter depth profiling.
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- Surface & Interface Analysis: SIA, 1989, v. 14, n. 6/7, p. 302, doi. 10.1002/sia.740140606
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- Article
Water Corrodes Copper.
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- Catalysis Letters, 2009, v. 132, n. 3/4, p. 311, doi. 10.1007/s10562-009-0113-x
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- Article
A combined approach: Isotopic exposure/SIMS analysis/SEM to Study the Early Stages of oxidation of β-NiAl at 1473 K.
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- Materials & Corrosion / Werkstoffe und Korrosion, 1995, v. 46, n. 5, p. 297, doi. 10.1002/maco.19950460505
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- Article