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Temperature‐Dependent Phase Transitions in Hf<sub>x</sub>Zr<sub>1‐x</sub>O<sub>2</sub> Mixed Oxides: Indications of a Proper Ferroelectric Material.
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- Advanced Electronic Materials, 2022, v. 8, n. 9, p. 1, doi. 10.1002/aelm.202200265
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- Article
Harnessing Phase Transitions in Antiferroelectric ZrO<sub>2</sub> Using the Size Effect.
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- Advanced Electronic Materials, 2022, v. 8, n. 1, p. 1, doi. 10.1002/aelm.202100556
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- Article
The Electrode‐Ferroelectric Interface as the Primary Constraint on Endurance and Retention in HZO‐Based Ferroelectric Capacitors.
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- Advanced Functional Materials, 2023, v. 33, n. 43, p. 1, doi. 10.1002/adfm.202303261
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- Article
Raman Spectroscopy as a Key Method to Distinguish the Ferroelectric Orthorhombic Phase in Thin ZrO<sub>2</sub>‐Based Films.
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- Physica Status Solidi - Rapid Research Letters, 2022, v. 16, n. 4, p. 1, doi. 10.1002/pssr.202100589
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- Article
Bulk Depolarization Fields as a Major Contributor to the Ferroelectric Reliability Performance in Lanthanum Doped Hf<sub>0.5</sub>Zr<sub>0.5</sub>O<sub>2</sub> Capacitors.
- Published in:
- Advanced Materials Interfaces, 2019, v. 6, n. 21, p. N.PAG, doi. 10.1002/admi.201901180
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- Article
Origin of Ferroelectric Phase in Undoped HfO<sub>2</sub> Films Deposited by Sputtering.
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- Advanced Materials Interfaces, 2019, v. 6, n. 20, p. N.PAG, doi. 10.1002/admi.201901528
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- Article
Origin of Ferroelectric Phase in Undoped HfO<sub>2</sub> Films Deposited by Sputtering.
- Published in:
- Advanced Materials Interfaces, 2019, v. 6, n. 11, p. N.PAG, doi. 10.1002/admi.201900042
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- Article