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Substrates for Soft X-Ray Microscopy Based on Si<sub>3</sub>N<sub>4</sub> Membranes.
Published in:
Technical Physics, 2024, v. 69, n. 7, p. 2098, doi. 10.1134/S1063784224070375
By:
- Reunov, D. G.;
- Gusev, N. S.;
- Mikhailenko, M. S.;
- Petrova, D. V.;
- Malyshev, I. V.;
- Chkhalo, N. I.
Publication type:
Article
Project of X-Ray Optical Scheme of a Lithograph with a Transmissive Dynamic Mask and a Synchrotron Radiation Source.
Published in:
Technical Physics, 2024, v. 69, n. 7, p. 2037, doi. 10.1134/S1063784224070272
By:
- Malyshev, I. V.;
- Chkhalo, N. I.;
- Yakunin, S. N.
Publication type:
Article
The Theory of Axial Tomography Based on the Inverse Radon Transform for High-Aperture Soft X-ray Microscopy.
Published in:
Technical Physics, 2024, v. 69, n. 6, p. 1555, doi. 10.1134/S1063784224060124
By:
- Gaikovich, K. P.;
- Malyshev, I. V.;
- Reunov, D. G.;
- Chkhalo, N. I.
Publication type:
Article
Search for High-Strength Multilayer Free-Standing Film Filters with High Transmittance in the Wavelength Range of the "Water Window" (2.3–4.4 nm).
Published in:
Technical Physics, 2024, v. 69, n. 4, p. 785, doi. 10.1134/S1063784224030010
By:
- Barysheva, M. M.;
- Garakhin, S. A.;
- Lopatin, A. Ya.;
- Luchin, V. I.;
- Malyshev, I. V.;
- Salashchenko, N. N.;
- Tsybin, N. N.;
- Chkhalo, N. I.
Publication type:
Article
Wavefront Lens Corrector for Studying Flat Surfaces.
Published in:
Technical Physics, 2024, v. 69, n. 3, p. 730, doi. 10.1134/S1063784224020336
By:
- Toropov, M. N.;
- Akhsakhalyan, A. A.;
- Malyshev, I. V.;
- Mikhaylenko, M. S.;
- Pestov, A. E.;
- Salaschenko, N. N.;
- Chernyshov, A. K.;
- Chkhalo, N. I.
Publication type:
Article
Solar VUV Telescope for Nanosatellites.
Published in:
Technical Physics, 2024, v. 69, n. 3, p. 595, doi. 10.1134/S1063784224020191
By:
- Kuzin, S. V.;
- Bogachev, S. A.;
- Erkhova, N. F.;
- Pertsov, A. A.;
- Loboda, I. P.;
- Reva, A. A.;
- Kholodilov, A. A.;
- Ulyanov, A. S.;
- Kirichenko, A. S.;
- Malyshev, I. V.;
- Pestov, A. E.;
- Polkovnikov, V. N.;
- Toropov, M. N.;
- Tsybin, N. N.;
- Chkhalo, N.I.;
- Kryukovskiy, V. A.;
- Gorev, V. N.;
- Doroshkin, A. A.;
- Zadorozhniy, A. M.;
- Prokop'ev, V. Yu.
Publication type:
Article
Imaging System of a Plasma Torch of a Betatron X-Ray Source.
Published in:
Technical Physics, 2024, v. 69, n. 3, p. 480, doi. 10.1134/S1063784224020051
By:
- Antyushin, E. S.;
- Akhsakhalyan, A. A.;
- Zuev, S. Yu.;
- Lopatin, A. Ya.;
- Malyshev, I. V.;
- Nechay, A. N.;
- Perekalov, A. A.;
- Pestov, A. E.;
- Salashchenko, N. N.;
- Toropov, M. N.;
- Ulasevich, B. A.;
- Tsybin, N. N.;
- Chkhalo, N. I.;
- Soloviev, A. A.;
- Starodubtsev, M. V.
Publication type:
Article
Ion-Beam Methods for High-Precision Processing of Optical Surfaces.
Published in:
Technical Physics, 2020, v. 65, n. 11, p. 1837, doi. 10.1134/S1063784220110274
By:
- Zabrodin, I. G.;
- Zorina, M. V.;
- Kas'kov, I. A.;
- Malyshev, I. V.;
- Mikhailenko, M. S.;
- Pestov, A. E.;
- Salashchenko, N. N.;
- Chernyshev, A. K.;
- Chkhalo, N. I.
Publication type:
Article
Multilayer Cr/Sc Mirrors with Improved Reflection for the "Water Transparency Window" Range.
Published in:
Technical Physics, 2020, v. 65, n. 11, p. 1809, doi. 10.1134/S1063784220110225
By:
- Polkovnikov, V. N.;
- Garakhin, S. A.;
- Kvashennikov, D. S.;
- Malyshev, I. V.;
- Salashchenko, N. N.;
- Svechnikov, M. V.;
- Smertin, R. M.;
- Chkhalo, N. I.
Publication type:
Article
Measurement Error of Interferometers with Diffraction Reference Wave.
Published in:
Technical Physics, 2019, v. 64, n. 11, p. 1698, doi. 10.1134/S1063784219110021
By:
- Akhsakhalyan, A. A.;
- Gavrilin, D. A.;
- Malyshev, I. V.;
- Salashchenko, N. N.;
- Toropov, M. N.;
- Ulasevich, B. A.;
- Tsybin, N. N.;
- Chkhalo, N. I.
Publication type:
Article
Beryllium as a Material for Thermally Stable X-Ray Mirrors.
Published in:
Technical Physics, 2019, v. 64, n. 11, p. 1596, doi. 10.1134/S1063784219110070
By:
- Chkhalo, N. I.;
- Zorina, M. V.;
- Malyshev, I. V.;
- Pestov, A. E.;
- Polkovnikov, V. N.;
- Salashchenko, N. N.;
- Kazakov, D. S.;
- Mil'kov, A. V.;
- Strulya, I. L.
Publication type:
Article
Simulation of Local Error Correction of the Surface Shape by a Low-Dimensional Ion Beam.
Published in:
Technical Physics, 2019, v. 64, n. 11, p. 1560, doi. 10.1134/S1063784219110069
By:
- Chernyshev, A. K.;
- Malyshev, I. V.;
- Pestov, A. E.;
- Chkhalo, N. I.
Publication type:
Article
The Application of Oil and Gas Drilling Waste in Fine-Grained Concrete.
Published in:
Russian Journal of General Chemistry, 2023, v. 93, n. 13, p. 3411, doi. 10.1134/S1070363223130212
By:
- Yarusova, S. B.;
- Skovpen, A. V.;
- Ivanenko, N. V.;
- Dostovalov, D. V.;
- Malyshev, I. V.;
- Gordienko, P. S.;
- Kozin, A. V.;
- Buravlev, I. Yu.;
- Shlyk, D. Kh.
Publication type:
Article
Determination of the Bulk Conductivity of III–V Semiconductors in a Strong Constant Electric Field and under Harmonic Effects.
Published in:
Semiconductors, 2019, v. 53, n. 15, p. 1979, doi. 10.1134/S1063782619150107
By:
- Malyshev, I. V.;
- Fil, K. A.;
- Goncharova, O. A.
Publication type:
Article
Optimization of the Design and Parameters of a Double-Mirror Monochromator for the Fourth-Generation SKIF Synchrotron Light Source.
Published in:
Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2023, v. 17, p. S233, doi. 10.1134/S1027451023070133
By:
- Glushkov, E. I.;
- Malyshev, I. V.;
- Petrakov, E. V.;
- Chkhalo, N. I.;
- Khomyakov, Yu. V.;
- Rakshun, Ya. V.;
- Chernov, V. A.;
- Dolbnya, I. P.
Publication type:
Article
Determining the Size of the EUV Laser-Plasma Source for a Microscope.
Published in:
Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2023, v. 17, n. 4, p. 859, doi. 10.1134/S1027451023040146
By:
- Reunov, D. G.;
- Malyshev, I. V.;
- Perekalov, A. A.;
- Nechay, A. N.;
- Chkhalo, N. I.
Publication type:
Article
On the Project of Scanning and Projection Microscopes for the Nanoscope Station for Biological Research in the Water Window.
Published in:
Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2023, v. 17, n. 3, p. 531, doi. 10.1134/S1027451023030114
By:
- Malyshev, I. V.;
- Pestov, A. E.;
- Polkovnikov, V. N.;
- Reunov, D. G.;
- Toropov, M. N.;
- Chkhalo, N. I.;
- Rakshun, Ya. V.;
- Khomyakov, Yu. V.;
- Chernov, V. A.;
- Shchelokov, I. A.
Publication type:
Article
Comparison of Methods for Removing Noise in an Image Obtained in a Specular Microscope at a Wavelength of 13.84 nm.
Published in:
Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2022, v. 16, n. 6, p. 1159, doi. 10.1134/S1027451022060489
By:
- Reunov, D. G.;
- Malyshev, I. V.;
- Chkhalo, N. I.
Publication type:
Article
Projection Objective For an EUV-Lithographic Workbench.
Published in:
Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2020, v. 14, n. 3, p. 562, doi. 10.1134/S1027451020030246
By:
- Egorov, A. A.;
- Zorina, M. V.;
- Malyshev, I. V.;
- Pestov, A. E.;
- Polkovnikov, V. N.;
- Salashchenko, N. N.;
- Toropov, M. N.;
- Tsybin, N. N.;
- Chkhalo, N. I.
Publication type:
Article
Current State of Development of a Microscope Operating at a Wavelength of 3.37 nm at the Institute of Physics of Microstructures of the Russian Academy of Sciences.
Published in:
Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2018, v. 12, n. 6, p. 1253, doi. 10.1134/S1027451019010129
By:
- Malyshev, I. V.;
- Pestov, A. E.;
- Polkovnikov, V. N.;
- Salashchenko, N. N.;
- Toropov, M. N.;
- Chkhalo, N. I.
Publication type:
Article

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