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Vanadium Oxide Films with Improved Characteristics for IR Microbolometric Matrices.
- Published in:
- Technical Physics Letters, 2001, v. 27, n. 5, p. 378, doi. 10.1134/1.1376757
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- Article
Amorphous silicon and germanium films for uncooled microbolometers.
- Published in:
- Technical Physics Letters, 1997, v. 23, n. 7, p. 504, doi. 10.1134/1.1261727
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- Publication type:
- Article
Structural and noise characterization of VO[sub 2] films on SiO[sub 2]/Si substrates.
- Published in:
- Technical Physics Letters, 1997, v. 23, n. 7, p. 520, doi. 10.1134/1.1261815
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- Article
Bolometric properties of silicon thin-film structures fabricated by plasmachemical vapor-phase deposition.
- Published in:
- Technical Physics Letters, 1997, v. 23, n. 6, p. 481, doi. 10.1134/1.1261722
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- Article