Found: 2

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  • Crystallographic analysis of thin specimens.

    Published in:
    Journal of Microscopy, 2005, v. 218, n. 2, p. 115, doi. 10.1111/j.1365-2818.2005.01475.x
    By:
    • Sivel, V. G. M.;
    • Tichelaar, F. D.;
    • Mohdadi, H.;
    • Alkemade, P. F. A.;
    • Zandbergen, H. W.
    Publication type:
    Article

  • Application of the dual-beam FIB/SEM to metals research.

    Published in:
    Journal of Microscopy, 2004, v. 214, n. 3, p. 237, doi. 10.1111/j.0022-2720.2004.01329.x
    By:
    • Sivel, V. G. M.;
    • Van Den Brand, J.;
    • Wang, W. R.;
    • Mohdadi, H.;
    • Tichelaar, F. D.;
    • Alkemade, P. F. A.;
    • Zanbergen, H. W.
    Publication type:
    Article