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Experimental resolution measurement in critical dimension scanning electron microscope metrology.
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- Scanning, 2003, v. 25, n. 4, p. 175, doi. 10.1002/sca.4950250403
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Optical properties of fullerite thin films in the 0.4 to 32 eV energy range.
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- Physica Status Solidi (B), 1994, v. 183, n. 1, p. 267, doi. 10.1002/pssb.2221830122
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- Article