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Characterization of group II hafnates and zirconates for metal-insulator-metal capacitors.
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- Physica Status Solidi (B), 2011, v. 248, n. 2, p. 323, doi. 10.1002/pssb.201046456
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- Article
Perovskite BaHfO<sub>3</sub> Dielectric Layers for Dynamic Random Access Memory Storage Capacitor Applications.
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- Advanced Engineering Materials, 2009, v. 11, n. 4, p. 259, doi. 10.1002/adem.200800296
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- Article